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    • 1. 发明授权
    • Waveform measuring method and apparatus
    • 波形测量方法和装置
    • US06677577B2
    • 2004-01-13
    • US09941059
    • 2001-08-28
    • Akihito OtaniToshinobu OtsuboHiroto Watanabe
    • Akihito OtaniToshinobu OtsuboHiroto Watanabe
    • G01J104
    • G01R13/345
    • A common reference signal is applied from the same reference signal generating portion to a reference signal input terminal of a signal under test generator and a reference signal input terminal of a sampling signal generator circuit. A sampling frequency is set to the sampling signal generator circuit such that a desired delay time can be obtained relevant to a phase of a signal under test. In the sampling signal generator circuit, the sampling signal having a cycle that corresponds to the sampling frequency is generated based on the common reference signal and the sampling frequency. A repetition cycle of the signal under test and a repetition cycle of the sampling signal are set based on a cycle of the common reference signal so that the repetition cycle of the sampling signal can be set independently of the repetition cycle of the signal under test.
    • 公共参考信号从相同的参考信号产生部分施加到被测信号产生器的参考信号输入端和采样信号发生器电路的参考信号输入端。 采样频率被设置到采样信号发生器电路,使得可以获得与被测信号的相位相关的期望的延迟时间。 在采样信号发生器电路中,基于公共参考信号和采样频率生成具有与采样频率相对应的周期的采样信号。 基于公共参考信号的周期来设置被测信号的重复周期和采样信号的重复周期,使得可以独立于被测信号的重复周期设置采样信号的重复周期。
    • 2. 发明授权
    • Waveform measuring apparatus
    • 波形测量仪
    • US06483287B2
    • 2002-11-19
    • US09924331
    • 2001-08-08
    • Toshinobu OtsuboAkihito OtaniHiroto Watanabe
    • Toshinobu OtsuboAkihito OtaniHiroto Watanabe
    • G01R2302
    • G01R13/345
    • A frequency synthesized signal generator outputs a frequency synthesized signal having a frequency equal to a repetition frequency of a signal under test by employing a reference signal. A phase comparator detects a phase difference between a phase of the frequency synthesized signal and a phase of the signal under test, and outputs a phase difference signal. A voltage control oscillator generates a reference signal phase-synchronized with the signal under test based on the phase difference signal output from the phase comparator, and feeds the reference signal back to the frequency synthesized signal generator. A sampling signal generator circuit generates a sampling signal applied to a sampling section by employing the reference signal output from the voltage control oscillator.
    • 频率合成信号发生器通过采用参考信号输出具有等于被测信号的重复频率的频率的频率合成信号。 相位比较器检测频率合成信号的相位与被测信号的相位之间的相位差,并输出相位差信号。 电压控制振荡器基于从相位比较器输出的相位差信号产生与被测信号相位同步的参考信号,并将参考信号反馈给频率合成信号发生器。 采样信号发生器电路通过采用从压控振荡器输出的参考信号产生施加到采样部分的采样信号。
    • 3. 发明授权
    • Waveform measuring apparatus
    • 波形测量仪
    • US06407686B1
    • 2002-06-18
    • US09941145
    • 2001-08-28
    • Akihito OtaniToshinobu OtsuboHiroto Watanabe
    • Akihito OtaniToshinobu OtsuboHiroto Watanabe
    • H03M110
    • G01R13/347G01R19/2509
    • A reference signal generation portion generates a reference signal independently of a repetition cycle of a signal under test. A frequency measuring portion measures a repetition frequency of the signal under test by using a reference signal from the reference signal generation portion. A sampling frequency setting portion computes and sets a value of frequency of a sampling signal which can obtain a desired delay time with respect to a phase of the signal under test based on a value of a repetition frequency measured with the frequency measuring portion. The sampling signal generation portion uses a reference signal from the reference signal generation portion and the value of the frequency set by the sampling frequency setting portion to generate a sampling signal having a cycle corresponding to the frequency.
    • 参考信号产生部分独立于被测信号的重复周期产生参考信号。 频率测量部分通过使用来自参考信号产生部分的参考信号来测量被测信号的重复频率。 采样频率设定部分根据用频率测量部分测得的重复频率的值,计算并设定能够获得相对于被测信号的相位的期望延迟时间的采样信号的频率值。 采样信号产生部分使用来自参考信号产生部分的参考信号和由采样频率设置部分设置的频率的值来产生具有与频率相对应的周期的采样信号。
    • 4. 发明授权
    • Optical sampling waveform measuring apparatus aiming at achieving wider band
    • 光采样波形测量装置旨在实现更宽的频带
    • US06720548B2
    • 2004-04-13
    • US10095982
    • 2002-03-12
    • Akihito OtaniToshinobu OtsuboHidehiko TakaraIppei ShakeSatoki Kawanishi
    • Akihito OtaniToshinobu OtsuboHidehiko TakaraIppei ShakeSatoki Kawanishi
    • G02F101
    • G01J11/00G02F1/3534
    • A nonlinear optical crystal is composed of 2-adamantyl-5-nitorpyridine (AANP) allowing the type 2 phase matching to the sampling light and a measuring object light, emitting a sum frequency light of the measuring object light and the sampling light, with the polarization directions thereof being perpendicular to each other, when the sampling light and measuring object light multiplexed by a multiplexer are entered. When the sum frequency light is emitted through the nonlinear optical crystal, a control portion controls the polarization direction of the sampling light so as to be parallel to a predetermined reference axis located within a plane perpendicular to a phase matching direction of the nonlinear optical crystal. The predetermined reference axis is a single axis maintaining parallelism with the crystal axis of the nonlinear optical crystal even if the wavelength of the inputted light is changed.
    • 非线性光学晶体由允许与采样光进行2相匹配的2-金刚烷基-5-硝基吡啶(AANP)和测量对象光组成,发射测量对象光和采样光的和频光,与 当由多路复用器复用的采样光和测量对象光进入时,其极化方向彼此垂直。 当通过非线性光学晶体发射和频光时,控制部分将采样光的偏振方向控制成与位于垂直于非线性光学晶体的相位匹配方向的平面内的预定参考轴平行。 即使输入光的波长发生变化,预定的基准轴也是与非线性光学晶体的晶轴保持平行的单轴。
    • 5. 发明授权
    • Complementary optical sampling waveform measuring apparatus and
polarization beam splitter which can be assembled therein
    • 可以组装在其中的互补光采样波形测量装置和偏振分束器
    • US6154309A
    • 2000-11-28
    • US154445
    • 1998-09-16
    • Akihito OtaniToshinobu OtsuboHidehiko TakaraSatoki Kawanishi
    • Akihito OtaniToshinobu OtsuboHidehiko TakaraSatoki Kawanishi
    • G01J11/00G02F1/37G02F1/35
    • G02B27/283G01J11/00
    • A sampling light source generates a pulse sequence of sampling light having a pulse width smaller than that of target light and a single plane of polarization. A polarization beam splitting unit splits each of the sampling light output from the sampling light source, and the target light into two light components having planes of polarization shifted 90.degree. from each other, multiplexes each pair of split sampling and target light components having planes of polarization shifted 90.degree. from each other, and outputs the respective multiplexed light components to different optical paths. A pair of nonlinear optical members each generate a cross-correlation signal based on the sampling and target light components output from the polarization beam splitting unit to each optical path and having planes of polarization shifted 90.degree. from each other as sum frequency light. A pair of photodetectors each convert the sum frequency light output from each of the pair of nonlinear optical members into an electrical signal. A signal processing unit adds the electrical signals output from the pair of photodetectors, processes the resultant electrical signal, and displays its pulse waveform. With this operation, the pulse waveform of the target light can be accurately measured regardless of variations in the polarized state of the target light.
    • 采样光源产生采样光的脉冲序列,其脉冲宽度小于目标光和单一偏振平面。 偏振光束分离单元将从采样光源输出的采样光中的每一个分离,并将目标光分成具有彼此偏移90°的偏振面的两个光分量,将每对分离采样和目标光分量复用为具有 偏振偏移90°,并将各复用光分量输出到不同的光路。 一对非线性光学部件基于从偏振光束分离单元向每个光路输出的采样和目标光分量产生互相关信号,并且具有彼此偏移90°的偏振平面作为和频光。 一对光电检测器将从每对非线性光学部件的每一个输出的和频率光转换为电信号。 信号处理单元将从一对光检测器输出的电信号相加,处理所得的电信号,并显示其脉冲波形。 通过该操作,无论目标光的偏振状态的变化如何,都可以精确地测量目标光的脉搏波形。
    • 6. 发明授权
    • Wavelength dispersion measuring apparatus and polarization dispersion
measuring apparatus
    • 波长色散测量装置和偏振色散测量装置
    • US5995228A
    • 1999-11-30
    • US250089
    • 1999-02-16
    • Akihito OtaniToshinobu OtsuboHidehiko TakaraSatoki KawanishiYoshiaki Yamabayashi
    • Akihito OtaniToshinobu OtsuboHidehiko TakaraSatoki KawanishiYoshiaki Yamabayashi
    • G01M11/02G01J4/00G01J7/00G01J9/02G01M11/00G01J4/04
    • G01M11/336G01J4/00G01J7/00G01M11/332G01M11/335G01J2009/0261
    • A first tunable wavelength pulse light source is driven by a reference signal to emit a first optical pulse. An optical demultiplexer demultiplexes a first optical pulse emitted from the first pulse light source into a reference optical pulse and an incident optical pulse to be sent into an object to be measured. An optical multiplexer multiplexes the reference optical pulse and an outgoing optical pulse passing through the object to output multiplexed light. A second pulse light source generates a second optical pulse which is synchronous with the first optical pulse and delays a predetermined time for each period of the first optical pulse. A sampling unit receives the multiplexed light and the second optical pulse to obtain an optical pulse train signal proportional to the intensity of the multiplexed light obtained in synchronism with the second optical pulse. From the optical pulse train signal from the sampling unit, a signal processor obtains an envelope formed by peaks of individual optical pulses forming the optical pulse train. The wavelength dispersion of the object is obtained by measuring the delay time of the outgoing optical pulse passing through the object on the basis of intervals between the peaks of the envelope.
    • 第一可调波长脉冲光源由参考信号驱动以发射第一光脉冲。 光解复用器将从第一脉冲光源发射的第一光脉冲解复用为参考光脉冲和入射光脉冲,以发送到待测物体中。 光复用器复用参考光脉冲和通过物体的输出光脉冲以输出多路复用光。 第二脉冲光源产生与第一光脉冲同步的第二光脉冲,并延迟第一光脉冲的每个周期的预定时间。 采样单元接收复用光和第二光脉冲,以获得与与第二光脉冲同步获得的多路复用光的强度成比例的光脉冲串信号。 从采样单元的光脉冲信号中,信号处理器获得由形成光脉冲串的各个光脉冲的峰值形成的包络。 通过基于信封的峰值之间的间隔测量通过物体的输出光脉冲的延迟时间来获得物体的波长色散。
    • 8. 发明授权
    • Optical pulse generation system for generating optical pulses having high duty ratio
    • 用于产生具有高占空比的光脉冲的光脉冲发生系统
    • US06483624B1
    • 2002-11-19
    • US09455562
    • 1999-12-06
    • Akihito OtaniToshinobu Otsubo
    • Akihito OtaniToshinobu Otsubo
    • H04B1004
    • G02F1/0121G02F1/015
    • An optical pulse generator includes a single-wavelength light source, an electroabsorption optical modulator, a sine-wave voltage generator, a nonlinear circuit, and a DC voltage source. The single-wavelength light source outputs continuous, single-wavelength light. The electroabsorption optical modulator receives the single-wavelength light, modulates the single-wavelength light according to a pulse modulation signal, and outputs the modulated light as optical pulses. The sine-wave voltage generator generates an electrical signal having a sine waveform. The nonlinear circuit extracts only a waveform equal to or higher than a predetermined DC voltage from the sine waveform electrical signal. The DC voltage source adds a negative DC voltage to the electrical signal, from which only the waveform equal to or higher than the predetermined DC voltage is extracted by the nonlinear circuit, and applies the sum signal to the electroabsorption optical modulator as the pulse modulation signal.
    • 光脉冲发生器包括单波长光源,电吸收光调制器,正弦波电压发生器,非线性电路和直流电压源。 单波长光源输出连续的单波长光。 电吸收光调制器接收单波长光,根据脉冲调制信号调制单波长光,并输出调制光作为光脉冲。 正弦波电压发生器产生具有正弦波形的电信号。 非线性电路从正弦波形电信号仅提取等于或高于预定DC电压的波形。 直流电压源对电信号增加负直流电压,由非线性电路仅提取等于或高于预定直流电压的波形,并将和信号作为脉冲调制信号施加到电吸收光调制器 。
    • 9. 发明授权
    • Delay time measurement apparatus for optical element
    • 光学元件延迟时间测量装置
    • US06788410B1
    • 2004-09-07
    • US09460864
    • 1999-12-14
    • Akihito OtaniToshinobu Otsubo
    • Akihito OtaniToshinobu Otsubo
    • G01J404
    • G01M11/331G01J7/00G01M11/332G01M11/335G01M11/336
    • A delay time measurement apparatus for an optical element includes a pulse light source, wavelength setting unit, optical power divider, optical delay unit, controller, and detector. The pulse light source can vary the wavelength of light to be output, and outputs an optical pulse having a predetermined repetition period. The wavelength setting unit sets the wavelength of light to be output from the pulse light source. The optical power divider divides the optical pulse output from the pulse light source into a first optical pulse and a second optical pulse to be input to an optical element as the object to be measured. The optical delay unit can vary the spatial optical path length along which the first optical pulse divided by the optical power divider travels. The controller changes the spatial optical path length of the optical delay unit. The detector receives a measurement optical pulse output from the optical element as the object to be measured, and a reference optical pulse output from the optical delay unit, and detects the delay time of light that has passed through the optical element as the object to be measured from a change in spatial optical path length required for superposing the measurement and reference optical pulses on each other.
    • 用于光学元件的延迟时间测量装置包括脉冲光源,波长设置单元,光功率分配器,光学延迟单元,控制器和检测器。 脉冲光源可以改变要输出的光的波长,并输出具有预定重复周期的光脉冲。 波长设定单元设定从脉冲光源输出的光的波长。 光功率分配器将来自脉冲光源的光脉冲输出分成第一光脉冲和第二光脉冲,以输入到作为待测对象的光学元件。 光学延迟单元可以改变由光功率分配器划分的第一光脉冲行进的空间光程长度。 控制器改变光学延迟单元的空间光程长度。 检测器接收从作为被测量对象的光学元件输出的测量光脉冲和从光学延迟单元输出的基准光脉冲,并且检测作为对象物体的已经通过光学元件的光的延迟时间 从将测量和参考光脉冲叠加在一起所需的空间光程长度的变化来测量。