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    • 7. 发明授权
    • Front electrode for use in photovoltaic device and method of making same
    • 用于光伏器件的前电极及其制造方法
    • US08203073B2
    • 2012-06-19
    • US12068117
    • 2008-02-01
    • Yiwei LuWillem den BoerDavid LerinScott V. Thomsen
    • Yiwei LuWillem den BoerDavid LerinScott V. Thomsen
    • H01L31/00
    • H01L31/022425B32B17/10036B32B17/10229H01L31/02168H01L31/022466H01L31/022483Y02E10/50
    • This invention relates to a front electrode/contact for use in an electronic device such as a photovoltaic device. In certain example embodiments, the front electrode of a photovoltaic device or the like includes a multilayer coating including at least one transparent conductive oxide (TCO) layer (e.g., of or including a material such as tin oxide, ITO, zinc oxide, or the like) and/or at least one conductive substantially metallic IR reflecting layer (e.g., based on silver, gold, or the like). In certain example instances, the multilayer front electrode coating may include one or more conductive metal(s) oxide layer(s) and one or more conductive substantially metallic IR reflecting layer(s) in order to provide for reduced visible light reflection, increased conductivity, cheaper manufacturability, and/or increased infrared (IR) reflection capability. At least one of the surfaces of the front glass substrate may be textured in certain example embodiments of this invention.
    • 本发明涉及用于诸如光伏器件的电子设备中的前电极/触点。 在某些示例性实施例中,光伏器件等的前电极包括多层涂层,其包括至少一个透明导电氧化物(TCO)层(例如,由氧化锡,ITO,氧化锌或 类似)和/或至少一个导电的基本上金属的IR反射层(例如,基于银,金等)。 在某些示例中,多层前电极涂层可以包括一个或多个导电金属氧化物层和一个或多个导电的基本上金属的IR反射层,以便提供减少的可见光反射,增加的电导率 ,更便宜的可制造性和/或增加的红外(IR)反射能力。 在本发明的某些示例性实施例中,前玻璃基板的至少一个表面可以纹理化。
    • 8. 发明授权
    • Method of making a large area imager with UV Blocking layer, and
corresponding imager
    • 制作大面积成像仪的UV阻挡层的方法,以及相应的成像仪
    • US5994157A
    • 1999-11-30
    • US10639
    • 1998-01-22
    • Steven AggasWillem den BoerYiwei LuScott V. Thomsen
    • Steven AggasWillem den BoerYiwei LuScott V. Thomsen
    • H01L27/146H01L21/00
    • H01L27/14603H01L27/14658
    • This invention is related to a radiation imager (e.g. X-ray imager) including a thin film transistor (TFT) array, and method of making same. A photo-imageable insulating material having a low dielectric constant is provided in areas of overlap between electrodes and underlying TFTs, diodes, and/or address lines in order to improve the signal-to-noise ratio of the imager. The photo-imageable insulating layer acts as a negative resist in certain embodiments, so that vias are formed therein by exposing portions of the insulating layer with UV light which are to remain on the substrate, removing non-exposed areas of the insulating layer so as to form the vias or apertures in the insulating layer. In order to prevent non-uniformities from inadvertently being imaged into the photo-imageable insulating layer, an ultraviolet (UV) blocking/absorbing layer is provided. The UV blocking layer may be formed on the opposite side of the substrate from the TFTs, or alternatively may be formed as part of the gate insulating layer.
    • 本发明涉及包括薄膜晶体管(TFT)阵列的辐射成像仪(例如X射线成像仪)及其制造方法。 在电极和下面的TFT,二极管和/或地址线之间的重叠区域中提供具有低介电常数的可光致成像绝缘材料,以便提高成像器的信噪比。 在某些实施例中,可光致成像的绝缘层用作负光刻胶,因此通过用保留在衬底上的UV光曝光绝缘层的部分,形成通孔,去除绝缘层的未曝光区域,以便 以在绝缘层中形成通孔或孔。 为了防止不均匀性被无意地成像到可光致成像绝缘层中,提供了紫外线(UV)阻挡/吸收层。 UV阻挡层可以形成在与TFT相对的衬底的相对侧上,或者可以形成为栅极绝缘层的一部分。
    • 9. 发明授权
    • Large area imager with UV blocking layer
    • 大面积成像器具有UV阻挡层
    • US6020590A
    • 2000-02-01
    • US10847
    • 1998-01-22
    • Steven AggasWillem den BoerYiwei LuScott V. Thomsen
    • Steven AggasWillem den BoerYiwei LuScott V. Thomsen
    • H01L27/146G02F1/13G01T1/24
    • H01L27/14663H01L27/14676
    • This invention is related to a radiation imager (e.g. X-ray imager) including a thin film transistor (TFT) array, and method of making same. A photo-imageable insulating material having a low dielectric constant is provided in areas of overlap between electrodes and underlying TFTs, diodes, and/or address lines in order to improve the signal-to-noise ratio of the imager. The photo-imageable insulating layer acts as a negative resist in certain embodiments, so that vias are formed therein by exposing portions of the insulating layer with UV light which are to remain on the substrate, removing non-exposed areas of the insulating layer so as to form the vias or apertures in the insulating layer. In order to prevent non-uniformities from inadvertently being imaged into the photo-imageable insulating layer, an ultraviolet (UV) blocking/absorbing layer is provided. The UV blocking layer may be formed on the opposite side of the substrate from the TFTs, or alternatively may be formed as part of the gate insulating layer.
    • 本发明涉及包括薄膜晶体管(TFT)阵列的辐射成像仪(例如X射线成像仪)及其制造方法。 在电极和下面的TFT,二极管和/或地址线之间的重叠区域中提供具有低介电常数的可光致成像绝缘材料,以便提高成像器的信噪比。 在某些实施例中,可光致成像的绝缘层用作负光刻胶,因此通过用保留在衬底上的UV光曝光绝缘层的部分,形成通孔,去除绝缘层的未曝光区域,以便 以在绝缘层中形成通孔或孔。 为了防止不均匀性被无意地成像到可光致成像绝缘层中,提供了紫外线(UV)阻挡/吸收层。 UV阻挡层可以形成在与TFT相对的衬底的相对侧上,或者可以形成为栅极绝缘层的一部分。