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    • 2. 发明授权
    • Grain boundary layer dielectric ceramic compositions
    • 晶界层介电陶瓷组合物
    • US4362637A
    • 1982-12-07
    • US249885
    • 1981-04-01
    • Yoshihiro MatsuoGen ItakuraShoichi IkebeTatsuya Wada
    • Yoshihiro MatsuoGen ItakuraShoichi IkebeTatsuya Wada
    • C04B35/46C04B35/465C04B35/47H01B3/12H01G4/12
    • C04B35/47C04B35/465H01B3/12H01G4/1281
    • Grain boundary layer dielectric ceramic compositions comprising semiconductive ceramic grains having a composition of 50.23 to 49.47 mol % of SrO and CaO, 49.72 to 50.23 mol % of TiO.sub.2, 0.05 to 0.3 mol % of Nb.sub.2 O.sub.5, substantially each of said grains being surrounded by grain boundary layer dielectric materials which are formed by grain boundary diffusion of a mixture having a composition of 93.5 to 8.5 mol % of Bi.sub.2 O.sub.3, 4.5 to 45 mol % of Cu.sub.2 O, 0.5 to 4 mol % of MnO.sub.2, 1 to 8.5 mol % of B.sub.2 O.sub.3, 0.5 to 17 mol % of La.sub.2 O.sub.3, and below 17 mol % of TiO.sub.2.These ceramic compositions provide capacitors having a temperature coefficient of capacitance less than .+-.15%, an apparent dielectric constant higher than 35,000, a dielectric loss less than 0.01 and a breakdown voltage higher than 500 V/mm; or capacitors having a temperature coefficient of capacitance less than .+-.10%, an apparent dielectric constant higher than 20,000, a dielectric loss less than 0.01 and a breakdown voltage higher than 700 V/mm; or capacitors having a temperature coefficient of capacitance less than .+-.5%, an apparent dielectric constant higher than 5,000, a dielectric loss less than 0.01 and a breakdown voltage higher than 700 V/mm.
    • 包含组成为SrO和CaO的组成为50.23〜49.47摩尔%的二氧化铈,49.72〜50.23摩尔%的TiO 2,0.05〜0.3摩尔%的Nb 2 O 5的半导体陶瓷颗粒的晶界层介电陶瓷组合物,基本上每个所述晶粒被晶界包围 由Bi2O3为93.5〜8.5mol%,Cu2O为4.5〜45mol%,MnO2为0.5〜4mol%,B2O3为1〜8.5mol%,B2O3为0.5的混合物的晶界扩散形成的层间介电材料 至17mol%的La 2 O 3,以及低于17mol%的TiO 2。 这些陶瓷组合物提供具有小于+/- 15%的电容温度系数,高于35,000的表观介电常数,小于0.01的介电损耗和高于500V / mm的击穿电压的电容器; 或具有小于+/- 10%的电容温度系数的电容器,高于20,000的表观介电常数,小于0.01的介电损耗和高于700V / mm的击穿电压; 或具有小于+/- 5%的电容温度系数的电容器,高于5,000的表观介电常数,小于0.01的介质损耗和高于700V / mm的击穿电压。