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    • 1. 发明申请
    • Combined Single Error Correction/Device Kill Detection Code
    • 组合单错误纠正/设备杀毒检测码
    • US20080307286A1
    • 2008-12-11
    • US11758322
    • 2007-06-05
    • Brian P. LillyRobert GriesSridhar P. SubramanianSukalpa BiswasHao Chen
    • Brian P. LillyRobert GriesSridhar P. SubramanianSukalpa BiswasHao Chen
    • H03M13/00
    • H03M13/09G06F11/1004
    • In one embodiment, an apparatus comprises a check/correct circuit coupled to a control circuit. The check/correct circuit is coupled to receive a block of data and corresponding check bits. The block of data is received as N transmissions, each transmission comprising M data bits and L check bits. The check/correct circuit is configured to detect one or more errors in each of a plurality of non-overlapping windows of K bits in the M data bits, responsive to the M data bits and the L check bits. The control circuit is configured to record which of the plurality of windows have had errors detected and, if a given window of the plurality of windows has had errors detected in each of the N transmissions of the block, the control circuit is configured to signal a device failure. Each of K, L, M, and N are integers greater than one.
    • 在一个实施例中,一种装置包括耦合到控制电路的检查/校正电路。 检查/校正电路被耦合以接收数据块和相应的校验位。 数据块作为N个传输被接收,每个传输包括M个数据位和L个校验位。 检查/校正电路被配置为响应于M个数据位和L个校验位来检测M个数据位中K位的多个非重叠窗口中的每一个中的一个或多个错误。 控制电路被配置为记录多个窗口中哪一个具有检测到的错误,并且如果多个窗口的给定窗口在块的N个传输中的每一个中都检测到错误,则控制电路被配置为发信号 设备故障 K,L,M和N中的每一个是大于1的整数。
    • 2. 发明申请
    • Combined Single Error Correction/Device Kill Detection Code
    • 组合单错误纠正/设备杀毒检测码
    • US20120017135A1
    • 2012-01-19
    • US13246736
    • 2011-09-27
    • Brian P. LillyRobert GriesSridhar P. SubramanianSukalpa BiswasHao Chen
    • Brian P. LillyRobert GriesSridhar P. SubramanianSukalpa BiswasHao Chen
    • H03M13/09G06F11/08
    • H03M13/09G06F11/1004
    • In one embodiment, an apparatus includes a check/correct circuit coupled to a control circuit. The check/correct circuit is coupled to receive a block of data and corresponding check bits. The block of data is received as N transmissions, each transmission including M data bits and L check bits. The check/correct circuit is configured to detect one or more errors in each of a plurality of non-overlapping windows of K bits in the M data bits, responsive to the M data bits and the L check bits. The control circuit is configured to record which of the plurality of windows have had errors detected and, if a given window of the plurality of windows has had errors detected in each of the N transmissions of the block, the control circuit is configured to signal a device failure. Each of K, L, M, and N are integers greater than one.
    • 在一个实施例中,装置包括耦合到控制电路的检查/校正电路。 检查/校正电路被耦合以接收数据块和相应的校验位。 数据块作为N个传输被接收,每个传输包括M个数据位和L个校验位。 检查/校正电路被配置为响应于M个数据位和L个校验位来检测M个数据位中K位的多个非重叠窗口中的每一个中的一个或多个错误。 控制电路被配置为记录多个窗口中哪一个具有检测到的错误,并且如果多个窗口的给定窗口在块的N个传输中的每一个中都检测到错误,则控制电路被配置为发信号 设备故障 K,L,M和N中的每一个是大于1的整数。
    • 3. 发明授权
    • Combined single error correction/device kill detection code
    • 组合单错误纠正/设备杀死检测码
    • US08219880B2
    • 2012-07-10
    • US13246736
    • 2011-09-27
    • Brian P. LillyRobert GriesSridhar P. SubramanianSukalpa BiswasHao Chen
    • Brian P. LillyRobert GriesSridhar P. SubramanianSukalpa BiswasHao Chen
    • H03M13/00
    • H03M13/09G06F11/1004
    • In one embodiment, an apparatus includes a check/correct circuit coupled to a control circuit. The check/correct circuit is coupled to receive a block of data and corresponding check bits. The block of data is received as N transmissions, each transmission including M data bits and L check bits. The check/correct circuit is configured to detect one or more errors in each of a plurality of non-overlapping windows of K bits in the M data bits, responsive to the M data bits and the L check bits. The control circuit is configured to record which of the plurality of windows have had errors detected and, if a given window of the plurality of windows has had errors detected in each of the N transmissions of the block, the control circuit is configured to signal a device failure. Each of K, L, M, and N are integers greater than one.
    • 在一个实施例中,装置包括耦合到控制电路的检查/校正电路。 检查/校正电路被耦合以接收数据块和相应的校验位。 数据块作为N个传输被接收,每个传输包括M个数据位和L个校验位。 检查/校正电路被配置为响应于M个数据位和L个校验位来检测M个数据位中K位的多个非重叠窗口中的每一个中的一个或多个错误。 控制电路被配置为记录多个窗口中哪一个具有检测到的错误,并且如果多个窗口的给定窗口在块的N个传输中的每一个中都检测到错误,则控制电路被配置为发信号 设备故障 K,L,M和N中的每一个是大于1的整数。
    • 4. 发明授权
    • Combined single error correction/device kill detection code
    • 组合单错误纠正/设备杀死检测码
    • US08055975B2
    • 2011-11-08
    • US11758322
    • 2007-06-05
    • Brian P. LillyRobert GriesSridhar P. SubramanianSukalpa BiswasHao Chen
    • Brian P. LillyRobert GriesSridhar P. SubramanianSukalpa BiswasHao Chen
    • H03M13/00
    • H03M13/09G06F11/1004
    • In one embodiment, an apparatus includes a check/correct circuit coupled to a control circuit. The check/correct circuit is coupled to receive a block of data and corresponding check bits. The block of data is received as N transmissions, each transmission including M data bits and L check bits. The check/correct circuit is configured to detect one or more errors in each of a plurality of non-overlapping windows of K bits in the M data bits, responsive to the M data bits and the L check bits. The control circuit is configured to record which of the plurality of windows have had errors detected and, if a given window of the plurality of windows has had errors detected in each of the N transmissions of the block, the control circuit is configured to signal a device failure. Each of K, L, M, and N are integers greater than one.
    • 在一个实施例中,装置包括耦合到控制电路的检查/校正电路。 检查/校正电路被耦合以接收数据块和相应的校验位。 数据块作为N个传输被接收,每个传输包括M个数据位和L个校验位。 检查/校正电路被配置为响应于M个数据位和L个校验位来检测M个数据位中K位的多个非重叠窗口中的每一个中的一个或多个错误。 控制电路被配置为记录多个窗口中哪一个具有检测到的错误,并且如果多个窗口的给定窗口在块的N个传输中的每一个中都检测到错误,则控制电路被配置为发信号 设备故障 K,L,M和N中的每一个是大于1的整数。