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    • 8. 发明申请
    • Unequal hierarchical communications modulation method
    • 不平等分层通信调制方式
    • US20080247470A1
    • 2008-10-09
    • US11732630
    • 2007-04-04
    • Charles C. WangLan XuSamuel Lim
    • Charles C. WangLan XuSamuel Lim
    • H04B1/66
    • H04L1/006H04L1/0045H04L1/007H04L27/3488
    • Hierarchical modulation preferably uses a 16-ary quadrature amplitude modulation (QAM) modulator with a convolutional encoder that combine to effectively provide unequal protection to two different segments of streaming input data, with improved power efficiency with the same bandwidth efficiency, by encoding the first segment as coded data as LSBs as the second segment remains uncoded as uncoded MSBs, with the MSBs used for QAM constellation modest reliability interquadrant demodulation and detection, and with the LSBs used for low reliability intraquadrant detection, but with the LSBs subject to convolutional encoding and decoding rendering the LSBs with high reliability detection, such that, the two segments have unequal coding and modulation for providing unequal levels of reliability detection.
    • 分级调制优选地使用具有卷积编码器的16进制正交幅度调制(QAM)调制器,其组合以通过对第一段进行编码来有效地为两个不同段的流输入数据提供不同的保护,具有相同带宽效率的改进的功率效率 作为编码数据,作为第二段的LSB作为未编码的MSB保持未编码,其中MSB用于QAM星座适度可靠性互补解调和检测,并且LSB用于低可靠性入口检测,但是LSB经历卷积编码和解码 使得具有高可靠性检测的LSB,使得两个段具有不等的编码和调制以提供不相等级别的可靠性检测。
    • 9. 发明申请
    • Method for testing semiconductor devices and an apparatus therefor
    • 半导体器件的测试方法及其装置
    • US20070040570A1
    • 2007-02-22
    • US11589389
    • 2006-10-30
    • Ballson GopalChing TeongSamuel Lim
    • Ballson GopalChing TeongSamuel Lim
    • G01R31/26
    • G01R31/2867G01R1/0408G01R31/2849
    • A method for testing integrated circuit devices and loading such devices into a test board for further testing and an apparatus therefor is disclosed. The method allows for selection between two modes of operation. In a first mode, the integrated circuit devices are subjected to an electrical test before being placed into the test board for further testing. In a second mode, the integrated circuit devices are tested after being placed in the test board. The apparatus allows for the selection between the first mode and the second mode. In either mode, information about the tested devices and the sockets in the test board is used to load the test boards intelligently. Intelligent loading means that devices under test (DUTs) are not placed in bad sockets and devices that do test bad are removed from the test board, with an option of replacing the failed DUT with another DUT before subsequent environmental testing of the DUTs in the test board is carried out.
    • 公开了一种用于测试集成电路装置并将这些装置加载到测试板中用于进一步测试的方法及其装置。 该方法允许在两种操作模式之间进行选择。 在第一模式中,集成电路器件在放入测试板之前进行电气测试以便进一步测试。 在第二模式中,集成电路器件被放置在测试板中后进行测试。 该装置允许在第一模式和第二模式之间进行选择。 在任一模式下,测试板上的测试设备和插座的信息都用于智能地加载测试板。 智能加载意味着被测设备(DUT)不被放置在不良插槽中,测试不良的设备将从测试板上移除,并且可以选择在测试之前对DUT进行环境测试之前,将另一个DUT替换为失败的DUT 董事会进行了。