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    • 1. 发明专利
    • Plant monitoring control device
    • 植物监测控制装置
    • JP2013109432A
    • 2013-06-06
    • JP2011252216
    • 2011-11-18
    • Mitsubishi Electric Corp三菱電機株式会社
    • KAWASAKI TAKAHIRO
    • G05B23/02
    • PROBLEM TO BE SOLVED: To provide a plant monitoring control device capable of monitoring a screen of a related facility even when the screen of the related facility has not been registered for a monitoring subject facility screen in a design phase, without performing an expansion operation of a different screen.SOLUTION: A plant monitoring control device includes a windowing function that obtains data on a monitoring subject facility of a plant from a plant information processing device via a plant control bus, displays the data on a screen as a monitoring screen, and forms a range selected with a mouse within the monitoring screen into a window. The formed window 13 is displayed on a related different monitoring screen so that the window 13 can be monitored on the different monitoring screen concurrently.
    • 要解决的问题:即使在相关设施的屏幕没有被注册到设计阶段中的监控对象设备屏幕的情况下,也可以提供能够监视相关设施的屏幕的工厂监控控制设备,而不执行 扩展操作不同的屏幕。 解决方案:工厂监控控制装置包括通过工厂控制总线从工厂信息处理装置获取工厂的监控对象设施的数据的窗口功能,将屏幕上的数据显示为监视画面,并形成 将监视画面内的鼠标选择的范围转换成窗口。 形成的窗口13显示在相关的不同监视屏幕上,使得可以在不同的监视屏幕上同时监视窗口13。 版权所有(C)2013,JPO&INPIT
    • 2. 发明专利
    • 太陽電池用基板の製造方法及び太陽電池
    • 太阳能电池和太阳能电池基板的制造方法
    • JP2014203849A
    • 2014-10-27
    • JP2013076231
    • 2013-04-01
    • 三菱電機株式会社Mitsubishi Electric Corp
    • NONOGAKI MITSUHIROTSUGENO HAJIMEKARAKIDA SHOICHIOSHIRO YUSUKEKAWASAKI TAKAHIRO
    • H01L31/04H01L21/306
    • Y02E10/50Y02P70/521
    • 【課題】薬液使用コストを低減でき、かつ基板面内均一で太陽電池特性低下を引き起こさないテクスチャー構造を得ること。【解決手段】加工用スラリーを用いて半導体インゴットをスライスして半導体基板を切り出し、ウエハ表面のスラリーを除去した後、該基板を表面処理することにより、基板表面にテクスチャーを形成する太陽電池用基板の製造方法であって、p型単結晶シリコン基板などの半導体基板の表面処理を、少なくとも過酸化水素と金属捕捉剤を含む第1の水溶液に浸漬して基板表面の有機不純物と金属不純物を除去した(S1003)後、少なくともアルカリ物質を含む第2の水溶液で、前記半導体基板のスライスにより生じた基板表面のダメージ層を除去した(S1004)後、アルカリ系水溶液などの第3の水溶液に浸漬して、異方性エッチングを行い(S1005)、凹凸部からなるテクスチャー構造を形成する。【選択図】図1
    • 要解决的问题:获得可以降低液体化学品使用成本的纹理结构,其在基板表面中是均匀的,并且防止太阳能电池的特性被降低。解决方案:一种制造方法 用于太阳能电池的衬底包括:通过在使用处理浆料的同时切割半导体锭来切割半导体衬底; 以及在除去晶片表面上的浆料之后,通过对基板进行表面处理,在基板的表面上形成纹理。 在诸如p型单晶硅衬底的半导体衬底的表面处理中,将半导体衬底浸入至少含有过氧化氢和金属清除剂的第一水溶液中,以除去有机杂质和金属杂质 基板表面(S1003),然后在含有至少一种碱性物质的第二水溶液(S1004)中除去在半导体晶片上切片得到半导体基板而导致的基板表面上的损伤层(S1004),然后将其浸入第三水溶液 溶液,例如碱性水溶液,用于进行各向异性蚀刻(S1005),从而形成由凹凸形成的织构结构。
    • 3. 发明专利
    • Process of manufacturing solar cell
    • 制造太阳能电池的过程
    • JP2014167979A
    • 2014-09-11
    • JP2013039295
    • 2013-02-28
    • Mitsubishi Electric Corp三菱電機株式会社
    • OKIMOTO TAKASHINONOGAKI MITSUHIRONAKATANI MITSUNORIKAWASAKI TAKAHIRO
    • H01L31/04H01L31/06
    • Y02E10/547
    • PROBLEM TO BE SOLVED: To obtain with high yield a solar cell excellent in photoelectric conversion efficiency by removing foreign matters without breaking a fine uneven structure.SOLUTION: The process of manufacturing a solar cell includes steps of: preparing a first conductivity type crystal system semiconductor substrate having a second conductivity type semiconductor layer 3 on a first front surface side having a texture structure; forming an anti-reflection coating 4 on the second conductivity type semiconductor layer 3; removing foreign matters 14 of a surface of the anti-reflection coating 4; and forming on the anti-reflection coating 4 a light-receiving surface side electrode that is electrically coupled to the second conductivity type semiconductor layer 3.
    • 要解决的问题为了获得高产率的太阳能电池,通过去除异物而不破坏微细的不均匀结构,光电转换效率优异。解决方案:制造太阳能电池的过程包括以下步骤:制备第一导电型晶体系统半导体 在具有纹理结构的第一前表面侧上具有第二导电类型半导体层3的衬底; 在第二导电类型半导体层3上形成防反射涂层4; 去除防反射涂层4的表面的异物14; 并且在防反射涂层4上形成电耦合到第二导电类型半导体层3的受光面侧电极。
    • 4. 发明专利
    • Plasma cvd device
    • 等离子体CVD装置
    • JP2013159798A
    • 2013-08-19
    • JP2012020949
    • 2012-02-02
    • Mitsubishi Electric Corp三菱電機株式会社
    • KAWASAKI TAKAHIRO
    • C23C16/455C23C16/509H01L21/31
    • PROBLEM TO BE SOLVED: To provide a plasma CVD device that suppresses generation of abnormal discharge and unevenness of a film.SOLUTION: A plasma CVD device 100 includes: a chamber 1; a holder 2 disposed in the chamber 1 to hold a substrate; a porous electrode plate 3 disposed in the chamber to face the holder across the substrate; a first feed port 8a disposed on a face opposite to a face facing the substrate of the electrode plate to feed a plurality of raw material gasses 6; a first controller 71 that controls the flow rate ratio of the plurality of raw material gasses supplied from the first feed port; a second feed port 8b disposed on the reverse face of the electrode plate and on the outer periphery of the electrode plate in a manner of surrounding the first feed port to supply the plurality of raw material gasses; and a second controller 72 that controls the flow rate ratio of the plurality of raw material gasses supplied from the second feed port, wherein the plasma CVD device forms a thin film on the surface of the substrate by generating plasma discharge by applying a high frequency electric field to the electrode plate while supplying the plurality of raw material gasses from the first and second feed ports via the pores of the electrode plate to the holder side.
    • 要解决的问题:提供一种抑制异常放电的产生和膜的不均匀性的等离子体CVD装置。解决方案:等离子体CVD装置100包括:室1; 设置在室1中以保持基板的保持器2; 设置在所述室中的多孔电极板3,以跨越所述基板面对所述保持件; 第一供给口8a,其配置在与面向电极板的基板的面相反的面上,供给多个原料气体6; 第一控制器71,其控制从第一供给口供给的多个原料气体的流量比; 以围绕第一供给口的方式设置在电极板的背面和电极板的外周上的第二供给口8b,供给多个原料气体; 以及第二控制器72,其控制从第二供给口供给的多个原料气体的流量比,其中等离子体CVD装置通过施加高频电力产生等离子体放电而在基板的表面上形成薄膜 同时将多个原料气体从第一和第二进料口经由电极板的孔向保持器侧供给到电极板。
    • 5. 发明专利
    • Ellipsometer device and measuring method for anti-reflection film formed on mono-crystalline silicon
    • 用于单晶硅制成的抗反射膜的ELLIPSOMETER器件和测量方法
    • JP2013002900A
    • 2013-01-07
    • JP2011133039
    • 2011-06-15
    • Mitsubishi Electric Corp三菱電機株式会社
    • KAWASAKI TAKAHIRO
    • G01N21/21G01B11/06G01J4/04
    • PROBLEM TO BE SOLVED: To provide an ellipsometer device for effectively measuring a film thickness and a refractive index of an anti-reflection film formed on a surface of a mono-crystalline silicon solar cell.SOLUTION: An ellipsometer device 10 comprises: a light source 5 for irradiating with a laser beam a surface, on which an anti-reflective film is formed, of a measurement sample 1 on which an anti-reflective film is formed; a detector 6 for measuring a thickness and a refractive index of the anti-reflective film by, based on a reflected light reflected from the measurement sample, measuring polarization variation of the reflected light; a stage 2 having a rotation angle adjusting section for holding the measurement sample on a sample mounting surface and rotating the measurement sample about an axis perpendicular to the sample mounting surface and an inclination adjusting section for inclining the measurement sample; and a support portion 7 for holding the stage on a stage mounting surface.
    • 要解决的问题:提供一种用于有效测量形成在单晶硅太阳能电池的表面上的抗反射膜的膜厚度和折射率的椭圆偏振器装置。 解决方案:椭圆光度计装置10包括:光源5,用于在其上形成抗反射膜的测量样品1上用激光束照射形成有抗反射膜的表面; 用于通过基于从测量样品反射的反射光来测量反射膜的厚度和折射率的检测器6测量反射光的偏振变化; 阶段2,具有旋转角度调节部分,用于将测量样本保持在样品安装表面上,并使测量样品围绕垂直于样品安装表面的轴线旋转;以及倾斜调节部分,用于使测量样品倾斜; 以及用于将平台保持在台架安装表面上的支撑部分7。 版权所有(C)2013,JPO&INPIT
    • 6. 发明专利
    • Plasma process device
    • 等离子体处理装置
    • JP2012151180A
    • 2012-08-09
    • JP2011007121
    • 2011-01-17
    • Mitsubishi Electric Corp三菱電機株式会社
    • TANIGUCHI TOMOYUKIASANO SATONARIKAWASAKI TAKAHIRO
    • H01L21/31C23C16/458C23C16/509H01L21/3065
    • PROBLEM TO BE SOLVED: To provide a plasma process device capable of suppressing a film formed on a surface of a member inside a processing chamber from peeling.SOLUTION: A plasma process device comprises: a processing chamber 1; a first electrode 4 in which a processed substrate 3 is placed in the processing chamber 1; a second electrode 2 facing in parallel with the first electrode 4 in the processing chamber 1; processing gas supply means 8 for supplying a desired processing gas to a processing space between the first electrode 4 and the second electrode 2; exhaust means for performing exhaust and pressure adjustment in the processing chamber 1; and a power supply 7 which supplies a voltage for generating a plasma of the processing gas by supplying electric power to the processing space to the second electrode 2. The first electrode 4 includes a dug part 4a in at least a part of a region other than a placement region on a surface on the side on which the processed substrate 3 is placed.
    • 解决的问题:提供能够抑制在处理室内部的部件的表面上形成的膜剥离的等离子体处理装置。 解决方案:等离子体处理装置包括:处理室1; 第一电极4,其中经处理的基板3放置在处理室1中; 在处理室1中与第一电极4平行的第二电极2; 处理气体供给装置8,用于将期望的处理气体供应到第一电极4和第二电极2之间的处理空间; 用于在处理室1中执行排气和压力调节的排气装置; 以及电源7,其通过向第二电极2向处理空间提供电力来提供用于产生处理气体的等离子体的电压。第一电极4包括在除了第二电极2之外的区域的至少一部分中的挖出部分4a 处于被处理基板3的一侧的表面上的配置区域。 版权所有(C)2012,JPO&INPIT