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1. 发明申请

US20070018637A1 Apparatus and method for testing circuit characteristics by using eye mask 有权
标题翻译：使用眼罩测试电路特性的装置和方法
公开(公告)号：US20070018637A1
公开(公告)日：2007-01-25
申请号：US11490984
申请日：2006-07-21
申请人： Woo-Seop Kim , Jun-Young Park , Sung-Je Hong , Sung-Bum Cho , Byung-Se So , Hyun-Chul Kang
发明人： Woo-Seop Kim , Jun-Young Park , Sung-Je Hong , Sung-Bum Cho , Byung-Se So , Hyun-Chul Kang
IPC分类号： G01R31/28
CPC分类号： G01R31/3171 , G11C29/02 , G11C29/022 , G11C29/50012 , G11C29/56
摘要： A test apparatus capable of detecting input/output (I/O) circuit characteristics of a semiconductor device by analyzing an eye mask generated in the test apparatus and the waveform of a test signal output from the I/O circuit of the semiconductor device. The test apparatus includes an eye mask generator that generates an eye mask in synchronization with one or more clock signals of opposite phase to each other, an error detector that receives the eye mask from the eye mask generator and compares the test signal with the eye mask to determine whether an error occurs in the semiconductor device, and an error signal output unit that receives an error detection signal from the error detector and generates an error signal in response to the error detection signal. In particular, the eye mask generator includes a sine wave generator that generates one or more sine waves of opposite phase to each other in synchronization with one or more clock signals, and a limiter circuit that receives the sine waves and generates the eye mask by adjusting the amplitudes of the sine waves.
摘要翻译：一种能够通过分析在测试装置中产生的眼罩和从半导体器件的I / O电路输出的测试信号的波形来检测半导体器件的输入/输出（I / O）电路特性的测试装置。所述测试装置包括与彼此相反相位的一个或多个时钟信号同步地生成眼罩的眼罩发生器，从眼罩发生器接收眼罩并将测试信号与眼罩相比较的误差检测器以确定半导体器件中是否发生错误;以及误差信号输出单元，其接收来自误差检测器的误差检测信号，并响应于误差检测信号产生误差信号。特别地，眼罩发生器包括正弦波发生器，其与一个或多个时钟信号同步地产生彼此相反相位的一个或多个正弦波，以及限制器电路，其接收正弦波并通过调整产生眼罩正弦波的幅度。

2. 发明授权

US07656181B2 Apparatus and method for testing circuit characteristics by using eye mask 有权
标题翻译：使用眼罩测试电路特性的装置和方法
公开(公告)号：US07656181B2
公开(公告)日：2010-02-02
申请号：US11490984
申请日：2006-07-21
申请人： Woo-Seop Kim , Jun-Young Park , Sung-Je Hong , Sung-Bum Cho , Byung-Se So , Hyun-Chul Kang
发明人： Woo-Seop Kim , Jun-Young Park , Sung-Je Hong , Sung-Bum Cho , Byung-Se So , Hyun-Chul Kang
IPC分类号： G01R31/26
CPC分类号： G01R31/3171 , G11C29/02 , G11C29/022 , G11C29/50012 , G11C29/56
摘要： A test apparatus capable of detecting input/output (I/O) circuit characteristics of a semiconductor device by analyzing an eye mask generated in the test apparatus and the waveform of a test signal output from the I/O circuit of the semiconductor device. The test apparatus includes an eye mask generator that generates an eye mask in synchronization with one or more clock signals of opposite phase to each other, an error detector that receives the eye mask from the eye mask generator and compares the test signal with the eye mask to determine whether an error occurs in the semiconductor device, and an error signal output unit that receives an error detection signal from the error detector and generates an error signal in response to the error detection signal. In particular, the eye mask generator includes a sine wave generator that generates one or more sine waves of opposite phase to each other in synchronization with one or more clock signals, and a limiter circuit that receives the sine waves and generates the eye mask by adjusting the amplitudes of the sine waves.
摘要翻译：一种能够通过分析在测试装置中产生的眼罩和从半导体器件的I / O电路输出的测试信号的波形来检测半导体器件的输入/输出（I / O）电路特性的测试装置。所述测试装置包括与彼此相反相位的一个或多个时钟信号同步地生成眼罩的眼罩发生器，从眼罩发生器接收眼罩并将测试信号与眼罩相比较的误差检测器以确定半导体器件中是否发生错误;以及误差信号输出单元，其接收来自误差检测器的误差检测信号，并响应于误差检测信号产生误差信号。特别地，眼罩发生器包括正弦波发生器，其与一个或多个时钟信号同步地产生彼此相反相位的一个或多个正弦波，以及限制器电路，其接收正弦波并通过调整产生眼罩正弦波的幅度。

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