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    • 1. 发明申请
    • Microlithographic projection exposure apparatus and method for introducing an immersion liquid into an immersion space
    • 用于将浸没液引入浸入空间的微光刻投影曝光装置和方法
    • US20070132969A1
    • 2007-06-14
    • US10565612
    • 2004-07-08
    • Bernhard GellrichGerd ReisingerDieter SchmerekJens Kugler
    • Bernhard GellrichGerd ReisingerDieter SchmerekJens Kugler
    • G03B27/42
    • G03F7/70341
    • The invention relates to a projection exposure system for microlithography, said system comprising an illumination device for generating a projection light, and a projection objective comprising a plurality of optical elements such as lenses (L5) and enabling a reticle that can be arranged in an object plane of the projection objective to be imaged onto a light-sensitive surface (26) that can be arranged in an image plane of the projection objective and is applied to a carrier (30). The inventive system is also provided with an immersion device between an image-side last optical element (L5) of the projection objective and the light-sensitive surface (26), for introducing an immersion liquid (34) into an immersion chamber (50). Said immersion device comprises means (44; 66) which can prevent the appearance of gas bubbles (48) in the immersion liquid (34), affecting the imaging quality, and/or can remove existing gas bubbles (48). Said means can be, for example, an ultrasound source (66) or a degasifier (44).
    • 本发明涉及一种用于微光刻的投影曝光系统,所述系统包括用于产生投射光的照明装置,以及包括诸如透镜(L 5)的多个光学元件的投影物镜,并且能够将一个掩模版布置在 将被投影物镜的物体平面成像到能够被布置在投影物镜的像平面中并被施加到载体(30)的光敏表面(26)上。 本发明的系统还在投影物镜的最后一个光学元件(L 5)和光敏表面(26)之间设置浸入装置,用于将浸没液(34)引入到浸没室(50) )。 所述浸渍装置包括能够防止浸没液体(34)中的气泡(48)出现的装置(44; 66),影响成像质量,和/或可以去除现有的气泡(48)。 所述装置可以是例如超声源(66)或脱气器(44)。
    • 6. 发明授权
    • Optical system and method for improving imaging properties thereof
    • 用于改善其成像特性的光学系统和方法
    • US07605914B2
    • 2009-10-20
    • US12348204
    • 2009-01-02
    • Thomas StammlerChristian WagnerGerd Reisinger
    • Thomas StammlerChristian WagnerGerd Reisinger
    • G01N21/00
    • G03F7/70258G03F7/705G03F7/706
    • An optical system has at least two optical elements whose spatial relation with respect to each other can be changed. At least one of the optical elements comprises a plurality of optical components. The optical system comprises first measuring means for individually measuring an image defect of each optical component, and first computing means for computing first target positions for the plurality of optical components such that an overall image defect of the at least one of the optical elements is below a predetermined threshold value. Second measuring means are provided for measuring an overall image defect of the optical system, and second computing means represent the measured overall image defect as a linear combination of base functions of an orthogonal function set. The second computing means calculate second target position for the at least two optical elements so as to reduce the overall image defect.
    • 光学系统具有至少两个可相对于彼此的空间关系的光学元件。 至少一个光学元件包括多个光学部件。 光学系统包括用于单独测量每个光学部件的图像缺陷的第一测量装置和用于计算多个光学部件的第一目标位置的第一计算装置,使得至少一个光学元件的整体图像缺陷低于 预定的阈值。 提供第二测量装置用于测量光学系统的整体图像缺陷,第二计算装置将所测量的整体图像缺陷表示为正交函数集的基本函数的线性组合。 第二计算装置计算用于至少两个光学元件的第二目标位置,以便减少整体图像缺陷。
    • 7. 发明申请
    • OPTICAL SYSTEM AND METHOD FOR IMPROVING IMAGING PROPERTIES THEREOF
    • 用于改善其成像特性的光学系统和方法
    • US20090225308A1
    • 2009-09-10
    • US12348204
    • 2009-01-02
    • Thomas StammlerChristian WagnerGerd Reisinger
    • Thomas StammlerChristian WagnerGerd Reisinger
    • G01N21/958G01N21/00
    • G03F7/70258G03F7/705G03F7/706
    • An optical system has at least two optical elements whose spatial relation with respect to each other can be changed. At least one of the optical elements comprises a plurality of optical components. The optical system comprises first measuring means for individually measuring an image defect of each optical component, and first computing means for computing first target positions for the plurality of optical components such that an overall image defect of the at least one of the optical elements is below a predetermined threshold value. Second measuring means are provided for measuring an overall image defect of the optical system, and second computing means represent the measured overall image defect as a linear combination of base functions of an orthogonal function set. The second computing means calculate second target position for the at least two optical elements so as to reduce the overall image defect.
    • 光学系统具有至少两个可相对于彼此的空间关系的光学元件。 至少一个光学元件包括多个光学部件。 光学系统包括用于单独测量每个光学部件的图像缺陷的第一测量装置和用于计算多个光学部件的第一目标位置的第一计算装置,使得至少一个光学元件的整体图像缺陷低于 预定的阈值。 提供第二测量装置用于测量光学系统的整体图像缺陷,第二计算装置将所测量的整体图像缺陷表示为正交函数集的基本函数的线性组合。 第二计算装置计算用于至少两个光学元件的第二目标位置,以便减少整体图像缺陷。
    • 9. 发明申请
    • Optical system and method for improving imaging properties thereof
    • 用于改善其成像特性的光学系统和方法
    • US20070071303A1
    • 2007-03-29
    • US11238841
    • 2005-09-29
    • Thomas StammlerChristian WagnerGerd Reisinger
    • Thomas StammlerChristian WagnerGerd Reisinger
    • G06K9/00
    • G03F7/70258G03F7/705G03F7/706
    • An optical system has at least two optical elements whose spatial relation with respect to each other can be changed. At least one of the optical elements comprises a plurality of optical components. The optical system comprises first measuring means for individually measuring an image defect of each optical component, and first computing means for computing first target positions for the plurality of optical components such that an overall image defect of the at least one of the optical elements is below a predetermined threshold value. Second measuring means are provided for measuring an overall image defect of the optical system, and second computing means represent the measured overall image defect as a linear combination of base functions of an orthogonal function set. The second computing means calculate second target position for the at least two optical elements so as to reduce the overall image defect.
    • 光学系统具有至少两个可相对于彼此的空间关系的光学元件。 至少一个光学元件包括多个光学部件。 光学系统包括用于单独测量每个光学部件的图像缺陷的第一测量装置和用于计算多个光学部件的第一目标位置的第一计算装置,使得至少一个光学元件的整体图像缺陷低于 预定的阈值。 提供第二测量装置用于测量光学系统的整体图像缺陷,第二计算装置将所测量的整体图像缺陷表示为正交函数集的基本函数的线性组合。 第二计算装置计算用于至少两个光学元件的第二目标位置,以便减小整体图像缺陷。