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    • 8. 发明授权
    • Nonlinearity detection using fault-generated second harmonic
    • 使用故障生成二次谐波的非线性检测
    • US4496900A
    • 1985-01-29
    • US373318
    • 1982-04-30
    • Thomas H. Di StefanoArnold Halperin
    • Thomas H. Di StefanoArnold Halperin
    • G01R31/02G01N27/20G01R31/28G01N27/00
    • G01N27/20G01R31/281Y10T29/49004
    • The tester and method for nondestructively detecting nonlinearity faults in conductors includes the application of a composite AC and DC drive signal to the device under test in such manner that nonlinearities in the device under test produce fault signals including second harmonics, due to local changes of resistance caused by ohmic heating. Electronic filters are used to select out and amplify the second harmonic only, eliminating the direct current and fundamental frequency components of the initial test pulse, plus third and subsequent harmonics. The filtered second harmonic signals from the device under test are then phase-compared to a phase-shifted second harmonic signal produced by a frequency doubler from the test signal generator oscillator to cancel out the second harmonic signals from the good conductor; the remaining phase anomaly signals control a threshold detector remaining to provide fault indication.
    • 用于非破坏性地检测导体中非线性故障的测试器和方法包括将复合AC和DC驱动信号施加到被测器件,使得被测器件中的非线性由于电阻的局部变化而产生包括二次谐波的故障信号 由欧姆加热引起。 电子滤波器仅用于选择和放大二次谐波,消除初始测试脉冲的直流和基频分量,以及第三次和随后的谐波。 然后将来自被测器件的滤波后的二次谐波信号与来自测试信号发生器振荡器的倍频器产生的相移二次谐波信号进行相位比较,以抵消来自良导体的二次谐波信号; 剩余相位异常信号控制剩余的阈值检测器以提供故障指示。
    • 9. 发明授权
    • Method and apparatus for locating power plane shorts using polarized
light microscopy
    • 使用偏光显微镜定位电源平面短路的方法和装置
    • US6141093A
    • 2000-10-31
    • US139515
    • 1998-08-25
    • Bernell E. ArgyleArnold HalperinMichael E. ScamanEdward J. Yarmchuk
    • Bernell E. ArgyleArnold HalperinMichael E. ScamanEdward J. Yarmchuk
    • G01N21/21G01R31/311G01N21/00G01R27/14
    • G01N21/21G01R31/311
    • An apparatus and corresponding method for detecting, locating, or defining a short in a thin-film module. The apparatus includes a mechanical fixture supporting the module. A current source provides a current pulse to the module which produces a magnetic field and heating nearby the short which turns on and off as the pulsed current in the short turns on and off. Polarized light is directed onto the module, with an intermediate element disposed between the module and the source of the polarized light. The intermediate element may be a stress birefringent coating (e.g., a polyimide insulating layer) disposed on the module and onto which the polarized light is directed. The sample is rotated 0 to 45 degrees to maximize the birefringent effect. Alternatively, the intermediate element may be a magneto-optical Faraday rotator. A microscope is used to observe the module, facilitating identification of a short by the twisting of the polarization of the light as the short expands and shrinks in response to the heating or in response to the localized magnetic field. The preferred rotator is a composite having a garnet substrate, an iron garnet film disposed on the substrate, and a thin aluminum mirror layer disposed on the iron garnet film. The apparatus and method of the present invention have several applications.
    • 一种用于检测,定位或限定薄膜模块中的短路的装置和相应方法。 该装置包括支撑模块的机械夹具。 电流源向模块提供电流脉冲,其产生磁场并在短路附近加热,其短路中的脉冲电流接通和断开时导通和截止。 偏振光被引导到模块上,中间元件设置在模块和偏振光源之间。 中间元件可以是设置在模块上并且偏振光被引导到其上的应力双折射涂层(例如,聚酰亚胺绝缘层)。 样品旋转0至45度以最大化双折射效应。 或者,中间元件可以是磁光法拉第旋转器。 使用显微镜来观察模块,通过随着短路的扩展和响应于加热或响应于局部磁场而收缩,通过扭转光的偏振来促进短路的识别。 优选的旋转体是具有石榴石基材,设置在基材上的铁石榴石薄膜和设置在铁石榴石薄膜上的薄铝镜面层的复合体。 本发明的装置和方法有几个应用。