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    • 8. 发明授权
    • 도유량 측정방법 및 장치
    • 用于测量涂料油的方法和装置
    • KR100256337B1
    • 2000-08-01
    • KR1019940040290
    • 1994-12-31
    • 주식회사 포스코재단법인 포항산업과학연구원
    • 정성욱홍기정
    • G01B15/02G01B11/06
    • PURPOSE: A method and a device for measuring the amount of coated oil are provided to control the coated oil amount of oil coated on a steel sheet surface in a cold rolling process or a surface treatment process in an iron mill. CONSTITUTION: A device for measuring the amount of coated oil includes an infrared ray irradiating device(1), an oval reflector(3) and a detector(6). The infrared ray irradiating device(1) is mounted for perpendicularly irradiating infrared ray(2) on a steel sheet(4), which will be measured. The reflector is located between the steel sheet and the infrared ray irradiating device, and has a through hole(7) formed at the center for passing infrared ray and a steel sheet facing surface collecting all diffused reflection rays(5), which are reflected within 30°to incident rays from the steel sheet, by a reflection surface(3a). The detector detects all diffused rays reflected and collected from the reflector.
    • 目的:提供一种用于测量涂布油量的方法和装置,以控制在冷轧过程中的涂覆在钢板表面上的油的涂布油量或在铁磨机中的表面处理过程。 构成:用于测量涂覆油量的装置包括红外线照射装置(1),椭圆形反射器(3)和检测器(6)。 安装红外线照射装置(1)用于在将被测量的钢板(4)上垂直照射红外线(2)。 反射器位于钢板和红外线照射装置之间,并且具有形成在红外线的中心的通孔(7)和收集所有扩散的反射光线(5)的钢板相对表面,反射在内 通过反射面(3a)与来自钢板的入射光成30°。 检测器检测从反射器反射和收集的所有扩散射线。
    • 9. 发明公开
    • 광전자분광분석에 의한 코팅층의 코팅물질부착량측정방법
    • 使用X射线光电子能谱测量涂层涂层材料的方法
    • KR1020000040237A
    • 2000-07-05
    • KR1019980055816
    • 1998-12-17
    • 재단법인 포항산업과학연구원주식회사 포스코
    • 홍기정신광수
    • G01N21/00
    • PURPOSE: A method for measuring an amount of a coating material of a coating layer is provided to accurately measure the amount by using an X-ray photoelectron spectroscopy. CONSTITUTION: In a method for measuring an amount of a coating material of a coating layer using an X-ray photoelectron spectroscopy, a standard sample and a test sample are first prepared. Then, an X-ray photoelectron spectroscopy is performed by sputtering coating layers of the samples. Next, a chrome peak is calculated according to the results of the X-ray photoelectron spectroscopy. A sum of the chrome peaks of the samples, and an amount of the coating material is calculated by multiplying a proportional constant obtained from the chrome peak of the samples by the amount of coating material of the standard sample.
    • 目的:提供一种用于测量涂层涂料量的方法,以通过使用X射线光电子能谱法精确测量该量。 构成:首先,在使用X射线光电子能谱法测定涂层的涂布材料的量的方法中,首先准备标准试样和试验样品。 然后,通过溅射样品的涂层进行X射线光电子能谱。 接下来,根据X射线光电子能谱的结果计算铬峰。 通过将从样品的铬峰获得的比例常数与标准样品的涂层材料的量相乘来计算样品的铬峰的总和和涂料的量。