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    • 7. 发明授权
    • Transition delay test function logic
    • 转换延迟测试功能逻辑
    • US08356221B2
    • 2013-01-15
    • US12861991
    • 2010-08-24
    • Mark T. KuoMichael HowardDaniel C. Murray
    • Mark T. KuoMichael HowardDaniel C. Murray
    • G01R31/28
    • G01R31/31858G01R31/318544G11C29/32
    • A method and apparatus for conducting transition testing using scan elements are disclosed. In one embodiment, an integrated circuit (IC) includes a scan chain having first and second subsets of scannable flops, the first subset having respective data inputs coupled to a memory array. The scannable flops of the second subset may each have a respective data input coupled to circuitry other than the memory array (e.g., to a logic circuit). The scannable flops of the first subset may be enabled for scan shifting during a transition test mode. The scannable flops of the second subset are inhibited from scanning during the transition test mode. The transition test mode may include at least two functional clock cycles in which the scannable flops of the first subset provide complementary first and second logic values to logic circuits coupled to respective data outputs.
    • 公开了一种使用扫描元件进行转换测试的方法和装置。 在一个实施例中,集成电路(IC)包括具有可扫描触发器的第一和第二子集的扫描链,第一子集具有耦合到存储器阵列的相应数据输入。 第二子集的可扫描触发器可以各自具有耦合到除了​​存储器阵列之外的电路(例如,到逻辑电路)的相应数据输入。 在转换测试模式期间,可以启用第一子集的可扫描的触发器用于扫描移位。 在转换测试模式期间禁止第二子集的可扫描触发器扫描。 转换测试模式可以包括至少两个功能时钟周期,其中第一子集的可扫描触发器为耦合到相应数据输出的逻辑电路提供互补的第一和第二逻辑值。
    • 9. 发明申请
    • Efficient Encoding for Detecting Load Dependency on Store with Misalignment
    • 高效编码,用于检测负载依赖关系,存储不对齐
    • US20100169619A1
    • 2010-07-01
    • US12721164
    • 2010-03-10
    • Tse-yu YehDaniel C. MurrayPo Yung ChangAnup S. Mehta
    • Tse-yu YehDaniel C. MurrayPo Yung ChangAnup S. Mehta
    • G06F9/305G06F12/08G06F12/00G06F9/00
    • G06F12/0607
    • In one embodiment, an apparatus comprises a queue comprising a plurality of entries and a control unit coupled to the queue. The control unit is configured to allocate a first queue entry to a store memory operation, and is configured to write a first even offset, a first even mask, a first odd offset, and a first odd mask corresponding to the store memory operation to the first entry. A group of contiguous memory locations are logically divided into alternately-addressed even and odd byte ranges. A given store memory operation writes at most one even byte range and one adjacent odd byte range. The first even offset identifies a first even byte range that is potentially written by the store memory operation, and the first odd offset identifies a first odd byte range that is potentially written by the store memory operation. The first even mask identifies bytes within the first even byte range that are written by the store memory operation, and wherein the first odd mask identifies bytes within the first odd byte range that are written by the store memory operation.
    • 在一个实施例中,装置包括包括多个条目的队列和耦合到队列的控制单元。 控制单元被配置为将第一队列条目分配给存储存储器操作,并且被配置为将对应于存储存储器操作的第一偶数偏移,第一偶数掩码,第一奇数偏移和第一奇数掩码写入到 第一次入场 一组连续的存储器位置在逻辑上被划分为交替寻址的偶数和奇数字节范围。 给定的存储器操作写入至多一个偶数字节范围和一个相邻的奇数字节范围。 第一偶数偏移识别由存储器存储器操作潜在地写入的第一偶数字节范围,并且第一奇数偏移识别潜在地由存储器存储器操作写入的第一奇数字节范围。 第一偶数掩模识别由存储器存储器操作写入的第一偶数字节范围内的字节,并且其中第一奇数掩码标识由存储器存储器操作写入的第一奇数字节范围内的字节。
    • 10. 发明授权
    • Efficient encoding for detecting load dependency on store with misalignment
    • 高效编码,用于检测不对齐存储的负载依赖性
    • US07721066B2
    • 2010-05-18
    • US11758193
    • 2007-06-05
    • Tse-yu YehDaniel C. MurrayPo-Yung ChangAnup S. Mehta
    • Tse-yu YehDaniel C. MurrayPo-Yung ChangAnup S. Mehta
    • G06F12/00
    • G06F12/0607
    • In one embodiment, an apparatus comprises a queue comprising a plurality of entries and a control unit coupled to the queue. The control unit is configured to allocate a first queue entry to a store memory operation, and is configured to write a first even offset, a first even mask, a first odd offset, and a first odd mask corresponding to the store memory operation to the first entry. A group of contiguous memory locations are logically divided into alternately-addressed even and odd byte ranges. A given store memory operation writes at most one even byte range and one adjacent odd byte range. The first even offset identifies a first even byte range that is potentially written by the store memory operation, and the first odd offset identifies a first odd byte range that is potentially written by the store memory operation. The first even mask identifies bytes within the first even byte range that are written by the store memory operation, and wherein the first odd mask identifies bytes within the first odd byte range that are written by the store memory operation.
    • 在一个实施例中,装置包括包括多个条目的队列和耦合到队列的控制单元。 控制单元被配置为将第一队列条目分配给存储存储器操作,并且被配置为将对应于存储存储器操作的第一偶数偏移,第一偶数掩码,第一奇数偏移和第一奇数掩码写入到 第一次入场 一组连续的存储器位置在逻辑上被划分为交替寻址的偶数和奇数字节范围。 给定的存储器操作写入至多一个偶数字节范围和一个相邻的奇数字节范围。 第一偶数偏移识别由存储器存储器操作潜在地写入的第一偶数字节范围,并且第一奇数偏移识别潜在地由存储器存储器操作写入的第一奇数字节范围。 第一偶数掩模识别由存储器存储器操作写入的第一偶数字节范围内的字节,并且其中第一奇数掩码标识由存储器存储器操作写入的第一奇数字节范围内的字节。