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    • 7. 发明授权
    • Magnetic memory with tunnel junction memory cells and phase transition material for controlling current to the cells
    • 具有隧道结存储单元的磁存储器和用于控制电流到电池的相变材料
    • US06653704B1
    • 2003-11-25
    • US10254432
    • 2002-09-24
    • Bruce A. GurneyStefan Maat
    • Bruce A. GurneyStefan Maat
    • H01L2982
    • H01L27/224
    • A magnetic random access memory (MRAM) array includes a plurality of magnetic tunnel junction (MTJ) memory cells and a plurality of non-electronic switching elements, each MTJ memory cell and an associated switching element being in electrical series connection and located between the bit and word lines of the array. The switching element is a layer of vanadium dioxide, a material that exhibits a first order phase transition at a transition temperature of approximately 65° C. from a low-temperature monoclinic (semiconducting) to a high-temperature tetragonal (metallic) crystalline structure. This phase transition is accompanied by a change in electrical resistance from high resistance at room temperature to low resistance above the transition temperature. To read a memory cell, the vanadium dioxide switching element associated with that cell is heated to lower the resistance of the switching element to allow sense current to pass through the cell, thereby enabling the memory state of the cell to be read.
    • 磁性随机存取存储器(MRAM)阵列包括多个磁隧道结(MTJ)存储器单元和多个非电子开关元件,每个MTJ存储单元和相关联的开关元件处于电串联连接并且位于位 和数组的字线。 开关元件是一层二氧化钒,这是从低温单斜晶(半导体)到高温四方晶(金属)晶体结构在大约65℃的转变温度下呈现一阶相变的材料。 该相变伴随着电阻从室温下的高电阻到高于转变温度的低电阻。 为了读取存储单元,加热与该单元相关联的二氧化钒开关元件以降低开关元件的电阻,以允许感测电流通过单元,从而使得能够读取单元的存储状态。