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    • 2. 发明专利
    • Lithography apparatus and device manufacturing method
    • LITHOGRAPHY设备和设备制造方法
    • JP2006080535A
    • 2006-03-23
    • JP2005263564
    • 2005-09-12
    • Asml Netherlands Bvエイエスエムエル ネザランドズ ベスローテン フエンノートシャップ
    • VAN DER NET ANTONIUS JVAN EMPEL TJARKO ADRIAAN RUDOLDER HAM RONALD V
    • H01L21/027G03F7/20
    • G03F7/70933G03F7/70775G03F7/70883
    • PROBLEM TO BE SOLVED: To reduce the pollution of a certain apparatus component that can assure and improve the desired action of an interferometer positioning device.
      SOLUTION: This lithography apparatus is equipped with a support unit that supports a pattern setting device giving patterns to the cross-section of a radiation beam to form the radiation beam with a preset patterns; substrate table that holds a substrate; projection system that projects the radiation beam with the preset pattern to the target part of the substrate; internal space where an interferometer beam propagate; and a primary gas supply source that supplies purge gas to prevent the pollution of the projection system. The purge gas has a predetermined refraction index. This apparatus is also provided with a secondary gas supply source to supply gas for adjustment in the internal space for adjusting the internal space and a refractive index matching unit to match the refractive index of the gas for adjustment with the predetermined refractive index of the purge gas.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:为了减少可以确保和改善干涉仪定位装置的期望动作的特定装置部件的污染。 解决方案:该光刻设备配备有支撑单元,该支撑单元支撑图案设置装置,其给出辐射束横截面的图案以形成具有预设图案的辐射束; 保持基板的基板台; 投影系统,其将具有预设图案的辐射束投射到基板的目标部分; 干涉仪光束传播的内部空间; 以及提供净化气体以防止投影系统的污染的主要气体供应源。 净化气体具有预定折射率。 该装置还设置有二次气体供应源,用于在内部空间中供应用于调节内部空间的气体和折射率匹配单元,以将用于调节的气体的折射率与净化气体的预定折射率相匹配 。 版权所有(C)2006,JPO&NCIPI
    • 5. 发明专利
    • Lithographic apparatus and device manufacturing method
    • LITHOGRAPHIC装置和装置制造方法
    • JP2009141357A
    • 2009-06-25
    • JP2008307832
    • 2008-12-02
    • Asml Netherlands Bvエーエスエムエル ネザーランズ ビー.ブイ.
    • KATE NICOLAAS TENVENEMA WILLEM JURRIANUSDER HAM RONALD V
    • H01L21/027G03F7/20
    • G03F7/70341
    • PROBLEM TO BE SOLVED: To remove unwanted droplets of an immersion fluid from a surface of a lithographic apparatus. SOLUTION: The immersion lithographic apparatus is provided which has an electrode set to remove unwanted droplets of an immersion fluid from a particular surface. Unwanted droplets of immersion fluid may form on a plurality of different surfaces of the immersion apparatus, such as on a liquid barrier member. If allowed to evaporate and/or dry, those droplets may cause a problem such as uncontrolled heat loading of the apparatus and/or staining of the surface. An electrode set is provided on a surface where the droplets are likely to be formed. A controlled voltage is applied to the electrodes within the electrode set to electrostatically remove the droplets from the surface. COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:从光刻设备的表面去除浸没流体的不想要的液滴。 解决方案:提供浸没式光刻设备,其具有设置成从特定表面去除浸没流体的不想要的液滴的电极。 浸没液体的不希望的液滴可以形成在浸没设备的多个不同表面上,例如在液体屏障构件上。 如果允许蒸发和/或干燥,则这些液滴可能引起诸如装置的不受控制的热负荷和/或表面污染等问题。 在可能形成液滴的表面上设置电极组。 将受控电压施加到电极组中的电极,以从表面静电除去液滴。 版权所有(C)2009,JPO&INPIT