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    • 7. 发明专利
    • Lithographic apparatus and device manufacturing method
    • LITHOGRAPHIC装置和装置制造方法
    • JP2007004175A
    • 2007-01-11
    • JP2006173228
    • 2006-06-23
    • Asml Netherlands Bvエーエスエムエル ネザーランズ ビー.ブイ.
    • VAN DER PASCH ENGELBERTUS ANTOVAN DER SCHOOT HARMEN KLAAS
    • G03F7/20H01L21/027
    • G03F7/70291G03F7/70625
    • PROBLEM TO BE SOLVED: To provide a lithographic apparatus that can accurately position a substrate upon exposure even when the substrate size increases. SOLUTION: A lithographic apparatus is provided which has an array of individually controllable elements to modulate a cross-section of a radiation beam, a substrate table to support a substrate, a projection system to project the modulated radiation beam onto a target portion of the substrate to apply a pattern, and a position encoder having a position sensor and a scale to determine a position of the substrate table. The pattern comprises a first line and a second line, the first line being offset from the second line. The scale comprises a plurality of lines intended to be straight and parallel to one another. The lithographic apparatus further includes: an imaging device to obtain an image of the first and second lines; and an image process unit to determine the non-uniformity of at least a part of the scale based on separation distances between the first and second lines measured at a plurality of positions. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供即使当基板尺寸增加时也可以在曝光时精确地定位基板的光刻设备。 解决方案:提供一种光刻设备,其具有可独立控制的元件的阵列,以调制辐射束的横截面,用于支撑衬底的衬底台,投影系统将调制的辐射束投影到目标部分 以及具有位置传感器和刻度的位置编码器,以确定衬底台的位置。 该图形包括第一行和第二行,第一行与第二行偏移。 该刻度尺包括多条相互直线并平行的线。 光刻设备还包括:成像装置,用于获得第一和第二线的图像; 以及图像处理单元,用于基于在多个位置处测量的第一和第二线之间的间隔距离来确定刻度的至少一部分的不均匀性。 版权所有(C)2007,JPO&INPIT