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    • 4. 发明申请
    • Interferometric lithography system and method used to generate equal path lengths of interfering beams
    • 用于产生相等路径长度的干涉光束的干涉光刻系统和方法
    • US20070153250A1
    • 2007-07-05
    • US11320473
    • 2005-12-29
    • Harry SewellJohannes Jacobus Baselmans
    • Harry SewellJohannes Jacobus Baselmans
    • G03B27/54
    • G03B27/54G03F7/70408
    • A system and method are provided for writing patterns onto substrates. First and second beams are directed to converge and substantially overlap in a common region on a substrate. This can be done so that the first and second beams are mutually temporally coherent and spatially coherent in the region of overlap to form interference fringes to define a writing image. A beam width of the first and second beams is adjusted. This can be done so that respective path lengths of the beams are matched when they reach the common region to ensure the first and second beams are mutually spatially coherent and temporally coherent across an entire width of the common region. In one example, the substrate is moved with respect to the writing image, while writing patterns onto the substrate. In another example, the substrate remains stationary.
    • 提供了将图案写入基板的系统和方法。 引导第一和第二光束在基板上的公共区域中会聚并基本重叠。 这可以进行,使得第一和第二波束在重叠区域中相互时空相干和空间相干以形成干涉条纹以限定写入图像。 调整第一和第二光束的光束宽度。 这可以进行,使得当它们到达公共区域时,波束的相应路径长度匹配,以确保第一和第二波束在公共区域的整个宽度上相互空间相干和时间相干。 在一个示例中,当将图案写入基板时,基板相对于写入图像移动。 在另一个实例中,衬底保持静止。