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热词
    • 1. 发明授权
    • Method for improved die release of a semiconductor device from a wafer
    • 用于从晶片改进半导体器件脱模的方法
    • US06544898B2
    • 2003-04-08
    • US09891105
    • 2001-06-25
    • Bruce PolsonNan ZhangHoward P. Wilson
    • Bruce PolsonNan ZhangHoward P. Wilson
    • H01L2100
    • B81C1/00873B81C2201/014
    • A microelectromechanical (MEMS) device and a method of fabricating a MEMS device are provided. The method of fabricating the MEMS device includes the steps of: etching a die release trench in a primary handle layer of a wafer having the handle layer, an etch-stop layer disposed on the primary handle layer, and a device layer disposed on the etch-stop layer; patterning a release trench in the device layer that is aligned with the release trench in the primary handle layer; temporarily attaching an additional handle layer to the primary handle layer; etching the device layer to define a structure in the device layer; removing the etch-stop layer; and removing the additional handle layer to release the die.
    • 提供了一种微机电(MEMS)器件和MEMS器件的制造方法。 制造MEMS器件的方法包括以下步骤:蚀刻具有手柄层的晶片的主手柄层中的裸片释放沟槽,设置在主手柄层上的蚀刻停止层以及设置在蚀刻上的器件层 停留层 图案化在与主手柄层中的释放沟槽对准的器件层中的释放沟槽; 临时附加手柄层到主手柄层; 蚀刻器件层以限定器件层中的结构; 去除蚀刻停止层; 并移除附加手柄层以释放模具。
    • 2. 发明授权
    • Pad array carrier IC device using flexible tape
    • 垫阵列载体IC器件采用软磁带
    • US5045921A
    • 1991-09-03
    • US457002
    • 1989-12-26
    • Paul T. LinHoward P. Wilson
    • Paul T. LinHoward P. Wilson
    • H01L23/057H01L23/495H01L23/498H05K3/30H05K3/36
    • H05K3/303H01L23/057H01L23/49572H01L23/49827H01L23/4985H01L2224/32225H01L2224/32245H01L2224/48091H01L2224/48227H01L2224/73265H01L24/48H01L24/73H01L2924/00014H01L2924/01078H01L2924/01079H01L2924/12042H01L2924/14H01L2924/15311H01L2924/1532H01L2924/16152H05K2201/10568H05K2201/10681H05K2201/10734H05K2201/2036H05K3/363Y02P70/613
    • An electronic pad array carrier IC device for mounting on a printed circuit board (PCB) or flex circuit substrate has a thin, flexible "tape" substrate having a plurality of traces. The substrate may be a polyimide or other material that can withstand relatively large lateral mechanical displacement. An integrated circuit die is mounted in proximity with or on the substrate and electrical connections between the integrated circuit chip and the traces are made by any conventional means. The substrate traces are provided at their outer ends with solder balls or pads for making connections to the PCB. A package body covers the die, which body may be optionally used to stand off the package a set distance from the PCB so that the solder balls will form the proper concave structure. Alternatively, a carrier structure may be provided around the periphery of the substrate to add rigidity during handling, testing and mounting, but which may also provide the stand-off function. The thin, flexible substrate can absorb a relatively large lateral or even vertical mechanical displacement over a rather large package area that may accommodate as few as 20 or as many 500 or more connections. The substrate may be optionally transparent or translucent to permit inspection of the bonds after mounting to the PCB. The PCB or flex circuit may also be transparent or translucent for bond inspection purposes. The solder pads or balls may be joined to a via through the substrate at least partially filled with electrically conductive material to permit back side testing of the carrier before or after mounting of the package to the PCB. Additionally, a heat sink structure may be directly bonded to the die in the pad array carrier IC device.
    • 用于安装在印刷电路板(PCB)或柔性电路基板上的电子焊盘阵列载体IC器件具有具有多个迹线的薄的,柔性的“带”衬底。 衬底可以是聚酰亚胺或能承受相对大的横向机械位移的其他材料。 集成电路管芯安装在衬底附近或衬底上,并且集成电路芯片和迹线之间的电连接通过任何常规方式制成。 衬底迹线在其外端设置有用于连接到PCB的焊球或焊盘。 封装体覆盖模具,该主体可以可选地用于将封装与PCB隔开一定距离,使得焊球将形成适当的凹形结构。 或者,可以在基板的周边周围设置载体结构,以在处理,测试和安装期间增加刚性,但是也可以提供隔离功能。 薄的柔性基底可以在相当大的封装区域上吸收相对较大的侧向或甚至垂直的机械位移,其可以容纳少至20个或多于500个或更多个连接。 衬底可以是任选的透明或半透明的,以允许在安装到PCB之后检查焊接。 PCB或柔性电路也可以是透明或半透明的,用于粘合检查目的。 焊盘或球可以通过至少部分地填充有导电材料的基板连接到通孔,以允许在将封装安装到PCB之前或之后的载体的背侧测试。 此外,散热器结构可以直接接合到焊盘阵列载体IC器件中的管芯。