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    • 2. 发明申请
    • OPTICAL ACCELEROMETER SYSTEM
    • 光学加速度计系统
    • US20130327146A1
    • 2013-12-12
    • US13907333
    • 2013-05-31
    • A. DOUGLAS MEYERMICHAEL D. BULATOWICZMICHAEL S. LARSENROBERT C. GRIFFITH
    • A. DOUGLAS MEYERMICHAEL D. BULATOWICZMICHAEL S. LARSENROBERT C. GRIFFITH
    • G01P15/093
    • G01P15/093G01P15/08G01P15/18
    • One embodiment includes an accelerometer system. The system includes a laser configured to emit an optical beam at a linear polarization. The system also includes an optical cavity system. The optical cavity system includes a minor that is coupled to an accelerometer housing via a spring and is configured to reflect the optical beam. The optical cavity system also includes at least one photodetector configured to receive at least a portion of at least one of the optical beam and the reflected optical beam and to generate an acceleration signal that is indicative of motion of the mirror resulting from an external acceleration acting upon the accelerometer housing. The system further includes an acceleration processor configured to calculate a magnitude of the external acceleration based on the acceleration signal.
    • 一个实施例包括加速度计系统。 该系统包括被配置为以线偏振发射光束的激光器。 该系统还包括光腔系统。 光腔系统包括通过弹簧联接到加速度计壳体的小型并且被构造成反射光束。 光腔系统还包括至少一个光电检测器,其被配置为接收光束和反射光束中的至少一个的至少一部分,并且产生指示由外部加速度作用产生的反射镜的运动的加速度信号 在加速度计外壳上。 该系统还包括加速度处理器,该加速度处理器被配置为基于加速度信号来计算外部加速度的大小。
    • 6. 发明申请
    • SYSTEMS AND METHODS FOR DETECTING AND/OR IDENTIFYING MATERIALS BASED ON ELECTROMAGNETIC RADIATION
    • 基于电磁辐射检测和/或识别材料的系统和方法
    • US20120248314A1
    • 2012-10-04
    • US13432606
    • 2012-03-28
    • MOSTAFA A. KARAMA. DOUGLAS MEYERCHARLES H. VOLKAZMAT H. SIDDIQI
    • MOSTAFA A. KARAMA. DOUGLAS MEYERCHARLES H. VOLKAZMAT H. SIDDIQI
    • G01J5/10
    • G01S13/887G01J5/10G01K11/006G01N21/3563G01N21/3581
    • One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.
    • 本发明的一个实施例包括材料检测和/或识别系统。 该系统包括被配置为从感兴趣区域收集EM辐射的电磁(EM)传感器系统。 收集的EM辐射可以包括正交极化的EM辐射。 该系统还包括处理单元,该处理单元被配置为检测并识别感兴趣区域中的感兴趣的材料。 作为示例,处理单元可以基于所收集的EM辐射来测量与感兴趣的材料相关联的反射率数据,并基于所测量的反射率数据计算感兴趣的材料的折射率,使得基于 折射率。 处理单元还可以被配置为计算与材料相关联的表面粗糙度,使得可以基于与材料相关联的表面粗糙度来计算折射率。