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    • 6. 发明申请
    • A METHOD OF FABRICATING A MIXED SUBSTRATE
    • 一种混合基板的方法
    • WO2008077796A1
    • 2008-07-03
    • PCT/EP2007/063829
    • 2007-12-12
    • S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIESCOMMISSARIAT A L'ENERGIE ATOMIQUEKOSTRZEWA, MarekLETERTRE, Fabrice
    • KOSTRZEWA, MarekLETERTRE, Fabrice
    • H01L21/762
    • H01L21/76254
    • The invention provides a method of fabricating a mixed substrate which comprises the following steps: forming or depositing an insulating layer (2) on a support substrate (1) formed from a semiconductor material the front face (11) of which comprises open cavities (13), in order to fill said cavities with insulating material (21) and to form thereover an upper insulating layer; polishing at least a portion of said upper insulating layer to obtain a thinned insulating layer (22') of a predetermined thickness and perfectly planar; transferring an active layer (31) derived from a source substrate (3) formed from semiconductor material onto said thinned insulating layer (22'); and heat treating in an inert and/or reducing atmosphere, the thicknesses of the active layer (31) and of the thinned insulating layer (22'), and the temperature and the duration of the heat treatment are selected in order to cause the removal of at least a portion of said thinned insulating layer (22') and only conserve insulating material (21) in the cavities of said support substrate (1).
    • 本发明提供一种制造混合基板的方法,其包括以下步骤:在由半导体材料形成的支撑基板(1)上形成或沉积绝缘层(2),所述半导体材料的前表面(11)包括开放空腔(13) ),以便用绝缘材料(21)填充所述空腔并在其上形成上绝缘层; 抛光所述上绝缘层的至少一部分以获得具有预定厚度并且完全平坦的薄化绝缘层(22'); 将衍生自由半导体材料形成的源极衬底(3)的有源层(31)转移到所述薄化绝缘层(22')上; 在惰性和/或还原气氛中进行热处理,选择活性层(31)和薄化绝缘层(22')的厚度,以及热处理的温度和持续时间,以便除去 的所述薄化绝缘层(22')的至少一部分,并且仅在所述支撑衬底(1)的空腔中保存绝缘材料(21)。