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1. 发明授权

US06404949B1 Optical fiber interface for integrated circuit test system 失效
公开(公告)号：US06404949B1
公开(公告)日：2002-06-11
申请号：US09841688
申请日：2001-04-23
申请人： Thornton W. Sargent, IV , Douglas W. Smith
发明人： Thornton W. Sargent, IV , Douglas W. Smith
IPC分类号： G02B628
CPC分类号： G01R31/31905 , H04B10/2503
摘要： A bi-directional interface for transmitting signals between a circuit tester and a connection point proximate to a circuit to be tested includes a first and a second optical fiber link, a first directional gate for coupling both the input end of the first link and the output end of the second link to one endpoint of the interface and a second directional gate for coupling both the input end of the second link and the output end of the first link to the other endpoint of the interface. An optical fiber link for transmitting a signal between a circuit tester and a connection point proximate to a circuit to be tested includes an optical fiber for transmitting the signal, a light source electrically coupled to the link input and optically coupled to the input of the fiber, and a photodetector optically coupled to the fiber output and electrically coupled to the link output.

2. 发明授权

US06594416B1 Optical fiber interface for integrated circuit test system 失效
标题翻译：用于集成电路测试系统的光纤接口
公开(公告)号：US06594416B1
公开(公告)日：2003-07-15
申请号：US09977040
申请日：2001-10-11
申请人： Thornton W. Sargent, IV , Douglas W. Smith
发明人： Thornton W. Sargent, IV , Douglas W. Smith
IPC分类号： H04B1012
CPC分类号： G01M11/33
摘要： A bi-directional interface for transmitting signals between a circuit tester and a connection point proximate to a circuit to be tested includes a first and a second optical fiber link, a first directional gate for coupling both the input end of the first link and the output end of the second link to one endpoint of the interface and a second directional gate for coupling both the input end of the second link and the output end of the first link to the other endpoint of the interface. An optical fiber link includes an optical fiber, a light source, and a photodetector.
摘要翻译：用于在电路测试器和接近待测电路的连接点之间传输信号的双向接口包括第一和第二光纤链路，第一定向门，用于耦合第一链路的输入端和输出端所述第二链路的一端连接到所述接口的一个端点，以及第二定向门，用于将所述第二链路的输入端和所述第一链路的输出端耦合到所述接口的另一端点。光纤链路包括光纤，光源和光电检测器。

3. 发明授权

US06259260B1 Apparatus for coupling a test head and probe card in a wafer testing system 失效
标题翻译：用于将测试头和探针卡耦合到晶片测试系统中的装置
公开(公告)号：US06259260B1
公开(公告)日：2001-07-10
申请号：US09126267
申请日：1998-07-30
申请人： Douglas W. Smith , Thornton W. Sargent, IV
发明人： Douglas W. Smith , Thornton W. Sargent, IV
IPC分类号： G01R1073
CPC分类号： G01R31/2886
摘要： An apparatus for coupling a test head and probe card in a wafer testing system incorporates a number of features that contribute to low impedance and reduced cross-talk, making the coupling apparatus particularly advantageous for high-speed test applications. The coupling apparatus may include, for example, an array of discrete conductor conduits that contain individual conducting elements. The conduits can be insulated, if desired, to reduce leakage. Further, the conduits can be made from metal, and terminated in dielectric interface plates for improved impedance matching. Divider elements can be provided to physically and electrically isolate adjacent rows of conductor conduits. Also, adjacent conducting elements can be connected to carry ground and signal potentials in an alternating manner such that signal carrying elements in a common row are separated from one another by ground carrying elements.
摘要翻译：用于在晶片测试系统中耦合测试头和探针卡的装置包括有助于低阻抗和减少串扰的许多特征，使得耦合装置对于高速测试应用特别有利。耦合装置可以包括例如包含单独导电元件的离散导体管道阵列。如果需要，导管可以绝缘，以减少泄漏。此外，导管可以由金属制成，并终止在电介质界面板中以改善阻抗匹配。可以提供分隔元件以物理地和电隔离相邻行的导体管道。此外，相邻的导电元件可以被连接以交替地承载接地和信号电位，使得公共行中的信号承载元件通过地面承载元件彼此分离。

4. 发明授权

US06249621B1 Optical fiber interface for integrated circuit test system 失效
标题翻译：用于集成电路测试系统的光纤接口
公开(公告)号：US06249621B1
公开(公告)日：2001-06-19
申请号：US08847305
申请日：1997-04-23
申请人： Thornton W. Sargent, IV , Douglas W. Smith
发明人： Thornton W. Sargent, IV , Douglas W. Smith
IPC分类号： G02B628
CPC分类号： G01R31/31905 , H04B10/2503
摘要： A bi-directional interface for transmitting signals between a circuit tester and a connection point proximate to a circuit to be tested includes a first and a second optical fiber link, a first directional gate for coupling both the input end of the first link and the output end of the second link to one endpoint of the interface and a second directional gate for coupling both the input end of the second link and the output end of the first link to the other endpoint of the interface. An optical fiber link for transmitting a signal between a circuit tester and a connection point proximate to a circuit to be tested includes an optical fiber for transmitting the signal, a light source electrically coupled to the link input and optically coupled to the input of the fiber, and a photodetector optically coupled to the fiber output and electrically coupled to the link output. The light source may include a light emitter and a driver stage electrically coupled to the light emitter. The link input may include a load adapter or a programmable load to receive the signal for the driver stage. For processing the output of the photodetector the link may have a receiver stage, followed by an equalizer stage, followed by a high-pass filter stage, followed by a power output stage.
摘要翻译：用于在电路测试器和接近待测电路的连接点之间传输信号的双向接口包括第一和第二光纤链路，第一定向门，用于耦合第一链路的输入端和输出端所述第二链路的一端连接到所述接口的一个端点，以及第二定向门，用于将所述第二链路的输入端和所述第一链路的输出端耦合到所述接口的另一端点。用于在电路测试器和靠近待测电路的连接点之间传输信号的光纤链路包括用于传输信号的光纤，电耦合到链路输入并光耦合到光纤输入端的光源以及与光纤输出光学耦合并电耦合到链路输出的光电检测器。光源可以包括光发射器和电耦合到光发射器的驱动器级。链路输入可以包括负载适配器或可编程负载以接收用于驱动器级的信号。为了处理光电检测器的输出，链路可以具有接收机级，之后是均衡器级，随后是高通滤波器级，随后是功率输出级。

5. 发明授权

US07141993B2 Interface apparatus for integrated circuit testing 失效
标题翻译：用于集成电路测试的接口装置
公开(公告)号：US07141993B2
公开(公告)日：2006-11-28
申请号：US10468277
申请日：2002-07-02
申请人： Douglas W. Smith , Thornton W. Sargent, IV , Stuart F. Daniels
发明人： Douglas W. Smith , Thornton W. Sargent, IV , Stuart F. Daniels
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R1/07378 , G01R31/2808 , G01R31/2886
摘要： An apparatus and method for coupling a test head and probe card in an IC testing system incorporating patterned divider elements (24) disposed between rows of signal conductors (22) to provide matching characteristic impedance values along each row of signal conductors. The divider elements have a patterned conductive layer formed thereon that is electrically connected to ground, and a method for determining a useful pattern is provided. Test dividers (24) fabricated with openings of various size and shape are used to construct transmission lines. The impedance of these lines is measured, and the results are used to interpolate an appropriate opening size and shape to achieve a desired transmission line impedance.
摘要翻译：一种用于将测试头和探针卡耦合到IC测试系统中的装置和方法，所述测试系统包括布置在信号导体（22）行之间的图案化分隔元件（24），以提供沿每条信号导体的匹配特征阻抗值。分隔元件具有形成在其上的图案化导电层，其电连接到地，并且提供了用于确定有用图案的方法。用各种尺寸和形状的开口制造的测试分配器（24）用于构建传输线。测量这些线的阻抗，并且结果用于内插适当的开口尺寸和形状以实现期望的传输线阻抗。

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