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1. 发明申请

US20050205778A1 Laser trim motion, calibration, imaging, and fixturing techniques 审中-公开
标题翻译：激光修剪运动，校准，成像和夹具技术
公开(公告)号：US20050205778A1
公开(公告)日：2005-09-22
申请号：US10967432
申请日：2004-10-18
申请人： Anton Kitai , Andreas Mank , Paul Labelle , Andrei Naumov , Ian Miller , Robert Parker
发明人： Anton Kitai , Andreas Mank , Paul Labelle , Andrei Naumov , Ian Miller , Robert Parker
IPC分类号： B23K26/00 , B23K26/03 , B23K26/08 , B23K26/36 , B23K26/38 , B23K26/40 , G21K7/00 , H05K1/02 , H05K3/00
CPC分类号： B23K26/032 , B23K26/042 , B23K26/082 , B23K26/0853 , B23K26/351 , B23K26/364 , B23K26/382 , B23K26/40 , B23K26/705 , B23K2101/42 , B23K2103/50 , H05K1/0269 , H05K3/0008 , H05K3/0026 , H05K3/0097 , H05K2201/09918
摘要： A system for probing circuit elements, includes a panel fixture, probe holder and stage. The fixture has a platen surface to support a work piece having work piece surface. The work piece surface is substantially parallel to the platen surface and has a target element thereon. The probe holder is configured to support a probe for detecting a characteristic of the target element. A stage rotates the probe holder about an axis substantially orthogonal to the platen surface, to align the probe with probe locations associated with the circuit element, so that the characteristic of the circuit element can detected by the probe. Fixturing motion can be optimized for efficient work piece manufacturing. Calibration and vision subassemblies are also provided.
摘要翻译：一种用于探测电路元件的系统，包括面板固定装置，探头架和平台。夹具具有压板表面以支撑具有工件表面的工件。工件表面基本上平行于压板表面并且在其上具有目标元件。探针支架构造成支撑用于检测目标元件的特性的探针。舞台围绕基本上与压板表面正交的轴旋转探针架，以将探头与与电路元件相关联的探针位置对准，使得电路元件的特性可以由探头检测。可以优化夹具运动以实现高效的工件制造。还提供校准和视觉组件。

2. 发明授权

US06875950B2 Automated laser trimming of resistors 有权
标题翻译：电路元件的漂移敏感激光微调
公开(公告)号：US06875950B2
公开(公告)日：2005-04-05
申请号：US10103317
申请日：2002-03-22
申请人： Andrei Naumov , Anton Kitai , Ian Miller
发明人： Andrei Naumov , Anton Kitai , Ian Miller
IPC分类号： B23K26/00 , H01C17/242 , H05K1/16 , B23H26/38
CPC分类号： H01C17/242 , B23K26/351 , H05K1/16
摘要： In the laser trimming of passive circuit elements such as resistors, capacitors and inductors, various trimming parameters must be selected. To select a element is compared with a target value for the parameter to determine an offset value between the measured parameter value and the target value. The relevant trim parameters are then selected based on the determined offset values.
摘要翻译：在诸如电阻器，电容器和电感器的无源电路元件的激光微调中，必须选择各种修整参数。将选择元素与参数的目标值进行比较，以确定测量的参数值和目标值之间的偏移值。然后根据确定的偏移值选择相关的修剪参数。

3. 发明申请

US20050062583A1 Drift-sensitive laser trimming of circuit elements 审中-公开
标题翻译：电路元件的漂移敏感激光微调
公开(公告)号：US20050062583A1
公开(公告)日：2005-03-24
申请号：US10984160
申请日：2004-11-09
申请人： Andrei Naumov , Anton Kitai , Ian Miller
发明人： Andrei Naumov , Anton Kitai , Ian Miller
IPC分类号： B23K26/00 , H01C17/242 , H05K1/16 , H01C10/00
CPC分类号： H01C17/242 , B23K26/351 , H05K1/16
摘要： In the laser trimming of passive circuit elements such as resistors, capacitors and inductors, various trimming parameters must be selected. To select a parameter, such as a cut type or speed, a value of a parameter, such as the resistance or impedance of a resistor, of each of a plurality of elements is measured. The measured parameter value of each element is compared with a target value for the parameter to determine an offset value between the measured parameter value and the target value. The relevant trim parameters are then selected based on the determined offset values.
摘要翻译：在诸如电阻器，电容器和电感器的无源电路元件的激光微调中，必须选择各种修整参数。为了选择诸如切割类型或速度的参数，测量多个元素中的每一个的诸如电阻器的电阻或阻抗的参数的值。将每个元素的测量参数值与参数的目标值进行比较，以确定测量的参数值和目标值之间的偏移值。然后根据确定的偏移值选择相关的修剪参数。

4. 发明申请

US20050161444A1 Flexible scan field 有权
标题翻译：灵活的扫描场
公开(公告)号：US20050161444A1
公开(公告)日：2005-07-28
申请号：US10967895
申请日：2004-10-18
申请人： Anton Kitai , Jonathan Ehrmann
发明人： Anton Kitai , Jonathan Ehrmann
IPC分类号： B23K20060101 , B23K26/00 , B23K26/06 , B23K26/08 , H01C17/242 , H01G13/00
CPC分类号： B23K26/0665 , B23K26/064 , B23K26/0648 , B23K26/082 , B23K26/351 , H01C17/242 , H01G13/00
摘要： An energy beam machining system includes an emitter for emitting an energy beam and beam adjusting optics, such as a zoom telescope, for adjusting the pupil size of the system to multiple values. The adjusting of the pupil size can be carried out automatically, semi-automatically, or manually. In manual modes, instructions can be presented to the operator (e.g., via a monitor or pre-programmed audio instruction) indicating how to adjust pupil size. A focus lens focuses the adjusted beam directed along each path at a different focal point within a scan field encompassed in the field of view of the focus lens. Beam directing optics are configured to enable multiple scan fields within the field of view of the focus lens.
摘要翻译：能量束加工系统包括用于发射能量束的发射器和诸如变焦望远镜的光束调节光学器件，用于将系统的光瞳尺寸调整为多个值。瞳孔大小的调整可以自动，半自动或手动进行。在手动模式中，可以向操作者（例如，经由监视器或预编程的音频指令）呈现指示如何调整瞳孔大小的指令。聚焦透镜将在每个路径上被调整的光束聚焦在包围在聚焦透镜的视场内的扫描场内的不同焦点处。光束引导光学器件被配置为使得能够在聚焦透镜的视场内的多个扫描场。

5. 发明授权

US07402774B2 Flexible scan field 有权
标题翻译：灵活的扫描场
公开(公告)号：US07402774B2
公开(公告)日：2008-07-22
申请号：US11695721
申请日：2007-04-03
申请人： Anton Kitai , Jonathan S Ehrmann
发明人： Anton Kitai , Jonathan S Ehrmann
IPC分类号： B23K26/06
CPC分类号： B23K26/0665 , B23K26/064 , B23K26/0648 , B23K26/082 , B23K26/351 , H01C17/242 , H01G13/00
摘要： An energy beam machining system includes an emitter for emitting an energy beam and beam adjusting optics, such as a zoom telescope, for adjusting the pupil size of the system to multiple values. The adjusting of the pupil size can be carried out automatically, semi-automatically, or manually. In manual modes, instructions can be presented to the operator (e.g., via a monitor or pre-programmed audio instruction) indicating how to adjust pupil size. A focus lens focuses the adjusted beam directed along each path at a different focal point within a scan field encompassed in the field of view of the focus lens. Beam directing optics are configured to enable multiple scan fields within the field of view of the focus lens.
摘要翻译：能量束加工系统包括用于发射能量束的发射器和诸如变焦望远镜的光束调节光学器件，用于将系统的光瞳尺寸调整为多个值。瞳孔大小的调整可以自动，半自动或手动进行。在手动模式中，可以向操作者（例如，经由监视器或预编程的音频指令）呈现指示如何调整瞳孔大小的指令。聚焦透镜将在每个路径上被调整的光束聚焦在包围在聚焦透镜的视场内的扫描场内的不同焦点处。光束引导光学器件被配置为使得能够在聚焦透镜的视场内的多个扫描场。

6. 发明申请

US20070205186A1 FLEXIBLE SCAN FIELD 审中-公开
标题翻译：灵活扫描场
公开(公告)号：US20070205186A1
公开(公告)日：2007-09-06
申请号：US11736638
申请日：2007-04-18
申请人： Anton Kitai , Jonathan Ehrmann
发明人： Anton Kitai , Jonathan Ehrmann
IPC分类号： B23K26/04
CPC分类号： B23K26/0665 , B23K26/064 , B23K26/0648 , B23K26/082 , B23K26/351 , H01C17/242 , H01G13/00
摘要： An energy beam machining system includes an emitter for emitting an energy beam and beam adjusting optics, such as a zoom telescope, for adjusting the pupil size of the system to multiple values. The adjusting of the pupil size can be carried out automatically, semi-automatically, or manually. In manual modes, instructions can be presented to the operator (e.g., via a monitor or pre-programmed audio instruction) indicating how to adjust pupil size. A focus lens focuses the adjusted beam directed along each path at a different focal point within a scan field encompassed in the field of view of the focus lens. Beam directing optics are configured to enable multiple scan fields within the field of view of the focus lens.
摘要翻译：能量束加工系统包括用于发射能量束的发射器和诸如变焦望远镜的光束调节光学器件，用于将系统的光瞳尺寸调整为多个值。瞳孔大小的调整可以自动，半自动或手动进行。在手动模式中，可以向操作者（例如，经由监视器或预编程的音频指令）呈现指示如何调整瞳孔大小的指令。聚焦透镜将在每个路径上被调整的光束聚焦在包围在聚焦透镜的视场内的扫描场内的不同焦点处。光束引导光学器件被配置为使得能够在聚焦透镜的视场内的多个扫描场。

7. 发明申请

US20070181546A1 FLEXIBLE SCAN FIELD 有权
公开(公告)号：US20070181546A1
公开(公告)日：2007-08-09
申请号：US11695721
申请日：2007-04-03
申请人： Anton Kitai , Jonathan Ehrmann
发明人： Anton Kitai , Jonathan Ehrmann
IPC分类号： B23K26/04 , B23K26/02
CPC分类号： B23K26/0665 , B23K26/064 , B23K26/0648 , B23K26/082 , B23K26/351 , H01C17/242 , H01G13/00
摘要： An energy beam machining system includes an emitter for emitting an energy beam and beam adjusting optics, such as a zoom telescope, for adjusting the pupil size of the system to multiple values. The adjusting of the pupil size can be carried out automatically, semi-automatically, or manually. In manual modes, instructions can be presented to the operator (e.g., via a monitor or pre-programmed audio instruction) indicating how to adjust pupil size. A focus lens focuses the adjusted beam directed along each path at a different focal point within a scan field encompassed in the field of view of the focus lens. Beam directing optics are configured to enable multiple scan fields within the field of view of the focus lens.

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