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1. 发明授权

US06486021B2 Method for manufacturing a semiconductor device having incorporated therein a high K capacitor dielectric 有权
标题翻译：制造具有高K电容电介质的半导体器件的方法
公开(公告)号：US06486021B2
公开(公告)日：2002-11-26
申请号：US09727584
申请日：2000-12-04
申请人： Min-Soo Kim , Chan Lim
发明人： Min-Soo Kim , Chan Lim
IPC分类号： H01L218242
CPC分类号： H01L28/40 , H01L21/02183 , H01L21/02194 , H01L21/0228 , H01L21/31604 , H01L27/10814 , H01L28/90
摘要： A semiconductor device for use in a memory cell includes an active matrix an active matrix provided with a semiconductor substrate, a plurality of transistors formed on the semiconductor substrate and conductive plugs electrically connected to the transistors, a number of lower electrodes formed on top of the conductive plugs, Ta2O5 films formed on the lower electrodes, composite films formed on the Ta2O5 films and upper electrodes formed on the composite films.
摘要翻译：用于存储单元的半导体器件包括有源矩阵，设置有半导体衬底的有源矩阵，形成在半导体衬底上的多个晶体管和与晶体管电连接的导电插头，多个下电极形成在导电插头，形成在下电极上的Ta2O5膜，形成在Ta2O5膜上的复合膜和形成在复合膜上的上电极。

2. 发明授权

US06387749B1 Method of manufacturing a capacitor in a semiconductor device 失效
标题翻译：在半导体器件中制造电容器的方法
公开(公告)号：US06387749B1
公开(公告)日：2002-05-14
申请号：US09625364
申请日：2000-07-25
申请人： Chan Lim
发明人： Chan Lim
IPC分类号： H01L218242
CPC分类号： H01L28/40 , C23C16/0272 , C23C16/308 , H01L21/3145 , H01L21/31604 , H01L28/56
摘要： The present invention relates generally to a method of manufacturing a semiconductor device. There is disclosed a method of manufacturing a semiconductor device capable of obtaining a higher static capacity and a lower leak current characteristic. According to the present invention, the method includes forming a lower electrode and forming a tantalum oxide film. In particular, it performs a plasma process during the process of forming the tantalum oxide film, and in the last step of forming the tantalum oxide firm it controls the amount of source fluid to form a tantalum oxy-nitride film, thus forming an upper electrode.
摘要翻译：本发明一般涉及制造半导体器件的方法。公开了一种制造能够获得较高静电容量和较低漏电流特性的半导体器件的方法。根据本发明，该方法包括形成下电极并形成氧化钽膜。特别是，在形成氧化钽膜的过程中，进行等离子体处理，在形成钽氧化物的最后步骤中，控制源流体的量来形成氮氧化钽膜，由此形成上电极。

3. 发明授权

US06329237B1 Method of manufacturing a capacitor in a semiconductor device using a high dielectric tantalum oxide or barium strontium titanate material that is treated in an ozone plasma 有权
标题翻译：在使用在臭氧等离子体中处理的高介电钽氧化物或钛酸钡锶材料的半导体器件中制造电容器的方法
公开(公告)号：US06329237B1
公开(公告)日：2001-12-11
申请号：US09466896
申请日：1999-12-20
申请人： Kyong Min Kim , Chan Lim , Kil Ho Lee , Ki Seon Park
发明人： Kyong Min Kim , Chan Lim , Kil Ho Lee , Ki Seon Park
IPC分类号： H01L218242
CPC分类号： H01L21/31691 , C23C16/405 , C23C16/409 , C23C16/56 , H01L28/55
摘要： There is disclosed a method of making a high dielectric capacitor of a semiconductor device using Ta2O5, BST((Ba1−xSrx)TiO3) etc. of a high dielectric characteristic as a capacitor dielectric film in a very high integrated memory device. The present invention has its object to provide a method of manufacturing a high dielectric capacitor of a semiconductor device, which can effectively remove carbon contained within the thin film after deposition of the BST film and defects of oxygen depletion caused upon deposition of the thin film and which can also remove carbon contained within the thin film after deposition of the tantalum oxide film and defects of oxygen depletion caused upon deposition of the thin film, without further difficult processes or without any deterioration of the electrical characteristic of the capacitor. It employs the technology which is able to effectively removing defects of carbon and oxygen depletion within the thin film, by forming a plasma O3 gas having a good reactivity and by processing the plasma for the BST thin film and tantalum oxide film. Thus, it can extend the lifetime of the activated oxygen of oxygen, which had been a problem in processing a conventional UV-O3, by means of plasma process using O3 gas. Therefore, it can effectively remove defects of carbon and oxygen within the BST thin film and tantalum oxide film without complicating the process or deteriorating the electrical characteristic of the capacitor. The present invention also proposes a detailed process condition, which can optimize the plasma process using O3 gas.
摘要翻译：公开了在非常高的集成存储器件中使用具有高介电特性的Ta2O5，BST（（Ba1-xSrx）TiO3）等作为电容器电介质膜的半导体器件的高介电电容器的方法。本发明的目的是提供一种制造半导体器件的高介电电容器的方法，其可以有效地去除沉积BST膜之后的薄膜中包含的碳和沉积薄膜时引起的氧耗损缺陷，其也可以在沉积氧化钽膜之后，除去薄膜中所含的碳和沉积薄膜所引起的氧耗尽的缺陷，而不需要进一步的困难处理或不会使电容器的电特性恶化。通过形成具有良好反应性的等离子体O 3气体和通过处理BST薄膜和氧化钽膜的等离子体，采用能够有效地去除薄膜内的碳和氧缺乏的缺陷的技术。因此，通过使用O 3气体的等离子体处理，可以延长氧气的活化氧的寿命，这在处理常规的UV-O 3中是一个问题。因此，可以有效地去除BST薄膜和氧化钽膜内的碳和氧的缺陷，而不会使工艺复杂化或劣化电容器的电特性。本发明还提出了一种详细的工艺条件，其可以优化使用O 3气体的等离子体工艺。

4. 发明授权

US09293319B2 Removal of metal 有权
标题翻译：去除金属
公开(公告)号：US09293319B2
公开(公告)日：2016-03-22
申请号：US13044134
申请日：2011-03-09
申请人： Brian Dolan , Robert J. Hanson , Chan Lim
发明人： Brian Dolan , Robert J. Hanson , Chan Lim
IPC分类号： B08B3/00 , H01L21/02 , H01L21/66
CPC分类号： H01L21/02071 , H01L22/12 , H01L22/20
摘要： Methods of removing metal from a portion of a substrate are useful in integrated circuit fabrication. Methods include exposing the substrate to an oxidizing environment comprising at least one oxidizing agent and at least one reducing agent, and exposing the substrate to a reducing environment comprising at least one reducing agent and at least one oxidizing agent.
摘要翻译：从基板的一部分去除金属的方法在集成电路制造中是有用的。方法包括将底物暴露于包含至少一种氧化剂和至少一种还原剂的氧化环境中，并将底物暴露于包含至少一种还原剂和至少一种氧化剂的还原环境中。

5. 发明申请

US20120040534A1 GAP PROCESSING 有权
标题翻译： GAP处理
公开(公告)号：US20120040534A1
公开(公告)日：2012-02-16
申请号：US13282563
申请日：2011-10-27
申请人： Arthur J. McGinnis , Sachin Joshi , Chan Lim
发明人： Arthur J. McGinnis , Sachin Joshi , Chan Lim
IPC分类号： H01L21/31
CPC分类号： H01L21/31608 , H01L21/02164 , H01L21/02274 , H01L21/7682 , H01L21/76885
摘要： Among various methods, devices, and apparatuses, a number of methods are provided for forming a gap between circuitry. One such method includes depositing a first oxide precursor material on at least two conductive lines having at least one gap between the at least two conductive lines, and forming a breadloaf configuration with the first oxide precursor material on a top of each of the at least two conductive lines that leaves a space between a closest approach of at least two adjacent breadloaf configurations. The method also includes depositing a second oxide precursor material over the first oxide precursor material, where depositing the second oxide precursor material results in closing the space between the closest approach of the at least two adjacent breadloaf configurations.
摘要翻译：在各种方法中，设备和装置提供了用于在电路之间形成间隙的多种方法。一种这样的方法包括在至少两条导线之间沉积第一氧化物前体材料，所述至少两条导线在至少两条导电线之间具有至少一个间隙，并且在至少两条导线中的每一条的顶部上形成具有第一氧化物前体材料的面包构型在至少两个相邻的面包构造的最接近的方式之间留下空间的导电线。该方法还包括在第一氧化物前体材料上沉积第二氧化物前体材料，其中沉积第二氧化物前体材料导致封闭至少两个相邻的面包构型的最接近的方式之间的空间。

6. 发明申请

US20100047991A1 HIGH-K DIELECTRIC FILM, METHOD OF FORMING THE SAME AND RELATED SEMICONDUCTOR DEVICE 有权
标题翻译：高K介电膜，其形成方法和相关半导体器件
公开(公告)号：US20100047991A1
公开(公告)日：2010-02-25
申请号：US12609670
申请日：2009-10-30
申请人： Kil-Ho Lee , Chan Lim
发明人： Kil-Ho Lee , Chan Lim
IPC分类号： H01L21/314 , H01L21/02
CPC分类号： H01L21/28185 , H01L21/28194 , H01L21/28202 , H01L29/513 , H01L29/518 , H01L2924/0002 , Y10S257/914 , H01L2924/00
摘要： A high-k dielectric film, a method of forming the high-k dielectric film, and a method of forming a related semiconductor device are provided. The high-k dielectric film includes a bottom layer of metal-silicon-oxynitride having a first nitrogen content and a first silicon content and a top layer of metal-silicon-oxynitride having a second nitrogen content and a second silicon content. The second nitrogen content is higher than the first nitrogen content and the second silicon content is higher than the first silicon content.
摘要翻译：提供了高k电介质膜，形成高k电介质膜的方法以及形成相关半导体器件的方法。高k电介质膜包括具有第一氮含量和第一硅含量的金属 - 氮氧化硅的底层和具有第二氮含量和第二硅含量的金属 - 氮氧化硅的顶层。第二氮含量高于第一氮含量，第二硅含量高于第一硅含量。

7. 发明授权

US07405482B2 High-k dielectric film, method of forming the same and related semiconductor device 有权
标题翻译：高k电介质膜，其形成方法及相关半导体器件
公开(公告)号：US07405482B2
公开(公告)日：2008-07-29
申请号：US11342370
申请日：2006-01-27
申请人： Kil-Ho Lee , Chan Lim
发明人： Kil-Ho Lee , Chan Lim
IPC分类号： H01L23/48 , H01L23/52 , H01L29/40
CPC分类号： H01L21/28185 , H01L21/28194 , H01L21/28202 , H01L29/513 , H01L29/518 , H01L2924/0002 , Y10S257/914 , H01L2924/00
摘要： A high-k dielectric film, a method of forming the high-k dielectric film, and a method of forming a related semiconductor device are provided. The high-k dielectric film includes a bottom layer of metal-silicon-oxynitride having a first nitrogen content and a first silicon content and a top layer of metal-silicon-oxynitride having a second nitrogen content and a second silicon content. The second nitrogen content is higher than the first nitrogen content and the second silicon content is higher than the first silicon content.
摘要翻译：提供了高k电介质膜，形成高k电介质膜的方法以及形成相关半导体器件的方法。高k电介质膜包括具有第一氮含量和第一硅含量的金属 - 氮氧化硅的底层和具有第二氮含量和第二硅含量的金属 - 氮氧化硅的顶层。第二氮含量高于第一氮含量，第二硅含量高于第一硅含量。

8. 发明授权

US07399702B2 Methods of forming silicide 有权
标题翻译：形成硅化物的方法
公开(公告)号：US07399702B2
公开(公告)日：2008-07-15
申请号：US11048236
申请日：2005-02-01
申请人： Chan Lim , Bum Ki Moon
发明人： Chan Lim , Bum Ki Moon
IPC分类号： H01L21/44
CPC分类号： H01L21/28097 , H01L21/28518 , H01L29/4975 , H01L29/66545 , H01L29/6656
摘要： Methods of fully siliciding semiconductive materials of semiconductor devices are disclosed. A preferred embodiment comprises depositing an alloy comprised of a first metal and a second metal over a semiconductive material. The device is heated, causing atoms of the semiconductive material to move towards and bond to the atoms of the second metal, leaving vacancies in the semiconductive material, and causing atoms of the first metal to move into the vacancies in the semiconductive material.
摘要翻译：公开了半导体器件半导体材料完全硅化的方法。优选的实施方案包括在半导体材料上沉积由第一金属和第二金属组成的合金。该器件被加热，导致半导体材料的原子向第二金属的原子移动并且结合到第二金属的原子上，在半导体材料中留下空位，并使第一金属的原子移动到半导体材料中的空位中。

9. 发明授权

US06723598B2 Method for manufacturing aluminum oxide films for use in semiconductor devices 有权
标题翻译：用于制造用于半导体器件的氧化铝膜的方法
公开(公告)号：US06723598B2
公开(公告)日：2004-04-20
申请号：US09736384
申请日：2000-12-15
申请人： Chan Lim , Kyong-Min Kim , Yong-Sik Yu
发明人： Chan Lim , Kyong-Min Kim , Yong-Sik Yu
IPC分类号： H01L218242
CPC分类号： C23C16/45534 , C23C16/403 , H01L21/02178 , H01L21/0228 , H01L21/02318 , H01L21/31616 , H01L21/3162
摘要： A method for manufacturing an aluminum oxide film for use in a semiconductor device, the method including the steps of preparing a semiconductor substrate and setting the semiconductor substrate in a reaction chamber, supplying an aluminum source material and NH3 gas into the reaction chamber simultaneously for being absorbed on the semiconductor substrate, discharging unreacted MTMA or by-product by flowing nitrogen gas into the reaction chamber or vacuum purging, supplying an oxygen source material into the reaction chamber for being absorbed on the semiconductor substrate, and discharging unreacted oxygen source or by-product by flowing nitrogen gas into the reaction chamber or vacuum purging.
摘要翻译：一种制造用于半导体器件的氧化铝膜的方法，所述方法包括以下步骤：制备半导体衬底并将所述半导体衬底设置在反应室中，同时将铝源材料和NH 3气体同时供应到所述反应室中以供吸收在半导体衬底上，通过将氮气流入反应室或真空清除来排出未反应的MTMA或副产物，将氧源材料供应到反应室中以吸收在半导体衬底上，并将未反应的氧源或副反应器排出，产物通过将氮气流入反应室或进行真空清洗。

10. 发明授权

US06426307B2 Method of manufacturing an aluminum oxide film in a semiconductor device 失效
标题翻译：在半导体器件中制造氧化铝膜的方法
公开(公告)号：US06426307B2
公开(公告)日：2002-07-30
申请号：US09882011
申请日：2001-06-15
申请人： Chan Lim
发明人： Chan Lim
IPC分类号： H01L2131
CPC分类号： C23C16/45553 , C23C16/403 , C23C16/45534 , H01L21/02178 , H01L21/0228 , H01L21/31616
摘要： In a method of manufacturing an aluminum oxide film using atomic layer deposition, alcohol is delivered as an oxygen source instead of water vapor into a reactor via a different delivery line from an aluminum source. Thus, the disclosed method can prevent degradation of an aluminum oxide thin film in uniform fashion by a chemical vapor deposition method that is parasitically generated. Also, an activation gas is delivered into the reactor at about the same time an aluminum source and an alcoholic gas is delivered. Therefore, the disclosed method can prevent reduction in the deposition rate and also prohibit degradation in an electrical property by impurity.
摘要翻译：在使用原子层沉积制造氧化铝膜的方法中，通过与铝源不同的输送管线将醇作为氧源而不是水蒸汽输送到反应器中。因此，所公开的方法可以通过寄生生成的化学气相沉积方法来均匀地防止氧化铝薄膜的劣化。此外，活化气体在大约同时输送铝源和酒精气体的同时被输送到反应器中。因此，所公开的方法可以防止沉积速率的降低，并且还防止杂质对电性质的劣化。

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