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    • 1. 发明授权
    • Standardizing a spectrometric instrument
    • 标准化光谱仪
    • US6049762A
    • 2000-04-11
    • US993482
    • 1997-12-18
    • Alan M. GanzYongdong WangDavid H. TracyRobert A. HoultJerry E. CahillDavid A. Huppler
    • Alan M. GanzYongdong WangDavid H. TracyRobert A. HoultJerry E. CahillDavid A. Huppler
    • G01J3/28G01J3/453G01R35/00
    • G01J3/453G01J2003/2866
    • Standardization is achieved for FTIR spectrometric instruments that effect an intrinsic distortion in spectral information, the distortion being associated with an aperture size. An idealized function of spectral line shape is specified. With a small calibration aperture, spectral data is obtained for a basic sample having known "true" spectral data, and standard spectral data also is obtained for a standard sample. With a larger, normal sized aperture, standard spectral data is obtained again for the calibration sample. A transformation factor, that is a function of this data and the standardized function, is applied to spectral data for test samples to effect standardized information. In another embodiment, the standard sample has known true spectral data, and the basic sample is omitted. In either case, the transformation factor is applied to the sample data in logarithm form, the antilogarithm of the result effects the standardized information.
    • 对于影响光谱信息中的固有失真的FTIR光谱仪器实现标准化,失真与孔径尺寸相关联。 规定了光谱线形状的理想化功能。 使用小的校准孔径,获得具有已知“真实”光谱数据的基本样品的光谱数据,并且还为标准样品获得标准光谱数据。 对于较大的正常尺寸的孔径,再次为校准样品获得标准光谱数据。 作为该数据和标准化函数的函数的变换因子被应用于测试样本的光谱数据以实现标准化信息。 在另一个实施例中,标准样品具有已知的真实光谱数据,并省略了基本样品。 在任一种情况下,转换因子以对数形式应用于样本数据,结果的反对数效应影响标准化信息。
    • 2. 发明授权
    • Analyzing spectrometric data
    • 分析光谱数据
    • US06029115A
    • 2000-02-22
    • US940575
    • 1997-09-30
    • David H. TracyAlan M. GanzYongdong WangDavid A. HupplerJuan C. IvaldiChristopher B. Hanna
    • David H. TracyAlan M. GanzYongdong WangDavid A. HupplerJuan C. IvaldiChristopher B. Hanna
    • G01J3/02G01J3/28G01J3/457G01N21/27G01N21/73G01R35/00
    • G01J3/28G01J3/2803G01J3/457G01J2003/2866
    • A spectrometric instrument includes a detector with detecting subarrays on small portions of the surface. Spectral data are acquired for selected subarrays at a first time for a drift standard, and compared to a zero position to obtain first offset data. Data are acquired similarly at a second time to obtain second offset data. The offset data are utilized to obtain a spectral shift for any subarray position at any selected time. The shift is applied to a matrix model used for converting test data to compositional information. Archive data for the model is obtained in the foregoing manner, using slit scanning in the instrument to achieve sub-increments smaller than the detector pixel size, with a procedure to assure that there is an integral number of scanning steps across one pixel. The drift standard may be chemical analytes, or an optical interference element producing fringes related to spectral positions in each subarray. A procedure is used to identify the fringe peaks to spectral position, with temperature correction.
    • 光谱测量仪器包括一个检测器,在表面的小部分具有检测子阵列。 针对漂移标准在第一时间针对所选择的子阵列采集光谱数据,并与零位置进行比较以获得第一偏移数据。 在第二时间类似地获取数据以获得第二偏移数据。 偏移数据用于在任何选定的时间获得任何子阵列位置的光谱偏移。 该转移被应用于用于将测试数据转换成组合信息的矩阵模型。 以上述方式获得用于模型的存档数据,使用仪器中的狭缝扫描来实现小于检测器像素尺寸的次增量,以确保跨越一个像素存在整数个扫描步骤的过程。 漂移标准可以是化学分析物,或者产生与每个子阵列中的光谱位置相关的条纹的光学干涉元件。 使用一个程序来确定边缘峰到光谱位置,并进行温度校正。
    • 4. 发明授权
    • Correction of spectra for stray radiation
    • 杂散辐射光谱校正
    • US5428558A
    • 1995-06-27
    • US168800
    • 1993-12-17
    • Jerry E. CahillAlan M. GanzPaul SavianoDavid TracyYongdong Wang
    • Jerry E. CahillAlan M. GanzPaul SavianoDavid TracyYongdong Wang
    • G01J3/02G01J3/28G01N21/27G01D18/00
    • G01J3/28G01J2003/2866
    • A method and apparatus are provided for correction of spectra for stray radiation in a spectrometric instrument, involving a sequence of steps as follows. Spectral patterns are obtained with the instrument initially for monochromatic radiation at a plurality of selected calibration wavelengths. By computer program, the peak profile at the calibration wavelength in each pattern is replaced with a substitute based on the remaining pattern. The resulting data are interpolated to effect values denoted "stray proportions" for the ordered wavelengths of the instrument. Spectral data at each ordered wavelength are obtained with the instrument for a sample, and multiplied in the computer program by stray proportions for corresponding wavelengths to effect further sets of values denoted "stray portions" that are identified to the ordered wavelengths. Each set is identified to one of the wavelength increments of the instrument across the spectral range. In each set, the stray portions for the ordered wavelengths are summed. The total for each wavelength increment is subtracted from the original sample data for the increment to effect spectral data corrected for stray.
    • 提供了一种用于校正光谱仪器中杂散辐射的光谱的方法和装置,涉及如下的一系列步骤。 在多个选定的校准波长下,仪器最初用于单色辐射获得光谱图案。 通过计算机程序,每个模式中校准波长处的峰值曲线被替换为基于剩余模式的替代。 内插所得数据以对仪器的有序波长表示为“杂散比”的值。 用样品的仪器获得每个有序波长的光谱数据,并在计算机程序中乘以相应波长的杂散比例,以实现被标识为有序波长的标记为“杂散部分”的另外一组值。 每个组被识别为跨越光谱范围的仪器的波长增量之一。 在每组中,将有序波长的杂散部分相加。 从原始采样数据中减去每个波长增量的总和,以增加修正为杂散的光谱数据。
    • 8. 发明授权
    • Optical resonance analysis system
    • 光学共振分析系统
    • US06600563B1
    • 2003-07-29
    • US09486424
    • 2000-07-17
    • Dar BahattJerry E. CahillKoichi NishikidaEnrico G. PicozzaPaul G. SavianoDavid H. TracyYongdong Wang
    • Dar BahattJerry E. CahillKoichi NishikidaEnrico G. PicozzaPaul G. SavianoDavid H. TracyYongdong Wang
    • G01N2155
    • G01N21/7703G01N21/553
    • An optical resonance analysis system comprising a sensor means (60) and an illumination means (400) for generating non-monochromatic illumination. The illumination means (400) further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles (390) and a dispersive device (380) for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean (60) for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means (90) for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means (120).
    • 一种光学共振分析系统,包括传感器装置(60)和用于产生非单色照明的照明装置(400)。 照明装置(400)还包括用于以多个角度产生照明的装置,用于以所述多个角度(390)投射所述照明的透镜系统和用于将所述照明分散在所述多个角度的分散装置(380) 的角度,使得在所述多个角度和所述照明的波长之间存在相关性,使得对于由所述非单色源同时产生的所有波长的所述传感器平均值(60)产生共振条件。 分析系统还包括用于检测反射或透射照明的检测装置(90)。 另一实施例包括变形成像装置(120)。
    • 9. 发明授权
    • Method of instrument standardization for a spectroscopic device
    • 光谱仪器标准化方法
    • US07405821B2
    • 2008-07-29
    • US11552361
    • 2006-10-24
    • Yongdong WangBernhard H. RadziukDavid H. Tracy
    • Yongdong WangBernhard H. RadziukDavid H. Tracy
    • G01J3/00
    • G01J3/28G01J3/42
    • In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, and the transfer function is applied to the test spectral line or spectrum in order to calculate a corrected test spectral line or spectrum.
    • 在分光过程中,刺激用于产生测试谱线或样品中包含的至少一种组分的光谱的样品,并且使用透射和/或发射的电磁波来产生测试光谱线或光谱。 为了改进这种光谱过程,使得补偿了改变光谱线的形状和/或出现的某些参数的变化,已知比较材料的比较光谱线或光谱基本上在 与样品相同的参数。 将比较谱线或频谱与理想的比较谱线或频谱进行比较,以计算传递函数,并将传递函数应用于测试谱线或频谱,以便计算校正的测试谱线或频谱。