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    • 2. 发明专利
    • Semiconductor light-emitting element and manufacturing method of the same
    • 半导体发光元件及其制造方法
    • JP2013105864A
    • 2013-05-30
    • JP2011248226
    • 2011-11-14
    • Sharp Corpシャープ株式会社
    • SAWAMURA MAKOTOITO SHIGETOSHI
    • H01S5/343
    • PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor light-emitting element capable of dividing in high accuracy a nitride semiconductor light-emitting element using a nitride semiconductor substrate having a semipolar surface such as (202-1) and (202-1-).SOLUTION: The manufacturing method of a nitride semiconductor light-emitting element comprises a process of forming a striped groove 13 so as to extend in a predetermined division position Xa direction of a major growth plane 1a of a nitride semiconductor substrate 1 having a major growth plane in a (202-1) surface, not buried in a nitride semiconductor layer 2, and making the nitride semiconductor layer 2 grow only on one inner surface, before a nitride semiconductor layer formation process.
    • 解决方案:提供一种使用具有半极性表面的氮化物半导体衬底(202-1)和氮化物半导体发光元件的氮化物半导体发光元件能够高精度地分割的半导体发光元件的制造方法, (202-1-)。 解决方案:氮化物半导体发光元件的制造方法包括以下步骤:形成条纹槽13,以便在氮化物半导体衬底1的主生长平面1a的预定划分位置Xa方向上延伸,该氮化物半导体衬底1具有 在氮化物半导体层形成工艺之前,在(202-1)表面的主生长平面不被埋在氮化物半导体层2中,并且使氮化物半导体层2仅在一个内表面上生长。 版权所有(C)2013,JPO&INPIT
    • 3. 发明专利
    • Nitride semiconductor light-emitting element and manufacturing method therefor
    • 氮化物半导体发光元件及其制造方法
    • JP2013168493A
    • 2013-08-29
    • JP2012030649
    • 2012-02-15
    • Sharp Corpシャープ株式会社
    • SAWAMURA MAKOTOHIRUKAWA SHUICHIITO SHIGETOSHI
    • H01L33/22H01L33/32
    • PROBLEM TO BE SOLVED: To provide a nitride semiconductor light-emitting element including a semiconductor layer formed of a nitride semiconductor in which light extraction efficiency can be enhanced while holding the internal quantum efficiency, and to provide a manufacturing method therefor.SOLUTION: On a nitride semiconductor layer, a gallium nitride semiconductor layer 18 for mask having crystal dislocation of a predetermined density is grown, a first uneven structure D1A of a predetermined density corresponding to the crystal dislocation of a predetermined density is formed, the nitride semiconductor layer of second conductivity type is exposed by removing the semiconductor layer, a second uneven structure D2A transferring the first uneven structure is formed on the surface of the nitride semiconductor layer of second conductivity type, and a conductive film is formed thereon in the method of manufacturing a nitride semiconductor light-emitting element. In the nitride semiconductor light-emitting element M(M1-M4), a desired uneven structure of submicron order is formed on the principal growth surface of a wafer.
    • 要解决的问题:提供一种氮化物半导体发光元件,其包括由氮化物半导体形成的半导体层,其中可以提高光提取效率,同时保持内部量子效率,并提供其制造方法。解决方案:在 生长具有预定密度的晶体位错的掩模用氮化镓半导体层18,形成与规定密度的晶体位错对应的规定密度的第一不均匀结构体D1A,第二导电性氮化物半导体层 通过去除半导体层来暴露类型,在第二导电类型的氮化物半导体层的表面上形成转印第一不平坦结构的第二不均匀结构D2A,并且在制造氮化物半导体光的方法中形成导电膜 -emitting元素。 在氮化物半导体发光元件M(M1-M4)中,在晶片的主生长面上形成亚微米级的期望的不均匀结构。
    • 5. 发明专利
    • Method of manufacturing nitride semiconductor element, nitride semiconductor laser element and laser device
    • 制造氮化物半导体元件,氮化物半导体激光元件和激光器件的方法
    • JP2013084806A
    • 2013-05-09
    • JP2011224203
    • 2011-10-11
    • Sharp Corpシャープ株式会社
    • KUBO SHOSAKUSAWAMURA MAKOTO
    • H01S5/323
    • PROBLEM TO BE SOLVED: To provide a method of manufacturing a nitride semiconductor element capable of improving a yield and characteristics.SOLUTION: A method of manufacturing a nitride semiconductor element includes the steps of: providing a processing region 20 to a non-polarity nitride semiconductor substrate 10; forming a nitride semiconductor layer structure 110 on the non-polarity nitride semiconductor substrate 10; and cleaving the non-polarity nitride semiconductor substrate 10. The step of forming the nitride semiconductor layer structure includes a step of forming a region 110b with a high perpendicularity to the processing region 20. The cleaving step includes a step of performing cleavage at a portion 120 of the region 110b with a high perpendicularity.
    • 解决的问题:提供一种能够提高成品率和特性的氮化物半导体元件的制造方法。 解决方案:一种制造氮化物半导体元件的方法包括以下步骤:向非极性氮化物半导体衬底10提供处理区域20; 在非极性氮化物半导体衬底10上形成氮化物半导体层结构110; 并且切割非极性氮化物半导体衬底10.形成氮化物半导体层结构的步骤包括形成与处理区域20高垂直的区域110b的步骤。该切割步骤包括在部分 120b具有高垂直度的区域110b。 版权所有(C)2013,JPO&INPIT
    • 6. 发明专利
    • Semiconductor light-emitting device and method of manufacturing the same
    • 半导体发光器件及其制造方法
    • JP2012243866A
    • 2012-12-10
    • JP2011110647
    • 2011-05-17
    • Sharp Corpシャープ株式会社
    • SAWAMURA MAKOTOKAMIKAWA TAKESHIITO SHIGETOSHI
    • H01S5/343H01L21/301
    • PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor light-emitting device capable of controlling a position at which a semiconductor element is divided with high precision and a semiconductor light-emitting device in which a favorable oscillator surface is formed.SOLUTION: A first auxiliary groove 41 crossing a concave groove 40 and having a depth greater than that of the concave groove 40 is formed at a position Xa, at which a semiconductor device is to be divided, on the side of a main surface of a semiconductor wafer Wh1. A semiconductor wafer Wh, in which a second auxiliary groove 42 having a depth smaller than that of the concave groove 40 is formed at the position Xa, is cleaved at the position Xa.
    • 解决的问题:提供一种能够高精度地控制半导体元件被分割的位置的半导体发光器件的制造方法和形成有利的振荡器表面的半导体发光器件 。 解决方案:在主体侧形成半导体器件要分割的位置Xa处形成有与凹槽40交叉的深度大于凹槽40的深度的第一辅助槽41, 半导体晶片Wh1的表面。 在位置Xa处形成有深度小于凹槽40的深度的第二辅助槽42的半导体晶片Wh在位置Xa处被切割。 版权所有(C)2013,JPO&INPIT