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    • 1. 发明授权
    • Reflected fluorescence microscope with multiple laser and excitation
light sources
    • 反射荧光显微镜与多个激光和激发光源
    • US6075643A
    • 2000-06-13
    • US175913
    • 1998-10-20
    • Yukio NonodaYasushi AonoKatsuyuki Abe
    • Yukio NonodaYasushi AonoKatsuyuki Abe
    • G02B21/00G02B21/06G02B21/16G02B21/32
    • G02B21/16G02B21/0088G02B21/32G02B2207/113
    • Caged reagent release experiments are carried out by introducing laser light of a laser light source for the Caged reagent release of a first reflected illumination optical system light path into a sample side through a first dichroic mirror on a cube turret and also introducing excitation light of a mercury lamp for the excitation light irradiation of a third reflected illumination optical system light path into the sample side through a first dichroic mirror on a slider. Laser trap experiments are carried out by introducing excitation light of a mercury lamp for the excitation light irradiation of a second reflected illumination optical system light path into the sample side through a second dichroic mirror on the cube turret and also introducing laser light from the laser light source for the laser trap of the third reflected illumination optical system light path into the sample side through a second dichroic mirror on the slider.
    • 笼式试剂释放实验是通过将通过第一分色镜将第一反射照明光学系统光路的笼式试剂释放到样品侧中的激光源的激光引入立方体转台上的第一分色镜,并且还引入 水银灯用于通过滑块上的第一分色镜将激发光照射到第三反射照明光学系统光路进入样品侧。 通过在立方体转台上通过第二分色镜将通过第二反射照明光学系统光路的激发光照射到样品侧的汞灯的激发光引入激光陷阱实验,并且还引入来自激光的激光 用于通过滑块上的第二分色镜将第三反射照明光学系统的激光阱的光源送入样品侧。
    • 4. 再颁专利
    • Reflected fluorescence microscope with multiple laser and excitation light sources
    • 反射荧光显微镜与多个激光和激发光源
    • USRE38847E1
    • 2005-10-25
    • US10170874
    • 2002-06-13
    • Yukio NonodaYasushi AonoKatsuyuki Abe
    • Yukio NonodaYasushi AonoKatsuyuki Abe
    • G02B21/00G02B21/06G02B21/16G02B21/32
    • G02B21/16G02B21/0088G02B21/32G02B2207/113
    • Caged reagent release experiments are carried out by introducing laser light of a laser light source for the Caged reagent release of a first reflected illumination optical system light path into a sample side through a first dichroic mirror on a cube turret and also introducing excitation light of a mercury lamp for the excitation light irradiation of a third reflected illumination optical system light path into the sample side through a first dichroic mirror on a slider. Laser trap experiments are carried out by introducing excitation light of a mercury lamp for the excitation light irradiation of a second reflected illumination optical system light path into the sample side through a second dichroic mirror on the cube turrent and also introducing laser light from the laser light source for the laser trap of the third reflected illumination optical system light path into the sample side through a second dichroic mirror on the slider.
    • 笼式试剂释放实验是通过将通过第一分色镜将第一反射照明光学系统光路的笼式试剂释放到样品侧中的激光源的激光引入立方体转台上的第一分色镜,并且还引入 水银灯用于通过滑块上的第一分色镜将激发光照射到第三反射照明光学系统光路进入样品侧。 激光阱实验是通过在立方体轮上引入第二反射照明光学系统光路的激发光照射到样品侧,并且还引入激光的激光来引入汞灯的激发光 用于通过滑块上的第二分色镜将第三反射照明光学系统的激光阱的光源送入样品侧。
    • 6. 发明申请
    • Microscope examination apparatus
    • 显微镜检查仪
    • US20060250687A1
    • 2006-11-09
    • US11402959
    • 2006-04-13
    • Kenji KarakiYukio Nonoda
    • Kenji KarakiYukio Nonoda
    • G02B21/00
    • G02B21/0016G02B21/0012G02B21/02G02B21/248
    • With the invention, when an external force is applied to the tip of an objective lens in a direction intersecting the optical axis thereof, that external force is effectively relieved, thus maintaining the integrity of the objective lens and specimen. The invention provides a microscope examination apparatus including an apparatus main body, a base member secured to the apparatus main body, an objective-lens mounting member for mounting an objective lens unit, and a support mechanism for supporting the objective-lens mounting member in such a manner as to enable movement thereof in a direction intersecting the optical axis of the objective lens unit relative to the base member.
    • 利用本发明,当物镜在与其光轴相交的方向上施加外力时,有效地释放外力,从而保持物镜和样本的完整性。 本发明提供了一种显微镜检查装置,其包括装置主体,固定在装置主体上的基座部件,用于安装物镜单元的物镜安装部件和用于将物镜安装部件支撑在其中的支撑机构 使得能够在与物镜单元的光轴相交的方向上相对于基底部件移动。