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    • 1. 发明申请
    • Method for Manufacturing Multiple Layers of Waveguides
    • 制造多层波导的方法
    • US20100025364A1
    • 2010-02-04
    • US12517692
    • 2008-08-29
    • Andrew T.S. PomereneTimothy J. ConwayCraig M. HillMark Jaso
    • Andrew T.S. PomereneTimothy J. ConwayCraig M. HillMark Jaso
    • B29D11/00
    • G02B6/12002B82Y20/00G02B6/1223G02B6/132G02B6/136
    • A method for manufacturing multiple layers of waveguides is disclosed. Initially, a first cladding layer is deposited on a substrate, a first inner cladding layer is then deposited on the first cladding layer, and a first waveguide material is deposited on the first inner cladding layer. The first inner cladding layer and the first waveguide material are then selectively etched to form a first waveguide layer. Next, a second inner cladding layer followed by a second cladding layer are deposited on the first waveguide layer. The second inner cladding layer and the second cladding layer are removed by using a chemical-mechanical polishing process selective to the first waveguide material. A third inner cladding layer followed by a second waveguide material are deposited on the first waveguide material. The third inner cladding layer and the second waveguide material are then selectively etched to form a second waveguide layer. Finally, a fourth inner cladding layer followed by a third cladding layer are deposited on the second waveguide layer.
    • 公开了制造多层波导的方法。 首先,在基板上沉积第一包层,然后在第一包层上沉积第一内包层,在第一内包层上沉积第一波导材料。 然后选择性地蚀刻第一内包层和第一波导材料以形成第一波导层。 接下来,在第一波导层上沉积第二内包层和第二覆层。 通过使用对第一波导材料选择性的化学机械抛光工艺来除去第二内包层和第二包覆层。 在第一波导材料上沉积第三内包层和第二波导材料。 然后选择性地蚀刻第三内包层和第二波导材料以形成第二波导层。 最后,在第二波导层上沉积第四内包层和第三覆层。
    • 4. 发明授权
    • Method for manufacturing multiple layers of waveguides
    • 制造多层波导的方法
    • US08192638B2
    • 2012-06-05
    • US12517692
    • 2008-08-29
    • Andrew T. S. PomereneTimothy J. ConwayCraig M. HillMark Jaso
    • Andrew T. S. PomereneTimothy J. ConwayCraig M. HillMark Jaso
    • B29D11/00G02B6/10G02F1/00
    • G02B6/12002B82Y20/00G02B6/1223G02B6/132G02B6/136
    • A method for manufacturing multiple layers of waveguides is disclosed. Initially, a first cladding layer is deposited on a substrate, a first inner cladding layer is then deposited on the first cladding layer, and a first waveguide material is deposited on the first inner cladding layer. The first inner cladding layer and the first waveguide material are then selectively etched to form a first waveguide layer. Next, a second inner cladding layer followed by a second cladding layer are deposited on the first waveguide layer. The second inner cladding layer and the second cladding layer are removed by using a chemical-mechanical polishing process selective to the first waveguide material. A third inner cladding layer followed by a second waveguide material are deposited on the first waveguide material. The third inner cladding layer and the second waveguide material are then selectively etched to form a second waveguide layer. Finally, a fourth inner cladding layer followed by a third cladding layer are deposited on the second waveguide layer.
    • 公开了制造多层波导的方法。 首先,在基板上沉积第一包层,然后在第一包层上沉积第一内包层,在第一内包层上沉积第一波导材料。 然后选择性地蚀刻第一内包层和第一波导材料以形成第一波导层。 接下来,在第一波导层上沉积第二内包层和第二覆层。 通过使用对第一波导材料选择性的化学机械抛光工艺来除去第二内包层和第二包覆层。 在第一波导材料上沉积第三内包层和第二波导材料。 然后选择性地蚀刻第三内包层和第二波导材料以形成第二波导层。 最后,在第二波导层上沉积第四内包层和第三覆层。
    • 6. 发明申请
    • Method for Fabricating Butt-Coupled Electro-Absorptive Modulators
    • 制造对接耦合电吸收调制器的方法
    • US20100330727A1
    • 2010-12-30
    • US12523801
    • 2008-08-29
    • Craig M. HillAndrew T.S. Pomerene
    • Craig M. HillAndrew T.S. Pomerene
    • H01L31/0232H01L31/18
    • G02F1/025
    • A method for fabricating butt-coupled electro-absorptive modulators is disclosed. A butt-coupled electro-absorptive modulator with minimal dislocations in the electro-absorptive material is produced by adding a dielectric spacer for lining the coupling region before epitaxially growing the SiGe or other electro-absorptive material. It has been determined that during the SiGe growth, the current process has exposed single crystal silicon at the bottom of the hole and exposed amorphous silicon on the sides. SiGe growth on the amorphous silicon is expected to have more dislocations than single crystal silicon. There should also be dislocations or fissures where the SiGe growth from the each nucleation source finally join. Thus, a dielectric sidewall can protect an exposed waveguide face from any etching from an aggressive surface preparation prior to epi growth.
    • 公开了一种制造对接耦合的电吸收调制器的方法。 通过在外延生长SiGe或其他电吸收材料之前添加用于衬垫耦合区域的电介质间隔物来产生电吸收材料中具有最小位错的对接耦合电吸收调制器。 已经确定,在SiGe生长期间,目前的工艺已经在孔的底部露出单晶硅并在侧面露出非晶硅。 SiGe在非晶硅上的生长预期具有比单晶硅更多的位错。 也应该存在来自每个成核源的SiGe生长最终加入的位错或裂缝。 因此,电介质侧壁可以在外延生长之前保护暴露的波导面不受腐蚀性表面处理的任何蚀刻。
    • 9. 发明授权
    • Method of integrating slotted waveguide into CMOS process
    • 将开槽波导集成到CMOS工艺中的方法
    • US08513037B2
    • 2013-08-20
    • US13580872
    • 2011-12-02
    • Andrew T S PomereneCraig M. HillTimothy J. ConwayStewart L. Ocheltree
    • Andrew T S PomereneCraig M. HillTimothy J. ConwayStewart L. Ocheltree
    • H01P1/15
    • H01L27/13H01L21/84H01L27/1463H01L27/14683
    • A method for integrating a slotted waveguide into a CMOS process is disclosed. A slot can be patterned on a SOI wafer by etching a first pad hard mask deposited over the wafer. The slot is then filled with a nitride plug material by depositing a second pad hard mask over the first pad hard mask. A waveguide in association with one or more electronic and photonic devices can also be patterned on the SOI wafer. The trenches can be filled with an isolation material and then polished. Thereafter, the first and second pad hard masks can be stripped from the wafer. The slot can once again be filled with the nitride plug material and patterned. After forming one or more electronic and photonic devices on the wafer using a standard CMOS process, a via can be opened down to the nitride plug and the nitride plug can then be removed.
    • 公开了一种将时隙波导集成到CMOS工艺中的方法。 通过蚀刻沉积在晶片上的第一焊盘硬掩模,可以在SOI晶片上图案化槽。 然后通过在第一焊盘硬掩模上沉积第二焊盘硬掩模,然后用氮化物塞材料填充槽。 与一个或多个电子和光子器件相关联的波导也可以在SOI晶片上图案化。 沟槽可以用隔离材料填充,然后抛光。 此后,可以从晶片剥离第一和第二焊盘硬掩模。 该槽可再次填充氮化物塞材料并图案化。 在使用标准CMOS工艺在晶片上形成一个或多个电子和光子器件之后,可以将通孔向下打开到氮化物塞,然后可以去除氮化物塞。