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    • 6. 发明申请
    • PARALLEL SINGLE SUBSTRATE PROCESSING SYSTEM
    • 平行单基板加工系统
    • US20120308345A1
    • 2012-12-06
    • US13488090
    • 2012-06-04
    • Arthur KeiglerFreeman FisherDaniel L. Goodman
    • Arthur KeiglerFreeman FisherDaniel L. Goodman
    • B65G49/00
    • H01L21/67757H01L21/67028H01L21/67034H01L21/67051H01L21/67057H01L21/67173H01L21/6776H01L21/67781H01L21/68H01L21/68707
    • A system for processing surfaces of substrates having a process module having a process module frame and a plurality of process elements to process the substrate surfaces without contacting the substrate surfaces. A plurality of substrate holder assemblies, each having a number of substrate holders, each of which is removably coupled to the process module frame, each substrate holder configured to hold a substrate. The process module frame has alignment features aligning the substrate holders in the substrate holder assembly in repeatable alignment with respect to each of the process elements with each of the process elements located between the substrates. A loader module is configured to unload processed substrates from each of the substrate holder assemblies and load unprocessed substrates to each of the substrate holder assemblies. A transporter is configured to transport the substrate holder assemblies to and from the process module and the loader module.
    • 一种用于处理具有处理模块的基板的表面的系统,该处理模块具有处理模块框架和多个处理元件,以在不接触基板表面的情况下处理基板表面。 多个衬底保持器组件,每个衬底保持器组件具有多个衬底保持器,每个衬底保持器可移除地联接到过程模块框架,每个衬底保持器被构造成保持衬底。 过程模块框架具有对准特征,其中衬底保持器组件中的衬底保持器相对于每个工艺元件可重复地对准,每个工艺元件位于衬底之间。 装载器模块被配置为从每个基板保持器组件卸载经处理的基板,并且将未处理的基板装载到每个基板保持器组件。 传送器构造成将基板保持器组件传送到过程模块和加载器模块。
    • 7. 发明授权
    • Parallel single substrate processing system
    • 平行单基板加工系统
    • US09449862B2
    • 2016-09-20
    • US13488090
    • 2012-06-04
    • Arthur KeiglerFreeman FisherDaniel L. Goodman
    • Arthur KeiglerFreeman FisherDaniel L. Goodman
    • H01L21/67H01L21/677H01L21/68H01L21/687
    • H01L21/67757H01L21/67028H01L21/67034H01L21/67051H01L21/67057H01L21/67173H01L21/6776H01L21/67781H01L21/68H01L21/68707
    • A system for processing surfaces of substrates having a process module having a process module frame and a plurality of process elements to process the substrate surfaces without contacting the substrate surfaces. A plurality of substrate holder assemblies, each having a number of substrate holders, each of which is removably coupled to the process module frame, each substrate holder configured to hold a substrate. The process module frame has alignment features aligning the substrate holders in the substrate holder assembly in repeatable alignment with respect to each of the process elements with each of the process elements located between the substrates. A loader module is configured to unload processed substrates from each of the substrate holder assemblies and load unprocessed substrates to each of the substrate holder assemblies. A transporter is configured to transport the substrate holder assemblies to and from the process module and the loader module.
    • 一种用于处理具有处理模块的基板的表面的系统,该处理模块具有处理模块框架和多个处理元件,以在不接触基板表面的情况下处理基板表面。 多个衬底保持器组件,每个衬底保持器组件具有多个衬底保持器,每个衬底保持器可移除地联接到过程模块框架,每个衬底保持器被构造成保持衬底。 过程模块框架具有对准特征,其中衬底保持器组件中的衬底保持器相对于每个工艺元件可重复地对准,每个工艺元件位于衬底之间。 装载器模块被配置为从每个基板保持器组件卸载经处理的基板,并且将未处理的基板装载到每个基板保持器组件。 传送器构造成将基板保持器组件传送到过程模块和加载器模块。
    • 8. 发明申请
    • PARALLEL SINGLE SUBSTRATE PROCESSING SYSTEM
    • 平行单基板加工系统
    • US20120306137A1
    • 2012-12-06
    • US13488343
    • 2012-06-04
    • Arthur KeiglerFreeman FisherDaniel L. GoodmanJonathan Haynes
    • Arthur KeiglerFreeman FisherDaniel L. GoodmanJonathan Haynes
    • B23Q1/25
    • H01L21/67757H01L21/67028H01L21/67034H01L21/67051H01L21/67057H01L21/67173H01L21/6776H01L21/67781H01L21/68H01L21/68707
    • A system for fluid processing substrate surfaces arrayed in a fluid having a process section with a frame having a plurality of process elements to process the substrate surfaces without contacting the substrate surfaces. A substrate holder assembly having a holder frame and a number of substrate holders, each of which is coupled to the holder frame and is configured for holding a substrate so that each substrate holder holds a different substrate for transport as a unit with the substrate holder assembly to and from the process section. The substrate holder assembly and each substrate holder are removably coupled to the process section frame, and the substrate holders of the substrate holder assembly are movable relative to the holder frame and positionable in repeatable alignment with respect to a predetermined feature of the process section and independent of positioning of the holder frame with respect to the process section.
    • 一种用于流体处理衬底表面的系统,其布置在具有工艺部分的流体中,所述工艺部分具有框架,所述框架具有多个处理元件,以处理所述衬底表面而不接触所述衬底表面。 一种衬底保持器组件,其具有保持器框架和多个衬底保持器,每个衬底保持器联接到保持器框架并且构造成用于保持衬底,使得每个衬底保持器保持不同的衬底以作为与衬底保持器组件 往返于过程部分。 衬底保持器组件和每个衬底保持器可移除地联接到处理部分框架,并且衬底保持器组件的衬底保持器相对于保持器框架可移动并且可相对于工艺段的预定特征可重复地对准并且独立地 保持框架相对于处理部分的定位。
    • 10. 发明授权
    • System for selective electron beam irradiation
    • US6110318A
    • 2000-08-29
    • US979271
    • 1997-11-26
    • Daniel L. Goodman
    • Daniel L. Goodman
    • B29C35/08B29C65/00B29C65/14B32B31/28B29C71/04
    • B29C65/14B29C35/08B29C65/1403B29C65/1435B29C65/1454B29C65/1483B29C65/4845B29C66/545B29C66/93431B29C66/93441B29C2035/0877B29C66/863B29C66/929B29C66/939B29C66/94H01J2237/20228H01J2237/31
    • Provided is the ability to selectively irradiate a designated irradiation target portion of a target material with a beam of electrons. Target material is moved at a substantially constant velocity in one direction along a path that is intersected by an electron beam. The electron beam is translated in a direction transverse to the direction of the target material movement to intersect the designated portion of the target. This enables the designated target portion, e.g., a target irradiation path, to be followed by the electron beam as the target material moves past the beam. Also provided is control of electron beam dose delivered to the designated irradiation target portion. Here, as a target material is moved along the path, the electron beam is also scanned in a direction parallel with the direction of target material movement to control the electron beam dwell time at points along the designated irradiation target portion, to deliver a specified electron beam dose to points along the designated portion of the target material. This scanning can control the electron beam dwell time to deliver a substantially uniform electron beam dose or to deliver an electron beam dose that falls within a specified range of allowable electron beam doses. Also provided is the ability to control the electron beam in response to feedback signals. Here the actual position of the electron beam intersection with the target is detected, and the electron beam translation is adjusted in response to the detected intersection position to maintain intersection of the electron beam with the designated portion of the target material. Additionally, the electron beam scanning can be adjusted in response to the detected intersection position to maintain delivery of the specified electron beam dose to the designated target portion. Preferably, sensors are positioned in a spaced relationship with the designated target portion, e.g., on the target material, in a configuration that defines the designated portion as a path between the sensors.