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1. 发明授权

US08555728B2 Method and installation for exposing the surface of an integrated circuit 有权
标题翻译：用于暴露集成电路表面的方法和安装
公开(公告)号：US08555728B2
公开(公告)日：2013-10-15
申请号：US12521444
申请日：2007-12-12
申请人： Romain Desplats , Michaël Obein
发明人： Romain Desplats , Michaël Obein
IPC分类号： G01N3/24
CPC分类号： H01L21/56 , B23K26/348 , H01J37/32082 , H01J37/32825 , H01L21/67126 , H01L2924/0002 , H01L2924/00
摘要： The invention relates to a method for exposing an integrated circuit by ablating the polymer coating initially covering the integrated circuit, characterized in that it includes the combined application of a laser radiation and a plasma onto the coating initially covering the integrated circuit.
摘要翻译：本发明涉及一种通过消除最初覆盖集成电路的聚合物涂层来暴露集成电路的方法，其特征在于它包括将激光辐射和等离子体组合施加到最初覆盖集成电路的涂层上。

2. 发明授权

US07560940B2 Method and installation for analyzing an integrated circuit 失效
标题翻译：分析集成电路的方法和安装
公开(公告)号：US07560940B2
公开(公告)日：2009-07-14
申请号：US11664120
申请日：2005-09-30
申请人： Romain Desplats , Kevin Sanchez , Félix Beaudoin
发明人： Romain Desplats , Kevin Sanchez , Félix Beaudoin
IPC分类号： G01R31/302 , G01R31/308 , G01N23/00 , G06K9/00
CPC分类号： G01R31/311
摘要： A method and installation for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, the following steps: applying a laser radiation, in one point of the surface of the integrated circuit; exciting the circuit; collecting the response of the circuit to the excitation; calculating the propagation time intervening between the excitation time and the response-collecting time; and creating an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application.
摘要翻译：一种用于分析集成电路的方法和装置。该方法包括对于集成电路的多个表面点，以下步骤：在集成电路的表面的一个点处施加激光辐射; 激励电路; 收集电路对激励的响应; 计算介于激发时间和响应采集时间之间的传播时间; 以及创建集成电路的图像，其显示表示在激光辐射应用的每个点处的传播时间的值。

3. 发明申请

US20080088324A1 Method and Installation for Analyzing an Integrated Circuit 失效
标题翻译：分析集成电路的方法和安装
公开(公告)号：US20080088324A1
公开(公告)日：2008-04-17
申请号：US11664120
申请日：2005-09-30
申请人： Romain Desplats , Kevin Sanchez , Felix Beaudoin
发明人： Romain Desplats , Kevin Sanchez , Felix Beaudoin
IPC分类号： G01R31/311
CPC分类号： G01R31/311
摘要： The invention concerns a method for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, following steps: applying (102) a laser radiation, in one point of the surface of the integrated circuit; exciting (106) the circuit; collecting (108) the response of the circuit to the excitation; calculating (114) the propagation time intervening between the excitation time and the response-collecting time; and creating (116) an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application. The invention also concerns an installation for analyzing an integrated circuit.
摘要翻译：本发明涉及一种用于分析集成电路的方法。该方法包括对于集成电路的多个表面点，接下来的步骤：在集成电路的表面的一个点中施加（102）激光辐射; 励磁（106）电路; 收集（108）电路对励磁的响应; 计算（114）介于激发时间和响应收集时间之间的传播时间; 以及创建（116）表示在激光辐射应用的每个点处表示传播时间的值的集成电路的图像。本发明还涉及用于分析集成电路的安装。

4. 发明授权

US07323862B2 Apparatus and method for detecting photon emissions from transistors 有权
公开(公告)号：US07323862B2
公开(公告)日：2008-01-29
申请号：US11380044
申请日：2006-04-25
申请人： Romain Desplats , Patricia Le Coupanec , William K. Lo , Philippe Perdu , Steven Kasapi
发明人： Romain Desplats , Patricia Le Coupanec , William K. Lo , Philippe Perdu , Steven Kasapi
IPC分类号： G01R31/28
CPC分类号： G01R31/2656 , G01R31/311
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

5. 发明申请

US20060108997A1 Apparatus and method for detecting photon emissions from transistors 有权
公开(公告)号：US20060108997A1
公开(公告)日：2006-05-25
申请号：US11296888
申请日：2005-12-08
申请人： Romain Desplats , Patricia Le Coupanec , William Lo , Philippe Perdu , Steven Kasapi
发明人： Romain Desplats , Patricia Le Coupanec , William Lo , Philippe Perdu , Steven Kasapi
IPC分类号： G01R31/28
CPC分类号： G01R31/2656 , G01R31/311
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

6. 发明申请

US20120187695A1 WIND-POWERED DEVICE FOR PRODUCING ELECTRICAL ENERGY 失效
标题翻译：用于生产电能的风力发电装置
公开(公告)号：US20120187695A1
公开(公告)日：2012-07-26
申请号：US12374696
申请日：2007-07-20
申请人： Romain Desplats , Frederic Fevrier
发明人： Romain Desplats , Frederic Fevrier
IPC分类号： F03D9/00
CPC分类号： F03D1/02 , F03D9/25 , F03D13/10 , F03D15/00 , F03D15/10 , F05B2240/40 , F05B2240/9112 , Y02B10/30 , Y02E10/728
摘要： A wind-powered device for producing electrical energy includes an electric generator set (1) which works by converting mechanical energy into the electrical energy, a wind-powered set (3) designed to capture the energy of the wind and convert it into mechanical energy, a transmission (2) positioned between the wind-powered set (3) and the generator set (1), the transmission (2) being designed to transmit mechanical energy produced by the wind-powered set (3) to the generator set (1), characterized in that the wind-powered set (3) includes at least two air turbines known as wind turbines (4) including non-coaxial shafts (5) coupled to the transmission (3), the wind turbines (4) being designed in such a way as to present an equivalent surface area to the wind that exceeds the surface area exposed to the wind of each of the wind turbines (4).
摘要翻译：用于产生电能的风力发电装置包括通过将机械能转换成电能来工作的发电机组（1），设计用于捕获风能并将其转换成机械能的风力发电机组（3），位于风力发电机组（3）和发电机组（1）之间的变速器（2），变速器（2）被设计成将由风力发电机组（3）产生的机械能传递到发电机组其特征在于，风力发电机组（3）包括至少两个称为风力涡轮机（4）的空气涡轮机，其包括联接到变速器（3）的非同轴轴（5），风力涡轮机（4）是设计成使得能够呈现超过暴露于每个风力涡轮机（4）的风的表面积的风的等效表面积。

7. 发明申请

US20070108975A1 Magnetic-field-measuring probe 失效
标题翻译：磁场测量探头
公开(公告)号：US20070108975A1
公开(公告)日：2007-05-17
申请号：US10575012
申请日：2004-10-08
申请人： Romain Desplats , Olivier Crepel , Felix Beaudoin , Philippe Perdu
发明人： Romain Desplats , Olivier Crepel , Felix Beaudoin , Philippe Perdu
IPC分类号： G01R33/02
CPC分类号： G01R33/02
摘要： The invention relates to a magnetic-field-measuring probe comprising at least one magnetoresistive sensor (102, 104, 106) which is sensitive to the magnetic field along a determined privileged measurement axis. The inventive probe comprises: at least two magnetoresistive sensors (102, 104, 106) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are offset angularly; and output terminals specific to each magnetoresistive sensor (102, 104, 106), in order to supply a signal that is representative of the field measured by each sensor along the privileged measurement axis thereof.
摘要翻译：本发明涉及一种磁场测量探头，其包括沿着确定的特权测量轴对磁场敏感的至少一个磁阻传感器（102,104,106）。本发明的探针包括：至少两个磁阻传感器（102,104,106），它们彼此刚性连接，使其特权的测量轴线成角度偏移; 以及特定于每个磁阻传感器（102,104,106）的输出端子，以便提供表示由每个传感器沿其特权测量轴测量的场的信号。

8. 发明申请

US20070052412A1 Magnetic-field-measuring device 失效
标题翻译：磁场测量装置
公开(公告)号：US20070052412A1
公开(公告)日：2007-03-08
申请号：US10575231
申请日：2004-10-08
申请人： Romain Desplats , Olivier Crepel , Felix Beaudoin , Philippe Perdu
发明人： Romain Desplats , Olivier Crepel , Felix Beaudoin , Philippe Perdu
IPC分类号： G01R33/02
CPC分类号： G01R33/02 , G01R31/002 , G01R33/09
摘要： A device (16) used to measure at least one component of a magnetic field, includes a magnetoresistive sensor (102) and a measuring chain (28). The input of the measuring chain is connected to the magnetoresistive sensor (102), while the output thereof is intended to supply information that is representative of the magnetic field in the region of the sensor. In addition, the measuring chain (28) includes elements (136) for isolating a frequency component of the signal from the sensor representative of the magnetic field for a unique pre-determined frequency (FI).
摘要翻译：用于测量磁场的至少一个分量的装置（16）包括磁阻传感器（102）和测量链（28）。测量链的输入连接到磁阻传感器（102），而其输出旨在提供表示传感器区域中的磁场的信息。此外，测量链（28）包括元件（136），用于隔离用于唯一预定频率（FI）的表示磁场的传感器的信号的频率分量。

9. 发明授权

US06970759B2 Method and device for automatic optimal location of an operation on an integrated circuit 失效
标题翻译：用于在集成电路上自动优化操作的方法和装置
公开(公告)号：US06970759B2
公开(公告)日：2005-11-29
申请号：US10257034
申请日：2001-04-06
申请人： Romain Desplats , Bruno Benteo
发明人： Romain Desplats , Bruno Benteo
IPC分类号： G06F17/50 , G06F17/00 , H01L21/66
CPC分类号： G06F17/5068 , H01J2237/31742
摘要： A process and installation for automatic optimal location of a servicing operation on an integrated circuit. The accessible polygons are retrieved on the basis of topographic descriptive data and data representing the electrical circuit. For each step, different execution options are determined, each corresponding to each of the different accessible polygons, and a rating is calculated and assigned to each execution option as a function of the depth of each possible initial polygon with respect to the access surface, and of accessibility parameters of each possible initial polygon, and the optimal execution option to be used for executing each step of the servicing operation is determined automatically by a numerical optimization calculation using the ratings assigned to the different execution options of each step of the servicing operation.
摘要翻译：用于在集成电路上自动优化服务操作位置的过程和安装。可以根据地形描述数据和表示电路的数据检索可访问的多边形。对于每个步骤，确定不同的执行选项，每个执行选项对应于每个不同的可访问的多边形，并且根据相对于访问表面的每个可能的初始多边形的深度来计算评级并将其分配给每个执行选项，以及通过使用分配给维修操作的每个步骤的不同执行选项的额定值的数值优化计算，自动确定用于执行维修操作的每个步骤的用于执行每个可能的初始多边形的可访问性参数的最佳执行选项。

10. 发明申请

US20050231219A1 Apparatus and method for detecting photon emissions from transistors 有权
公开(公告)号：US20050231219A1
公开(公告)日：2005-10-20
申请号：US11070968
申请日：2005-03-02
申请人： Romain Desplats , Philippe Perdu , Ketan Shah , Theodore Lundquist
发明人： Romain Desplats , Philippe Perdu , Ketan Shah , Theodore Lundquist
IPC分类号： G01R31/26 , G01R31/28 , G01R31/302 , G01R31/311
CPC分类号： G01R31/311 , G01R31/2621 , G01R31/2846
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

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