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    • 8. 发明授权
    • One time programmable fuse/anti-fuse combination based memory cell
    • 一次可编程保险丝/反熔丝组合的存储单元
    • US06580144B2
    • 2003-06-17
    • US09964768
    • 2001-09-28
    • Thomas C. Anthony
    • Thomas C. Anthony
    • H01L2900
    • H01L27/101G11C17/16H01L23/5252H01L23/5256H01L2924/0002H01L2924/00
    • A one-time programmable memory cell includes a fuse and an anti-fuse in series. The memory cell has two states, an initial state and a written (programmed) state. In the initial state, a resistance of the cell is finite, typically dominated by the relatively high resistance of the anti-fuse. In the written state, the resistance is infinite because the breakdown of the fuse resulting in an open circuit. The cell may be programmed by applying a critical voltage across the cell generating a critical current to cause the fuse to become open. When critical voltage is applied, this generally causes the anti-fuse to break down, which in turn causes a pulse of high current to be applied to the fuse. The states are detected by applying a read voltage across the memory cell. If the memory has not been programmed, then a measurable amount flows. Otherwise, no current flows.
    • 一次性可编程存储单元包括一个保险丝和一个串联的反熔丝。 存储单元具有两个状态,初始状态和写入(编程)状态。 在初始状态下,电池的电阻是有限的,通常由抗熔丝的较高电阻来支配。 在写入状态下,电阻是无限大的,因为熔断器导致开路。 可以通过在电池周围施加临界电压来生成电池来编程,以产生临界电流以使熔丝变得开放。 当施加临界电压时,这通常导致反熔丝断裂,这又导致将高电流脉冲施加到保险丝。 通过在存储器单元上施加读取电压来检测状态。 如果存储器尚未编程,则可测量的数量流过。 否则,没有电流流动。