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    • 2. 发明申请
    • SHEET PEELING APPARATUS AND PEELING METHOD
    • 薄膜剥离装置和剥离方法
    • US20110198038A1
    • 2011-08-18
    • US13124939
    • 2009-10-13
    • Takahisa YoshiokaTakeshi Takano
    • Takahisa YoshiokaTakeshi Takano
    • B32B38/10
    • H01L21/67132Y10T156/1712
    • A sheet peeling apparatus 10 includes: a holding means 11 for holding a wafer W on which an adhesive sheet S is stuck; a sticking means 16 for sticking a peeling tape PT on the adhesion sheet S; and a peeling means 15 for peeling off the adhesive sheet S from the wafer W through the peeling tape PT. The peeling means 15 has first and second rollers 31, 32 between which the peeling tape PT and the adhesive sheet S may be pinched. The first roller 31 is provided such that a peeled section of the adhesive sheet S and an unpeeled section of the adhesive sheet S are bendable so as to be opposed to each other. The first roller 31 is displaced in a direction toward and away from the wafer W through a displacing means 30, and provided such that the peeling angle α between the peeling tape PT and/or the adhesive sheet S and the wafer W may be adjusted.
    • 片材剥离装置10包括:保持装置11,用于保持粘合了粘合片S的晶片W; 用于将剥离带PT粘附在粘合片S上的粘贴装置16; 以及用于通过剥离带PT从晶片W剥离粘合片S的剥离装置15。 剥离装置15具有第一和第二辊31,32,剥离带PT和粘合片S可夹在其之间。 第一辊31被设置成使得粘合片S的剥离部分和粘合片S的未剥离部分可弯曲成彼此相对。 第一辊31通过位移装置30朝向和离开晶片W的方向移位,并且设置为可以调节剥离带PT和/或粘合片S和晶片W之间的剥离角α。
    • 9. 发明授权
    • Sheet peeling apparatus and peeling method
    • 薄片剥离装置和剥离方法
    • US07686916B2
    • 2010-03-30
    • US10577258
    • 2004-10-21
    • Masaki TsujimotoTakahisa Yoshioka
    • Masaki TsujimotoTakahisa Yoshioka
    • B32B38/10
    • H01L21/67132H01L2221/68395Y10T156/1168Y10T156/195Y10T156/1978
    • There is provided a sheet peeling apparatus and a peeling method using a plurality of peeling units. A sheet peeling apparatus for peeling off a sheet stuck on the surface of a semiconductor wafer by using an adhesive tape of a width narrower than that of the sheet, which is equipped with a peeling head for peeling off the sheet by pulling the adhesive tape in an obtuse angled direction in a state stuck to the end portion of the sheet; and first and second rollers for peeling off the sheet by pulling the adhesive tape in the substantially right angle or acute angle direction in a state stuck with the adhesive tape in the direction across the sheet. Either of the peeling units are selectively used in accordance with the type of the sheet.
    • 提供了使用多个剥离单元的片材剥离装置和剥离方法。 一种片剥离装置,用于通过使用宽度窄于片材的宽度的胶带剥离粘附在半导体晶片的表面上的片材,该带材具有用于通过将粘合带拉出来剥离片材的剥离头 在粘贴在片材端部的状态下的钝角方向; 以及第一和第二辊,用于通过在粘合带沿着穿过纸张的方向的状态下拉动粘合带以大致直角或锐角方向剥离片材。 根据片材的类型选择性地使用任一剥离单元。
    • 10. 发明申请
    • TAPE STICKING APPARATUS AND STICKING METHOD
    • 胶带手提装置和方法
    • US20090165958A1
    • 2009-07-02
    • US12093571
    • 2006-12-04
    • Takahisa YoshiokaYoshiaki Sugishita
    • Takahisa YoshiokaYoshiaki Sugishita
    • B32B41/00B32B38/04
    • H01L21/67132Y10T156/1064Y10T156/1075Y10T156/1082Y10T156/1085Y10T156/12Y10T156/1322Y10T156/1339Y10T156/1707Y10T156/1712
    • A raw sheet L, in which a strip-shaped tape base material TB having a die bonding sheet portion DS with a size of substantially corresponding to the shape of a semiconductor wafer W is temporarily stuck to a strip-shaped release liner S, is fed out, and a cut-line detecting device 14 detects whether any cut-line C is already formed on the outer circumference side of the die bonding sheet portion DS, on the pathway of the feeding out. According to the result of detection, the die cutting device 13 lets the raw sheet L pass straight through without forming any cut-line C when the cut-line C is judged to be already formed thereon. On the other hand, the die cutting device 13 forms a cut-line C to form a sticking tape DDT when no cut-line C is detected. The sticking tape DDT is peeled by a peeling device 15 to be stuck to the ring frame RF in the position that the die bonding sheet portion DS is to be corresponding to the semiconductor wafer W.
    • 将具有基本上对应于半导体晶片W的形状的芯片接合片部分DS的条状带基材TB临时粘贴到条形剥离衬垫S的原料片L被供给 并且切断线检测装置14检测在送出的通路上是否在芯片接合片部分DS的外周侧上形成了任何切割线C. 根据检测结果,当切断线C被判断为已经形成在其上时,模切装置13使原料片L直线穿过而不形成任何切割线C. 另一方面,当没有检测到切割线C时,模切装置13形成切割线C以形成粘着带DDT。 粘贴带DDT由剥离装置15剥离以粘贴到环形框架RF上,使得芯片接合片部分DS将对应于半导体晶片W.