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    • 4. 发明申请
    • De-focus uniformity correction
    • 去焦均匀性校正
    • US20060139608A1
    • 2006-06-29
    • US11022888
    • 2004-12-28
    • Roberto WienerAlexander KremerElizabeth StoneRichard Zimmerman
    • Roberto WienerAlexander KremerElizabeth StoneRichard Zimmerman
    • G03B27/54
    • G02B27/0012G02B7/346G03F7/70125G03F7/70191
    • A system and method for uniformity correction such that a defined uniformity specification is met while minimizing a set of selected constraints is provided. The system includes illumination optics, an opto-mechanical correction system, a contrast device, projection optics and a correction module coupled to the correction system. The correction system includes a plurality of adjustable components such as fingers. The correction module is configured to determine adjustments to the components to correct uniformity. A method for discretizing the continuous intensity integral is also provided. The illumination slot is divided into a grid having multiple grid points. “pupils” are then superimposed onto the grid. Multiple second grids are also defined. Each ““pupil”” is mapped to a second grid such that the center of the second grid is coincident with the ““pupil”” center. The continuous intensity integral is then discretized using the first grid, plurality of second grids, and ““pupil”” mappings.
    • 一种用于均匀性校正的系统和方法,使得满足定义的均匀性规范,同时使得一组选定的约束最小化。 该系统包括照明光学器件,光学机械校正系统,对比度装置,投影光学器件和耦合到校正系统的校正模块。 校正系统包括多个可调组件,例如手指。 校正模块被配置为确定对组件的调整以校正均匀性。 还提供了用于离散连续强度积分的方法。 照明槽被分成具有多个网格点的网格。 “瞳孔”然后叠加到网格上。 还定义了多个第二个网格。 每个“”瞳孔“”被映射到第二格子,使得第二格子的中心与“瞳孔”中心一致。 然后使用第一格栅,多个第二格栅和“”瞳孔“”映射离散化连续强度积分。
    • 7. 发明授权
    • Light attenuating filter for correcting field dependent ellipticity and uniformity
    • 用于校正场依赖椭圆率和均匀性的光衰减滤波器
    • US07843549B2
    • 2010-11-30
    • US11752710
    • 2007-05-23
    • Alexander Kremer
    • Alexander Kremer
    • G03B27/68G03B27/54G03B27/72
    • G03B27/72
    • Ellipticity in an illumination beam may be corrected by measuring an ellipticity of the illumination beam and substantially eliminating the ellipticity using a light attenuating filter at a defocus position of the illumination beam, wherein the light attenuating filter has a two-dimensional pattern that compensates for ellipticity variations in the illumination beam. The light attenuating filter may stand alone, or the filter may be combined with a uniformity correction system, such that it corrects both uniformity and ellipticity. In one embodiment, the light attenuating filter is printed with an assembly of microscopic dots according to the two-dimensional pattern.
    • 可以通过测量照明光束的椭圆率并且在照明光束的散焦位置使用光衰减滤光器基本消除椭圆率来校正照明光束中的椭圆度,其中光衰减滤光器具有补偿椭圆率的二维图案 照明光束的变化。 光衰减滤光片可以独立存在,也可以将滤光片与均匀性校正系统组合,从而校正均匀性和椭圆度。 在一个实施例中,光衰减滤光器根据二维图案印刷有微小点的组件。
    • 8. 发明申请
    • De-focus uniformity correction
    • 去焦均匀性校正
    • US20070109518A1
    • 2007-05-17
    • US11647419
    • 2006-12-29
    • Roberto WienerAlexander KremerElizabeth StoneRichard Zimmerman
    • Roberto WienerAlexander KremerElizabeth StoneRichard Zimmerman
    • G03B27/52
    • G02B27/0012G02B7/346G03F7/70125G03F7/70191
    • A system and method for uniformity correction such that a defined uniformity specification is met while minimizing a set of selected constraints is provided. The system includes illumination optics, an opto-mechanical correction system, a contrast device, projection optics and a correction module coupled to the correction system. The correction system includes a plurality of adjustable components such as fingers. The correction module is configured to determine adjustments to the components to correct uniformity. A method for discretizing the continuous intensity integral is also provided. The illumination slot is divided into a grid having multiple grid points. “pupils” are then superimposed onto the grid. Multiple second grids are also defined. Each “pupil” is mapped to a second grid such that the center of the second grid is coincident with the “pupil” center. The continuous intensity integral is then discretized using the first grid, plurality of second grids, and “pupil” mappings.
    • 一种用于均匀性校正的系统和方法,使得满足定义的均匀性规范,同时使得一组选定的约束最小化。 该系统包括照明光学器件,光学机械校正系统,对比度装置,投影光学器件和耦合到校正系统的校正模块。 校正系统包括多个可调组件,例如手指。 校正模块被配置为确定对组件的调整以校正均匀性。 还提供了一种用于离散连续强度积分的方法。 照明槽被分成具有多个网格点的网格。 “瞳孔”然后叠加到网格上。 还定义了多个第二个网格。 每个“瞳孔”被映射到第二格子,使得第二格子的中心与“瞳孔”中心重合。 然后使用第一格栅,多个第二格栅和“瞳孔”映射离散化连续强度积分。
    • 9. 发明授权
    • Method for calculating an intensity integral for use in lithography systems
    • 用于计算光刻系统中使用的强度积分的方法
    • US07173688B2
    • 2007-02-06
    • US11022888
    • 2004-12-28
    • Roberto B. WienerAlexander KremerElizabeth StoneRichard Zimmerman
    • Roberto B. WienerAlexander KremerElizabeth StoneRichard Zimmerman
    • G03B27/72G03B27/42
    • G02B27/0012G02B7/346G03F7/70125G03F7/70191
    • A system and method for uniformity correction such that a defined uniformity specification is met while minimizing a set of selected constraints is provided. The system includes illumination optics, an opto-mechanical correction system, a contrast device, projection optics and a correction module coupled to the correction system. The correction system includes a plurality of adjustable components such as fingers. The correction module is configured to determine adjustments to the components to correct uniformity. A method for discretizing the continuous intensity integral is also provided. The illumination slot is divided into a grid having multiple grid points. “pupils” are then superimposed onto the grid. Multiple second grids are also defined. Each ““pupil”” is mapped to a second grid such that the center of the second grid is coincident with the ““pupil”” center. The continuous intensity integral is then discretized using the first grid, plurality of second grids, and ““pupil”” mappings.
    • 一种用于均匀性校正的系统和方法,使得满足定义的均匀性规范,同时使得一组选定的约束最小化。 该系统包括照明光学器件,光学机械校正系统,对比度装置,投影光学器件和耦合到校正系统的校正模块。 校正系统包括多个可调组件,例如手指。 校正模块被配置为确定对组件的调整以校正均匀性。 还提供了一种用于离散连续强度积分的方法。 照明槽被分成具有多个网格点的网格。 “瞳孔”然后叠加到网格上。 还定义了多个第二个网格。 每个“”瞳孔“”被映射到第二格子,使得第二格子的中心与“瞳孔”中心一致。 然后使用第一格栅,多个第二格栅和“”瞳孔“”映射离散化连续强度积分。