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1. 发明授权

US08840547B2 Flexible, selectively rotatable tissue retractor and method for using the retractor 有权
标题翻译：灵活的，可选择性地旋转的组织牵缩器和使用牵开器的方法
公开(公告)号：US08840547B2
公开(公告)日：2014-09-23
申请号：US12329324
申请日：2008-12-05
申请人： Carlos Rivera , Matthew A. Palmer , Michael Kirk , Max Mendez
发明人： Carlos Rivera , Matthew A. Palmer , Michael Kirk , Max Mendez
IPC分类号： A61B1/32 , A61B17/02 , A61B17/29 , A61B17/00 , A61B19/00
CPC分类号： A61B17/0218 , A61B17/00234 , A61B17/29 , A61B2017/00349 , A61B2017/00818 , A61B2017/00827 , A61B2017/00867 , A61B2017/2905 , A61B2017/2926 , A61B2090/0811
摘要： A retractor for manipulating an object, the retractor includes a retractor body with proximal and distal ends, a retraction device with a head connected at the distal end of the retractor body and flexible needles of a shape memory material having a memory shape, the memory shape of the needles including a portion with an arcuate shape housed, at least partially, within the head. The retractor further includes an actuation device connected to the proximal end of the retractor body and operatively connected to the needles, the actuation device, upon actuation thereof, moving the needles out of the head and withdrawing the needles into the head and a rotation joint allowing the distal end of the retractor body and the retraction device to rotate independent of the proximal end of the retractor body.
摘要翻译：一种用于操纵物体的牵开器，所述牵开器包括具有近端和远端的牵开器主体，具有连接在所述牵开器主体的远端处的头的回缩装置和具有存储器形状的形状记忆材料的柔性针，包括具有弓形形状的部分，至少部分地容纳在头部内。牵开器还包括连接到牵开器主体的近端并且可操作地连接到针的致动装置，致动装置在其致动时将针移出头部并将针抽出到头部中，并且允许旋转关节允许牵开器主体的远端和收回装置独立于牵开器本体的近端旋转。

2. 发明申请

US20090137878A1 Flexible, Selectively Rotatable Tissue Retractor and Method for Using the Retractor 有权
标题翻译：灵活的，可选择的可旋转组织牵引器和使用牵引器的方法
公开(公告)号：US20090137878A1
公开(公告)日：2009-05-28
申请号：US12329324
申请日：2008-12-05
申请人： Carlos Rivera , Matthew A. Palmer , Michael Kirk , Max Mendez
发明人： Carlos Rivera , Matthew A. Palmer , Michael Kirk , Max Mendez
IPC分类号： A61B1/32
CPC分类号： A61B17/0218 , A61B17/00234 , A61B17/29 , A61B2017/00349 , A61B2017/00818 , A61B2017/00827 , A61B2017/00867 , A61B2017/2905 , A61B2017/2926 , A61B2090/0811
摘要： A retractor for manipulating an object, the retractor includes a retractor body with proximal and distal ends, a retraction device with a head connected at the distal end of the retractor body and flexible needles of a shape memory material having a memory shape, the memory shape of the needles including a portion with an arcuate shape housed, at least partially, within the head. The retractor further includes an actuation device connected to the proximal end of the retractor body and operatively connected to the needles, the actuation device, upon actuation thereof, moving the needles out of the head and withdrawing the needles into the head and a rotation joint allowing the distal end of the retractor body and the retraction device to rotate independent of the proximal end of the retractor body.
摘要翻译：一种用于操纵物体的牵开器，所述牵开器包括具有近端和远端的牵开器主体，具有连接在所述牵开器主体的远端处的头的回缩装置和具有存储器形状的形状记忆材料的柔性针，包括具有弓形形状的部分，至少部分地容纳在头部内。牵开器还包括连接到牵开器主体的近端并且可操作地连接到针的致动装置，致动装置在其致动时将针移出头部并将针抽出到头部中，并且允许旋转关节允许牵开器主体的远端和收回装置独立于牵开器本体的近端旋转。

3. 发明申请

US20090026682A1 Releasing Instrument Holder and Method of Operating the Instrument Holder 有权
标题翻译：释放仪器架和操作仪器支架的方法
公开(公告)号：US20090026682A1
公开(公告)日：2009-01-29
申请号：US11828424
申请日：2007-07-26
申请人： Kevin Smith , Derek Deville , Thomas Bales , Carlos Rivera , Matthew Palmer , Max Mendez , Michael Kirk
发明人： Kevin Smith , Derek Deville , Thomas Bales , Carlos Rivera , Matthew Palmer , Max Mendez , Michael Kirk
IPC分类号： B25B9/00
CPC分类号： B25B25/00 , A61B1/00128 , B25B9/00 , Y10S279/904 , Y10T279/17743 , Y10T279/17752 , Y10T279/17811
摘要： An automatically releasing instrument holder includes a grip to be held by an operator for guiding an instrument, an actuator to be activated by the operator and a biasing device exerting a force. A clamp is moved by the actuator toward the instrument against the force of the biasing device and is moved by the biasing device away from the instrument upon releasing the actuator. A method for operating the instrument holder is also provided.
摘要翻译：自动释放的仪器保持器包括由操作者保持用于引导仪器的手柄，由操作者激活的致动器和施加力的偏压装置。致动器夹紧器抵抗偏置装置的力而朝向仪器移动，并且在释放致动器时由夹具移动离开仪器。还提供了一种操作仪器支架的方法。

4. 发明授权

US07959162B2 Releasing instrument holder and method of operating the instrument holder 有权
标题翻译：释放仪器架和操作仪器架的方法
公开(公告)号：US07959162B2
公开(公告)日：2011-06-14
申请号：US11828424
申请日：2007-07-26
申请人： Kevin Smith , Derek Deville , Thomas Bales , Carlos Rivera , Matthew Palmer , Max Mendez , Michael Kirk
发明人： Kevin Smith , Derek Deville , Thomas Bales , Carlos Rivera , Matthew Palmer , Max Mendez , Michael Kirk
IPC分类号： B23B31/16
CPC分类号： B25B25/00 , A61B1/00128 , B25B9/00 , Y10S279/904 , Y10T279/17743 , Y10T279/17752 , Y10T279/17811
摘要： An automatically releasing instrument holder includes a grip to be held by an operator for guiding an instrument, an actuator to be activated by the operator and a biasing device exerting a force. A clamp is moved by the actuator toward the instrument against the force of the biasing device and is moved by the biasing device away from the instrument upon releasing the actuator. A method for operating the instrument holder is also provided.
摘要翻译：自动释放的仪器保持器包括由操作者保持用于引导仪器的手柄，由操作者激活的致动器和施加力的偏压装置。致动器夹紧器抵抗偏置装置的力而朝向仪器移动，并且在释放致动器时由夹具移动离开仪器。还提供了一种操作仪器支架的方法。

5. 发明申请

US20050119864A1 RF metrology characterization for field installation and serviceability for the plasma processing industry 有权
标题翻译：用于等离子体处理行业的现场安装和可维护性的RF测量特性
公开(公告)号：US20050119864A1
公开(公告)日：2005-06-02
申请号：US10727081
申请日：2003-12-02
申请人： David Coumou , Clifford Weatherell , Michael Kirk , Kevin Nasman
发明人： David Coumou , Clifford Weatherell , Michael Kirk , Kevin Nasman
IPC分类号： H01J37/32 , G06F15/00
CPC分类号： H01J37/32935
摘要： A system for field substitution of components of a RF metrology system. The system includes a sensor/cable combination and an analysis unit. Parameters of the RF metrology system are determined prior to placing the RF metrology system in the field. From these parameters, either component, the cable/sensor combination or the analysis module, may be substituted in the field by recalibrating the system for the substituted unit. Such recalibration is carried out utilizing the parameters determined prior to placing the RF metrology system in the field.
摘要翻译：用于场地替代RF测量系统的组件的系统。该系统包括传感器/电缆组合和分析单元。在将RF测量系统置于现场之前，确定射频测量系统的参数。通过这些参数，可以通过重新校准替代单元的系统来在现场替代任一组件，电缆/传感器组合或分析模块。使用在将RF测量系统放置在现场之前确定的参数进行这种重新校准。

6. 发明授权

US5854487A Scanning probe microscope providing unobstructed top down and bottom up views 失效
标题翻译：扫描探针显微镜提供畅通无阻的自顶向下和向下观察
公开(公告)号：US5854487A
公开(公告)日：1998-12-29
申请号：US808351
申请日：1997-02-28
申请人： David Braunstein , Michael Kirk , Quoc Ly , Thai Nguyen
发明人： David Braunstein , Michael Kirk , Quoc Ly , Thai Nguyen
IPC分类号： G01Q30/02 , G01B7/34 , G01N21/01 , G01N27/00 , G01Q10/02 , G01Q10/04 , G01Q30/14 , G01Q30/20 , G01Q60/02 , G01Q70/02 , G02B21/18 , H01J37/20 , H01J37/26
CPC分类号： G01Q10/04 , B82Y35/00 , G01Q30/025 , Y10S977/849 , Y10S977/86 , Y10S977/868 , Y10S977/869 , Y10S977/87 , Y10S977/872 , Y10S977/873
摘要： Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.
摘要翻译：提供扫描探针显微镜和扫描探头，具有改进的光学可视化和样品操作能力。 SPM和SPM头包括用于在x，y和/或z方向扫描的至少一个弯曲台。在优选实施例中，SPM或SPM头包括用于在x，y和z方向扫描的挠曲台。 z扫描台优选地定位在x-y弯曲台的横向覆盖区的外侧，使得从z扫描台延伸的探针位于仪器的横向覆盖区之外。 SPM和SPM头被配置为提供样品和/或探针的自顶向下和从底部的光学视图，并且能够执行样品的同时扫描探针显微镜和光学成像。 SPM和SPM头设计为可以与现有的各种主要制造商现有的直立和倒置光学显微镜组合。

7. 发明授权

US06310342B1 Optical microscope stage for scanning probe microscope 失效
标题翻译：扫描探针显微镜的光学显微镜镜
公开(公告)号：US06310342B1
公开(公告)日：2001-10-30
申请号：US09128885
申请日：1998-08-04
申请人： David Braunstein , Michael Kirk , Quoc Ly , Thai Nguyen
发明人： David Braunstein , Michael Kirk , Quoc Ly , Thai Nguyen
IPC分类号： H01J3720
CPC分类号： G01Q10/04 , G01Q30/025 , Y10S977/849 , Y10S977/86 , Y10S977/868 , Y10S977/869 , Y10S977/87 , Y10S977/872 , Y10S977/873
摘要： Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.
摘要翻译：提供扫描探针显微镜和扫描探头，具有改进的光学可视化和样品操作能力。 SPM和SPM头包括用于在x，y和/或z方向扫描的至少一个弯曲台。在优选实施例中，SPM或SPM头包括用于在x，y和z方向扫描的挠曲台。 z扫描台优选地定位在x-y弯曲台的横向覆盖区的外侧，使得从z扫描台延伸的探针位于仪器的横向覆盖区之外。 SPM和SPM头被配置为提供样品和/或探针的自顶向下和从底部的光学视图，并且能够执行样品的同时扫描探针显微镜和光学成像。 SPM和SPM头设计为可以与现有的各种主要制造商现有的直立和倒置光学显微镜组合。

8. 发明授权

US5729917A Combination midsole stabilizer and enhancer 失效
公开(公告)号：US5729917A
公开(公告)日：1998-03-24
申请号：US582681
申请日：1996-01-04
申请人： Neil Slepian , Michael Kirk , Joseph Hamill , Kenton Geer
发明人： Neil Slepian , Michael Kirk , Joseph Hamill , Kenton Geer
IPC分类号： A43B13/18 , A43B21/26
CPC分类号： A43B13/181 , A43B21/26
摘要： A structure for enhancing the stability of a midsole including a plurality of strands which extend from a position on top of the midsole to a location secured to the bottom of the midsole. The strands are preferably secured to an energy return system which is positioned on the top of the midsole. The initial strike imparted on the lateral side of the midsole compresses both the midsole and the strands. The strands, which separate during the initial strike from the midsole and assume an arcuate shape, enhance the shock absorbing properties of the shoe. As the foot rotates, the heel exerts pressure on the energy return system, and the strands are then pulled inwardly thereby restricting the outward movement of the midsole. The foot is further unlikely to assume a substantially pronated position due to the tension in the strands along the medial portion of structure in combination with the shock absorption upon initial strike.

9. 发明申请

US20080013083A1 METHODS AND SYSTEMS FOR DETERMINING A CHARACTERISTIC OF A WAFER 有权
标题翻译：用于确定波形特性的方法和系统
公开(公告)号：US20080013083A1
公开(公告)日：2008-01-17
申请号：US11673150
申请日：2007-02-09
申请人： Michael Kirk , Christopher Bevis , David Adler , Kris Bhaskar
发明人： Michael Kirk , Christopher Bevis , David Adler , Kris Bhaskar
IPC分类号： G01N21/956 , G06F17/10
CPC分类号： G01N21/9501 , G01N21/4738 , G01N21/55
摘要： Methods and systems for determining a characteristic of a wafer are provided. One method includes generating output responsive to light from the wafer using an inspection system. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The method also includes determining the characteristic of the wafer using the second output. One system includes an inspection subsystem configured to illuminate the wafer and to generate output responsive to light from the wafer. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The system also includes a processor configured to determine the characteristic of the wafer using the second output.
摘要翻译：提供了用于确定晶片特性的方法和系统。一种方法包括使用检查系统响应来自晶片的光产生输出。输出包括对应于晶片上的缺陷的第一输出和不对应于缺陷的第二输出。该方法还包括使用第二输出确定晶片的特性。一个系统包括检查子系统，该检查子系统配置成照亮晶片并产生响应于来自晶片的光的输出。输出包括对应于晶片上的缺陷的第一输出和不对应于缺陷的第二输出。该系统还包括配置成使用第二输出来确定晶片的特性的处理器。

10. 发明授权

US5939719A Scanning probe microscope with scan correction 失效
公开(公告)号：US5939719A
公开(公告)日：1999-08-17
申请号：US831153
申请日：1997-04-01
申请人： Sang-Il Park , Ian R. Smith , Michael Kirk
发明人： Sang-Il Park , Ian R. Smith , Michael Kirk
IPC分类号： G01Q30/04 , G01N23/00 , G01Q10/00 , G01Q20/02 , G01Q20/04 , G01Q30/02 , G01Q30/20 , G01Q60/10 , G01Q70/02 , G01Q70/10 , G01R31/302 , G02B21/00 , G02B21/18 , G02B21/26 , G21K7/00 , H01J37/26
CPC分类号： G01Q20/02 , B82Y35/00 , G01Q30/025 , G01Q70/02 , G02B21/002 , G02B21/26 , Y10S977/851 , Y10S977/869 , Y10S977/87 , Y10S977/874
摘要： An optical system for a scanning probe microscope provides both an optical on-axis view and an optical oblique view of the sample by means of two optical paths each providing an image to a CCD camera via an auto-zoom lens. A shutter alternately blocks the image of either view from reaching the auto-zoom lens. The CCD camera provides the optical image to a video display which also displays the scanning probe image, thus eliminating the need for eyepieces and allowing easy viewing of both the optical and scanning probe images simultaneously.

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