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    • 1. 发明授权
    • 독립된 듀얼 게이트의 핀펫 구조를 갖는 터널링 전계효과 트랜지스터 및 그 제조방법
    • 具有独立双门的FINFET结构的隧道场效应晶体管及其制造方法
    • KR101286707B1
    • 2013-07-16
    • KR1020120052537
    • 2012-05-17
    • 서울대학교산학협력단서강대학교산학협력단
    • 박병국김상완최우영
    • H01L29/78H01L21/336
    • H01L29/7855H01L29/66931H01L29/7311H01L29/7376
    • PURPOSE: A tunneling field effect transistor having the FINFET structure of an independent dual gate and a fabrication method thereof are provided to increase the driving current without the loss of a separate area by forming a vertical dual gate structure which is electrically separated from both sides of a semiconductor pin. CONSTITUTION: A semiconductor substrate (10) includes a semiconductor pin (14) at a constant height. A p+ region (62) and an n+ region (64) are formed at both sides of the semiconductor substrate. The semiconductor pin is formed between the p+ region and the n+ region. A first gate (52) is formed between one side of the semiconductor pin and the n+ region. A second gate (54) is formed between the other side of the semiconductor pin and the p+ region. The material of the first gate is different from that of the second gate.
    • 目的:提供具有独立双栅极的FINFET结构的隧道场效应晶体管及其制造方法,以通过形成垂直双栅极结构来增加驱动电流而不损失单独的面积,所述垂直双栅极结构与 半导体引脚。 构成:半导体衬底(10)包括恒定高度的半导体管脚(14)。 在半导体衬底的两侧形成有p +区域(62)和n +区域(64)。 半导体管脚形成在p +区域和n +区域之间。 第一栅极(52)形成在半导体引脚的一侧和n +区之间。 第二栅极(54)形成在半导体管脚的另一侧和p +区域之间。 第一栅极的材料与第二栅极的材料不同。
    • 7. 发明公开
    • 라운딩된 게이트를 갖는 박막 트랜지스터의 제조방법
    • 具有圆形栅极的薄膜晶体管的制造方法
    • KR1020120095739A
    • 2012-08-29
    • KR1020110015243
    • 2011-02-21
    • 서울대학교산학협력단
    • 박병국권대웅장지수김장현김상완
    • H01L29/786
    • H01L29/66765H01L21/32134H01L29/42384
    • PURPOSE: A method for manufacturing a thin film transistor having a rounded gate is provided to prevent the generation of hump because an edge part of a gate electrode is rounded by an undercut phenomenon. CONSTITUTION: A first conductive film is evaporated on an insulation board(10). After the first conductive film is dry-etched, a wet-etching process is implemented for a constant time to form a gate(26). A gate insulation layer(40) is formed on the gate and the board. A semiconductor material is evaporated on the gate insulation layer. A source section(52), a drain section(54), and a channel section(56) are formed on the semiconductor material. A source electrode(72) and a drain electrode(74) are respectively formed on the source and the drain sections.
    • 目的:提供一种用于制造具有圆形栅极的薄膜晶体管的方法,以防止由于栅极电极的边缘部分由于底切现象而变圆而产生隆起。 构成:第一导电膜在绝缘板(10)上蒸发。 在第一导电膜被干蚀刻之后,实施湿法蚀刻工艺一段时间以形成栅极(26)。 在栅极和电路板上形成栅极绝缘层(40)。 半导体材料在栅极绝缘层上蒸发。 源极部分(52),漏极部分(54)和沟道部分(56)形成在半导体材料上。 在源极和漏极部分上分别形成源极(72)和漏极(74)。
    • 9. 发明公开
    • 함몰된 바디에 두개의 게이트를 갖는 1T 디램 소자와 그 동작방법 및 제조방법
    • 在具有两个门的1T DRAM器件上,在其上被保持的身体及其操作和制造方法
    • KR1020110136532A
    • 2011-12-21
    • KR1020100056615
    • 2010-06-15
    • 서울대학교산학협력단
    • 박병국김상완
    • H01L27/092
    • PURPOSE: A 1T DRAM(Dynamic Random Access Memory) device which includes two gates in a depressed body, an operation method thereof, and a manufacturing method for the same are provided to independently apply negative voltage to the gate which is not overlapped with a drain, thereby significantly increasing data retention time. CONSTITUTION: A semiconductor body(32) is electrically isolated and depressed. A depressed part of the semiconductor body is arranged as a trench shape. A gate insulating film(52) is arranged in the depressed part of the semiconductor body. A first gate(62) and second gate(64) are filled in the depressed part of the semiconductor body. A source(72) and drain(74) are arranged with an N-type impurity doping layer.
    • 目的:提供一种包括凹陷体中的两个栅极的1T DRAM(动态随机存取存储器)装置及其操作方法及其制造方法,以独立地向不与漏极重叠的栅极施加负电压 ,从而显着增加数据保留时间。 构成:半导体本体(32)被电隔离和压制。 将半导体本体的凹部配置为沟槽状。 栅极绝缘膜(52)布置在半导体本体的凹陷部分中。 第一栅极(62)和第二栅极(64)填充在半导体主体的凹陷部分中。 源极(72)和漏极(74)配置有N型杂质掺杂层。