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    • 3. 发明授权
    • Heteroleptic organometallic compounds
    • 杂音有机金属化合物
    • US07956207B2
    • 2011-06-07
    • US11899784
    • 2007-09-07
    • Scott Houston MeiereJohn D. PeckRonald F. SpohnDavid M. Thompson
    • Scott Houston MeiereJohn D. PeckRonald F. SpohnDavid M. Thompson
    • C07F7/00C07F11/00C23C16/00
    • C07F7/10
    • This invention relates to organometallic compounds represented by the formula (L1)xM(L2)y wherein M is a metal or metalloid, L1 and L2 are different and are each a hydrocarbon group or a heteroatom-containing group; x is a value of at least 1; y is a value of at least 1; x+y is equal to the oxidation state of M; and wherein (i) L1 has a steric bulk sufficiently large such that, due to steric hinderance, x cannot be a value equal to the oxidation state of M, (ii) L2 has a steric bulk sufficiently small such that, due to lack of steric hinderance, y can be a value equal to the oxidation state of M only in the event that x is not a value of at least 1, and (iii) L1 and L2 have a steric bulk sufficient to maintain a heteroleptic structure in which x+y is equal to the oxidation state of M; a process for producing the organometallic compounds, and a method for producing a film or coating from organometallic precursor compounds.
    • 本发明涉及由式(L1)xM(L2)y表示的有机金属化合物,其中M是金属或准金属,L1和L2不同,并且各自是烃基或含杂原子的基团; x是至少为1的值; y值至少为1; x + y等于M的氧化态; 并且其中(i)L1具有足够大的空间体积,使得由于空间阻力,x不能是等于M的氧化态的值,(ii)L2具有足够小的空间体积,使得由于缺乏 空间阻碍,y只有在x不是至少为1的值的情况下才可以是等于M的氧化态的值,以及(iii)L1和L2具有足够的空间体积以保持其中x的杂波结构 + y等于M的氧化态; 一种生产有机金属化合物的方法,以及一种由有机金属前体化合物制备薄膜或涂层的方法。
    • 4. 发明授权
    • Deposition processes using group 8 (VIII) metallocene precursors
    • 使用第8(VIII)族茂金属前体的沉积方法
    • US07927658B2
    • 2011-04-19
    • US10685785
    • 2003-10-16
    • David M. ThompsonCynthia A. HooverJohn D. PeckMichael M. Litwin
    • David M. ThompsonCynthia A. HooverJohn D. PeckMichael M. Litwin
    • C23C16/06
    • C23C16/406C23C16/18C23C16/40
    • Disclosed herein is a process for producing a film, coating or powder employing a metallocene or metallocene-like precursor having the general formula CpMCp′, where M is a metal selected from the group consisting of Ru, Os and Fe; Cp is a first substituted cyclopentadienyl or cyclopentadienyl-like, e.g., indenyl, moiety that includes at least one substituent group D1, where D1 is X; Ca1Hb1Xc1; Ca2Hb2Xc2(C═O)Ca1Hb1Xc1; Ca2Hb2Xc2OCa1Hb1Xc1; Ca2Hb2Xc2(C═O)OCa1Hb1Xc1; or Ca2Hb2Xc2O(C═O)Ca1Hb1Xc1; and Cp′ is a second substituted cyclopentadienyl or cyclopentadienyl-like, e.g., indenyl, moiety that includes at least one substituent group D1′, where D1′ is X; Ca1Hb1Xc1; Ca2Hb2Xc2(C═O)Ca1Hb1Xc1; Ca2Hb2Xc2OCa1Hb1Xc1; Ca2Hb2Xc2(C═O)OCa1Hb1Xc1; or Ca2Hb2Xc2O(C═O)Ca1Hb1Xc1. D1 and D1′ are different from one another. X is a halogen atom or NO2; a1 is an integer between 1 to 8; b1 is an integer between 0 and 2(a1)+1−c1; c1 is an integer between 0 and 2(a1)+1−b1; b1+c1 is at least 1; a2 is an integer between 0 and 8; b2 is an integer between 0 and 2(a2)+1−c2; and c2 is an integer between 0 and 2(a2)+1−b2. The process can be used in manufacturing or processing electronic devices.
    • 本文公开了使用具有通式CpMCp'的茂金属或茂金属样前体制备膜,涂层或粉末的方法,其中M是选自Ru,Os和Fe的金属; Cp是包括至少一个取代基组D1的第一取代的环戊二烯基或环戊二烯基,例如茚基,部分,其中D1是X; Ca1Hb1Xc1; Ca2Hb2Xc2(C = O)Ca1Hb1Xc1; Ca2Hb2Xc2OCa1Hb1Xc1; Ca2Hb2Xc2(C = O)OCa1Hb1Xc1; 或Ca2Hb2Xc2O(C = O)Ca1Hb1Xc1; 并且Cp'是包含至少一个取代基组D1'的第二取代的环戊二烯基或环戊二烯基,例如茚基,部分,其中D1'是X; Ca1Hb1Xc1; Ca2Hb2Xc2(C = O)Ca1Hb1Xc1; Ca2Hb2Xc2OCa1Hb1Xc1; Ca2Hb2Xc2(C = O)OCa1Hb1Xc1; 或Ca2Hb2Xc2O(C = O)Ca1Hb1Xc1。 D1和D1'彼此不同。 X是卤素原子或NO 2; a1是1〜8之间的整数; b1是0和2(a1)+ 1-c1之间的整数; c1是0和2(a1)+ 1-b1之间的整数; b1 + c1至少为1; a2是0和8之间的整数; b2是0和2(a2)+ 1-c2之间的整数; c2为0〜2(a2)+ 1-b2之间的整数。 该方法可用于制造或处理电子设备。
    • 5. 发明申请
    • Heteroleptic organometallic compounds
    • 杂音有机金属化合物
    • US20080081922A1
    • 2008-04-03
    • US11899784
    • 2007-09-07
    • Scott Houston MeiereJohn D. PeckRonald F. SpohnDavid M. Thompson
    • Scott Houston MeiereJohn D. PeckRonald F. SpohnDavid M. Thompson
    • C07F7/00
    • C07F7/10
    • This invention relates to organometallic compounds represented by the formula (L1)xM(L2)y wherein M is a metal or metalloid, L1 and L2 are different and are each a hydrocarbon group or a heteroatom-containing group; x is a value of at least 1; y is a value of at least 1; x+y is equal to the oxidation state of M; and wherein (i) L1 has a steric bulk sufficiently large such that, due to steric hinderance, x cannot be a value equal to the oxidation state of M, (ii) L2 has a steric bulk sufficiently small such that, due to lack of steric hinderance, y can be a value equal to the oxidation state of M only in the event that x is not a value of at least 1, and (iii) L1 and L2 have a steric bulk sufficient to maintain a heteroleptic structure in which x+y is equal to the oxidation state of M; a process for producing the organometallic compounds, and a method for producing a film or coating from organometallic precursor compounds.
    • 本发明涉及由下式(L 1/2)M M(L 2)n Y表示的有机金属化合物,其中 M是金属或准金属,L 1和L 2不同,并且各自是烃基或含杂原子的基团; x是至少为1的值; y是至少为1的值; y =等于X的氧化态; 并且其中(i)L 1具有足够大的空间体积,使得由于空间阻碍,X不能是等于M的氧化态的值(( ii)L 2 2具有足够小的空间体积,使得由于缺乏空间阻力,只有在Y的氧化状态下,Y可以是等于M的氧化态的值 事件: x不是至少为1的值,并且(iii)L 1和L 2具有足以维持的空间体积 其中 x + y的异质结构等于M的氧化态; 一种生产有机金属化合物的方法,以及一种由有机金属前体化合物制备薄膜或涂层的方法。
    • 7. 发明申请
    • ATOMIC LAYER DEPOSITION PROCESSES
    • 原子层沉积过程
    • US20100227476A1
    • 2010-09-09
    • US12714579
    • 2010-03-01
    • John D. Peck
    • John D. Peck
    • H01L21/3205
    • C23C16/40C23C16/45527
    • This invention relates to method of forming a thin film on a substrate in a reaction chamber by an atomic layer deposition process comprising a plurality of individual cycles. The plurality of individual cycles comprise at least two groupings of individual cycles. The individual cycles comprise (i) introducing a gaseous metal containing precursor into the reaction chamber and exposing the substrate to the gaseous metal containing precursor, wherein at least a portion of the metal containing precursor is chemisorbed onto the surface of the substrate to form a monolayer thereon, (ii) stopping introduction of the metal containing precursor and purging the volume of the reaction chamber; (iii) introducing a gaseous oxygen source compound into the reaction chamber and exposing the monolayer to the gaseous oxygen source compound, wherein at least a portion of the oxygen source compound chemically reacts with the monolayer; and (iv) stopping introduction of the oxygen source compound and purging the volume of the reaction chamber. The method involves repeating the individual cycles until a thin film of desired thickness is obtained. The method also involves carrying out at least two groupings of individual cycles at different process conditions. The methods are useful for producing a thin film on a semiconductor substrate, particularly metal containing thin films for electrode applications in microelectronics.
    • 本发明涉及通过包括多个单独循环的原子层沉积工艺在反应室中的衬底上形成薄膜的方法。 多个单独循环包括至少两组单独循环。 单个循环包括(i)将含气态金属的前体引入反应室并将基底暴露于含气态金属的前体,其中至少一部分含金属的前体被化学吸附到基底的表面上以形成单层 (ii)停止引入含有金属的前体并净化反应室的体积; (iii)将气态氧源化合物引入反应室并将单层暴露于气态氧源化合物,其中至少一部分氧源化合物与单层化学反应; 和(iv)停止引入氧源化合物并清除反应室的体积。 该方法包括重复各个循环,直到获得所需厚度的薄膜。 该方法还涉及在不同的工艺条件下进行至少两组单独的循环。 该方法可用于在半导体衬底上制造薄膜,特别是用于在微电子学中用于电极应用的金属薄膜。