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    • 3. 发明授权
    • Single-crystal manufacturing method and single-crystal manufacturing apparatus
    • 单晶制造方法和单晶制造装置
    • US09200380B2
    • 2015-12-01
    • US13125899
    • 2009-10-19
    • Suguru MatsumotoSusumu SonokawaToshiharu UesugiTakashi Mori
    • Suguru MatsumotoSusumu SonokawaToshiharu UesugiTakashi Mori
    • C30B15/30C30B29/06C30B35/00
    • C30B29/06C30B15/305C30B35/00Y10T117/1032Y10T117/1072
    • The present invention provides a silicon single crystal manufacturing method for manufacturing a single crystal based on a horizontal magnetic field applied CZ method for pulling the single crystal while applying a horizontal magnetic field to a silicon raw material melt accommodated in a quartz crucible by a magnetic field application device, comprising: measuring a center position of the magnetic field generated by the magnetic field application device; and deviating the measured center position of the magnetic field from a pulling member serving as a rotation axis of the single crystal in a horizontal direction within the range of 2 to 14 mm before manufacture of the single crystal and/or during manufacture of the single crystal. As a result, the silicon single crystal manufacturing method and manufacturing apparatus that enable manufacture of a single crystal while suppressing fluctuations in diameter and in oxygen concentration without a variation caused due to characteristics of the apparatus can be provided.
    • 本发明提供了一种基于水平磁场施加CZ方法制造单晶的硅单晶制造方法,用于在通过磁场对容纳在石英坩埚中的硅原料熔体施加水平磁场的同时拉动单晶 应用装置,包括:测量由所述磁场施加装置产生的磁场的中心位置; 并且在制造单晶之前和/或在单晶制造期间,将测量的中心位置偏离作为单晶的旋转轴的拉构件在水平方向上在2至14mm的范围内 。 结果,可以提供能够在抑制由于设备的特性引起的变化的同时抑制直径和氧浓度的波动的同时制造单晶的硅单晶制造方法和制造装置。
    • 7. 发明申请
    • SINGLE-CRYSTAL MANUFACTURING METHOD AND SINGLE-CRYSTAL MANUFACTURING APPARATUS
    • 单晶制造方法和单晶制造设备
    • US20110214605A1
    • 2011-09-08
    • US13125899
    • 2009-10-19
    • Suguru MatsumotoSusumu SonokawaToshiharu UesugiTakashi Mori
    • Suguru MatsumotoSusumu SonokawaToshiharu UesugiTakashi Mori
    • C30B15/30C30B15/00
    • C30B29/06C30B15/305C30B35/00Y10T117/1032Y10T117/1072
    • The present invention provides a silicon single crystal manufacturing method for manufacturing a single crystal based on a horizontal magnetic field applied CZ method for pulling the single crystal while applying a horizontal magnetic field to a silicon raw material melt accommodated in a quartz crucible by a magnetic field application device, comprising: measuring a center position of the magnetic field generated by the magnetic field application device; and deviating the measured center position of the magnetic field from a pulling member serving as a rotation axis of the single crystal in a horizontal direction within the range of 2 to 14 mm before manufacture of the single crystal and/or during manufacture of the single crystal. As a result, the silicon single crystal manufacturing method and manufacturing apparatus that enable manufacture of a single crystal while suppressing fluctuations in diameter and in oxygen concentration without a variation caused due to characteristics of the apparatus can be provided.
    • 本发明提供了一种基于水平磁场施加CZ方法制造单晶的硅单晶制造方法,用于在通过磁场对容纳在石英坩埚中的硅原料熔体施加水平磁场的同时拉动单晶 应用装置,包括:测量由所述磁场施加装置产生的磁场的中心位置; 并且在制造单晶之前和/或在单晶制造期间,将测量的中心位置偏离作为单晶的旋转轴的拉构件在水平方向上在2至14mm的范围内 。 结果,可以提供能够在抑制由于设备的特性引起的变化的同时抑制直径和氧浓度的波动的同时制造单晶的硅单晶制造方法和制造装置。