会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明申请
    • IMPULSE IMMUNITY TEST APPARATUS
    • 刺激免疫测试装置
    • US20100090710A1
    • 2010-04-15
    • US12530168
    • 2008-03-06
    • Tsuneo TsukagoshiTakeshi WatanabeToshiyuki NakaieNobuchika Matsui
    • Tsuneo TsukagoshiTakeshi WatanabeToshiyuki NakaieNobuchika Matsui
    • G01R27/28
    • G01R31/002G01R31/2841G01R31/3004
    • The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform.A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.
    • 现有技术中的应用方法不能将具有上升时间短的矩形波的足够电压应用于电子电路。 此外,静电放电试验可以施加足够的电压,但只能施加振荡波形。 TLP发生器用作矩形波发生器。 将注入电阻和匹配电阻的和设定为与用于将矩形波发送到测试对象的传输线的特性阻抗相匹配。 电容器连接到所施加的矩形波的返回线。 利用这种配置,可以实现稳定的应用。 电子电路的误差观察功能逐渐增加矩形波的峰值,并且基于施加电压确定第一次引起误差的抗扰度。
    • 5. 发明授权
    • Apparatus for testing integrated circuit
    • 集成电路测试装置
    • US4677375A
    • 1987-06-30
    • US745265
    • 1985-06-14
    • Toshiyuki NakaieAkira Yoshino
    • Toshiyuki NakaieAkira Yoshino
    • G01R31/28G01R31/26G01R1/04
    • G01R31/2886
    • An apparatus for testing plug-in type integrated circuits by applying a potential across their input and output terminals, utilizing a socket board with a plurality of sockets bored therein to receive respective input and output terminals of an integrated circuit. A pair of first and second groups of fixed contacts are located in the socket board, arranged in two concentric circles enclosing the sockets. Each fixed contact in each group is individually connected to one of the sockets through a conductor. A pair of coaxial first and second moving contact pins is rotatably disposed below the socket board. The first contact pin rotates to follow the first circle while sequentially contacting the contacts of the first group. The second contact pin follows the second circle, making sequential contact with the fixed contacts of the second group. It is so arranged that, when both contact pins are brought into contact with a selected pair of contacts from the two groups, one contact pin connects an input terminal while the other contact pin connects an output terminal, or vice versa, of the integrated circuit mounted on the socket board. In doing so, the contact pins pass current across the output and input terminals for a test.
    • 一种用于通过在其输入和输出端子上施加电位来测试插入式集成电路的装置,利用其中钻有多个插座的插座板来接收集成电路的相应输入和输出端子。 一对第一组和第二组固定触点位于插座板中,布置成包围插座的两个同心圆。 每个组中的每个固定触点通过导体单独连接到一个插座。 一对同轴的第一和第二移动接触销可旋转地设置在插座板下方。 第一接触销旋转以跟随第一圆,同时顺序地接触第一组的触点。 第二接触针跟随第二个圆,与第二组的固定触点顺序接触。 这样布置使得当两个接触销与两组中所选择的一对触点接触时,一个触针连接输入端,而另一个触针连接集成电路的输出端,反之亦然 安装在插座板上。 在这样做时,触点引脚将通过输出和输入端子的电流进行测试。
    • 6. 发明授权
    • Integral value measuring circuit
    • 积分值测量电路
    • US08829972B2
    • 2014-09-09
    • US13542999
    • 2012-07-06
    • Toshiyuki NakaieJoji Kayano
    • Toshiyuki NakaieJoji Kayano
    • G06F7/64G01R22/08G01R19/00
    • G01R22/08G01R19/0023
    • An integral value measuring circuit includes an operational amplifier and a capacitor connected between input and output sides thereof, an electric potential of an output terminal where a predetermined resistance element connected to an output side of the operational amplifier is being zero, positive and negative DC voltage generating circuits which comprise positive and negative power sources, respectively, at the output side of the operational amplifier, the positive and negative DC voltage generating circuits and being connected to positive and negative power terminals, respectively, of the operational amplifier through switches, and a connection line between the negative power terminal and one switch and a connection line between the positive power terminal and another switch being connected to the positive and negative power terminals, respectively, of the operational amplifier through cross resistance elements having resistance values negligible compared to a leakage resistance value of the switches.
    • 积分值测量电路包括运算放大器和连接在其输入和输出侧之间的电容器,连接到运算放大器的输出侧的预定电阻元件为零的输出端子的电位为正,负直流电压 分别在运算放大器的输出侧,正和负的直流电压产生电路分别包括正电源和负电源的发电电路,分别通过开关连接到运算放大器的正和负电源端子,以及 负电源端子和一个开关之间的连接线和正电源端子和另一个开关之间的连接线分别通过具有与泄漏相比可忽略的电阻值的交叉电阻元件分别连接到运算放大器的正电源端子和负电源端子 阻力v 开关的名称。