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    • 3. 发明公开
    • 광전자분광분석에 의한 코팅층의 코팅물질부착량측정방법
    • 使用X射线光电子能谱测量涂层涂层材料的方法
    • KR1020000040237A
    • 2000-07-05
    • KR1019980055816
    • 1998-12-17
    • 재단법인 포항산업과학연구원주식회사 포스코
    • 홍기정신광수
    • G01N21/00
    • PURPOSE: A method for measuring an amount of a coating material of a coating layer is provided to accurately measure the amount by using an X-ray photoelectron spectroscopy. CONSTITUTION: In a method for measuring an amount of a coating material of a coating layer using an X-ray photoelectron spectroscopy, a standard sample and a test sample are first prepared. Then, an X-ray photoelectron spectroscopy is performed by sputtering coating layers of the samples. Next, a chrome peak is calculated according to the results of the X-ray photoelectron spectroscopy. A sum of the chrome peaks of the samples, and an amount of the coating material is calculated by multiplying a proportional constant obtained from the chrome peak of the samples by the amount of coating material of the standard sample.
    • 目的:提供一种用于测量涂层涂料量的方法,以通过使用X射线光电子能谱法精确测量该量。 构成:首先,在使用X射线光电子能谱法测定涂层的涂布材料的量的方法中,首先准备标准试样和试验样品。 然后,通过溅射样品的涂层进行X射线光电子能谱。 接下来,根据X射线光电子能谱的结果计算铬峰。 通过将从样品的铬峰获得的比例常数与标准样品的涂层材料的量相乘来计算样品的铬峰的总和和涂料的量。