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1. 发明专利

JP2011158701A Multiplication table learning tool 审中-公开
标题翻译：多功能表学习工具
公开(公告)号：JP2011158701A
公开(公告)日：2011-08-18
申请号：JP2010020196
申请日：2010-02-01
申请人： Noriyuki Aizawa , Etsuo Arakawa , Eriko Fukamizu , Hitoshi Kamogawa , 深水映里子 , 相澤則行 , 荒川悦雄 , 仁鴨川
发明人： ARAKAWA ETSUO , AIZAWA NORIYUKI , KAMOGAWA HITOSHI , FUKAMIZU ERIKO
IPC分类号： G09B19/02 , G06C3/00
摘要： PROBLEM TO BE SOLVED: To provide a device enabling a learner of multiplication table to experience the joy of finding a mathematical regularity by himself/herself or to experience unexpected mathematical depth by utilizing, as an exploring activity, the process where a table is used for the process of checking the relation between the multiplier and the multiplicand.
SOLUTION: A learning tool for visually checking the result of regular arithmetic operation in a multiplication table by introducing the concept of logarithm where the product can be expressed by the sum is provided. The multiplication table learning tool comprises, as shown by the signs 1 and 2 in Fig. 3, a display body having a face displaying the entire relations in the multiplication table in a two-dimensional drawing, and a slide rule to be used in a superposed state, and a logarithmic scale in the same reduction scale is marked on each of them. As shown by the signs 1k and 2d in Fig.3, marks functioning as a mechanism for setting the use position of the slide rule for each multiplicand are provided on the display body and the slide rule and, by setting the position of the slide rule, the value of the product of multiplication is read. A user can take an overview of the entire relations in the multiplication table and can intuitively explore the regularity.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够让乘法表的学习者体验自己或她自己找到数学规律性的喜悦，或通过利用作为探索活动的过程来体验意想不到的数学深度的装置，其中表用于检查乘数和被乘数之间的关系的过程。
解决方案：提供了一种用于通过引入乘积可以表示乘积的对数概念来在乘法表中目视检查常规算术运算结果的学习工具。乘法表学习工具包括如图1中的符号1和2所示。如图3所示，具有在二维图中显示乘法表中的整体关系的面的显示体和叠加状态中使用的滑动规则，并且在每个显示体上标记相同缩小比例的对数标尺。如图3中的符号1k和2d所示，作为用于设置每个被乘数的滑动规则的使用位置的机构的标记被提供在显示体和滑动规则上，并且通过设置滑动规则的位置读取乘法乘积的值。用户可以对乘法表中的整个关系进行概述，并可以直观地探索规则性。版权所有（C）2011，JPO＆INPIT

2. 发明申请

US20100231900A1 OPTICAL DEFECT INSPECTION APPARATUS 有权
公开(公告)号：US20100231900A1
公开(公告)日：2010-09-16
申请号：US12785065
申请日：2010-05-21
申请人： Noriyuki AIZAWA , Hiroyuki KAWAKAMI , Kazuhiro ZAMA , Kazuo TAKAHASHI , Yusuke MIYAZAKI , Shingo TANAKA
发明人： Noriyuki AIZAWA , Hiroyuki KAWAKAMI , Kazuhiro ZAMA , Kazuo TAKAHASHI , Yusuke MIYAZAKI , Shingo TANAKA
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/94 , G01N2021/9513 , G01N2021/95676 , H01L22/12
摘要： A laser beam oscillated from a laser source is folded in its path by first and second plane mirrors and enters a beam expander. The surface of each plane mirror is deteriorated with illumination by the laser beam and the reflectance is reduced. To avoid a light quantity of the laser beam entering the beam expander from being reduced below a reference value, when the laser beam is illuminated over a certain time, a position on each of the first and second plane mirrors at which the laser beam is illuminated is changed by a structure for rotating and/or translating a reflecting surface of each plane mirror on a plane, which includes the plane mirror, while an optical axis is kept same. Thus, the useful life of each plane mirror can be prolonged without displacing the optical axis.

3. 发明申请

US20090147246A1 OPTICAL DEFECT INSPECTION APPARATUS 有权
标题翻译：光学缺陷检测装置
公开(公告)号：US20090147246A1
公开(公告)日：2009-06-11
申请号：US12275746
申请日：2008-11-21
申请人： Noriyuki AIZAWA , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takahashi , Yusuke Miyazaki , Shingo Tanaka
发明人： Noriyuki AIZAWA , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takahashi , Yusuke Miyazaki , Shingo Tanaka
IPC分类号： G01N21/88
CPC分类号： G01N21/9501 , G01N21/94 , G01N2021/9513 , G01N2021/95676 , H01L22/12
摘要： A laser beam oscillated from a laser source is folded in its path by first and second plane mirrors and enters a beam expander. The surface of each plane mirror is deteriorated with illumination by the laser beam and the reflectance is reduced. To avoid a light quantity of the laser beam entering the beam expander from being reduced below a reference value, when the laser beam is illuminated over a certain time, a position on each of the first and second plane mirrors at which the laser beam is illuminated is changed by a structure for rotating and/or translating a reflecting surface of each plane mirror on a plane, which includes the plane mirror, while an optical axis is kept same. Thus the useful life of each plane mirror can be prolonged without displacing the optical axis.
摘要翻译：从激光源振荡的激光束在其路径中被第一和第二平面镜折叠并进入光束扩展器。每个平面镜的表面由激光照射而劣化，反射率降低。为了避免进入光束扩展器的激光束的光量减小到低于参考值，当在一定时间内照射激光束时，激光束被照亮的第一和第二平面镜中的每一个上的位置通过用于在包括平面镜的平面上旋转和/或平移每个平面镜的反射表面的结构改变，同时光轴保持相同。因此，可以在不移动光轴的情况下延长每个平面镜的使用寿命。

4. 发明申请

US20110102781A1 OPTICAL DEFECT INSPECTION APPARATUS 审中-公开
标题翻译：光学缺陷检测装置
公开(公告)号：US20110102781A1
公开(公告)日：2011-05-05
申请号：US12985006
申请日：2011-01-05
申请人： Noriyuki AIZAWA , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takahashi , Yusuke Miyazaki , Shingo Tanaka
发明人： Noriyuki AIZAWA , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takahashi , Yusuke Miyazaki , Shingo Tanaka
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/94 , G01N2021/9513 , G01N2021/95676 , H01L22/12
摘要： A laser beam oscillated from a laser source is folded in its path by first and second plane mirrors and enters a beam expander. The surface of each plane mirror is deteriorated with illumination by the laser beam and the reflectance is reduced. To avoid a light quantity of the laser beam entering the beam expander from being reduced below a reference value, when the laser beam is illuminated over a certain time, a position on each of the first and second plane mirrors at which the laser beam is illuminated is changed by a structure for rotating and/or translating a reflecting surface of each plane mirror on a plane, which includes the plane mirror, while an optical axis is kept same. Thus, the useful life of each plane mirror can be prolonged without displacing the optical axis.
摘要翻译：从激光源振荡的激光束在其路径中被第一和第二平面镜折叠并进入光束扩展器。每个平面镜的表面由激光照射而劣化，反射率降低。为了避免进入光束扩展器的激光束的光量减小到低于参考值，当在一定时间内照射激光束时，激光束被照亮的第一和第二平面镜中的每一个上的位置通过用于在包括平面镜的平面上旋转和/或平移每个平面镜的反射表面的结构改变，同时光轴保持相同。因此，可以延长每个平面镜的使用寿命而不移动光轴。

5. 发明授权

US07746461B2 Optical defect inspection apparatus 有权
标题翻译：光学缺陷检查装置
公开(公告)号：US07746461B2
公开(公告)日：2010-06-29
申请号：US12275746
申请日：2008-11-21
申请人： Noriyuki Aizawa , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takahashi , Yusuke Miyazaki , Shingo Tanaka
发明人： Noriyuki Aizawa , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takahashi , Yusuke Miyazaki , Shingo Tanaka
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/94 , G01N2021/9513 , G01N2021/95676 , H01L22/12
摘要： A laser beam oscillated from a laser source is folded in its path by first and second plane mirrors and enters a beam expander. The surface of each plane mirror is deteriorated with illumination by the laser beam and the reflectance is reduced. To avoid a light quantity of the laser beam entering the beam expander from being reduced below a reference value, when the laser beam is illuminated over a certain time, a position on each of the first and second plane mirrors at which the laser beam is illuminated is changed by a structure for rotating and/or translating a reflecting surface of each plane mirror on a plane, which includes the plane mirror, while an optical axis is kept same. Thus, the useful life of each plane mirror can be prolonged without displacing the optical axis.
摘要翻译：从激光源振荡的激光束在其路径中被第一和第二平面镜折叠并进入光束扩展器。每个平面镜的表面由激光照射而劣化，反射率降低。为了避免进入光束扩展器的激光束的光量减小到低于参考值，当在一定时间内照射激光束时，激光束被照亮的第一和第二平面镜中的每一个上的位置通过用于在包括平面镜的平面上旋转和/或平移每个平面镜的反射表面的结构改变，同时光轴保持相同。因此，可以延长每个平面镜的使用寿命而不移动光轴。

6. 发明申请

US20070211241A1 Optical defect inspection apparatus 审中-公开
标题翻译：光学缺陷检查装置
公开(公告)号：US20070211241A1
公开(公告)日：2007-09-13
申请号：US11709873
申请日：2007-02-23
申请人： Noriyuki Aizawa , Hiroyuki Kawakami , Kazuhiro Zama , Yuuichiro Iijima , Kazuo Takahashi , Yusuke Miyazaki , Masayuki Hachiya , Koichi Asami , Shingo Tanaka
发明人： Noriyuki Aizawa , Hiroyuki Kawakami , Kazuhiro Zama , Yuuichiro Iijima , Kazuo Takahashi , Yusuke Miyazaki , Masayuki Hachiya , Koichi Asami , Shingo Tanaka
IPC分类号： G01N21/88
CPC分类号： G01N21/9501 , G01N21/94 , G01N2021/9513 , G01N2021/95676 , H01L22/12
摘要： A laser beam oscillated from a laser source is folded in its path by first and second plane mirrors and enters a beam expander. The surface of each plane mirror is deteriorated with illumination by the laser beam and the reflectance is reduced. To avoid a light quantity of the laser beam entering the beam expander from being reduced below a reference value, when the laser beam is illuminated over a certain time, a position on each of the first and second plane mirrors at which the laser beam is illuminated is changed by a structure for rotating and/or translating a reflecting surface of each plane mirror on a plane, which includes the plane mirror, while an optical axis is kept same. The useful life of each plane mirror can be prolonged without displacing the optical axis itself by overcoming the problem that when the laser beam is employed as the light source and a thin beam with a high illumination density is illuminated to the same position on each of the first and second plane mirrors for a long time, the surface of the plane mirror is deteriorated, the reflectance is reduced, and the light quantity cannot be held at a required level.
摘要翻译：从激光源振荡的激光束在其路径中被第一和第二平面镜折叠并进入光束扩展器。每个平面镜的表面由激光照射而劣化，反射率降低。为了避免进入光束扩展器的激光束的光量减小到低于参考值，当在一定时间内照射激光束时，激光束被照亮的第一和第二平面镜中的每一个上的位置通过用于在包括平面镜的平面上旋转和/或平移每个平面镜的反射表面的结构改变，同时光轴保持相同。可以延长每个平面镜的使用寿命而不会使光轴本身移位，克服了当激光束被用作光源并且具有高照明密度的薄光束被照射到每个平面镜上的相同位置第一和第二平面镜长时间，平面镜的表面劣化，反射率降低，并且光量不能保持在要求的水平。

7. 发明申请

US20120182547A1 OPTICAL DEFECT INSPECTION APPARATUS 失效
标题翻译：光学缺陷检测装置
公开(公告)号：US20120182547A1
公开(公告)日：2012-07-19
申请号：US13433035
申请日：2012-03-28
申请人： Noriyuki Aizawa , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takashi , Yusuke Miyazaki , Shingo Tanaka , Yuuichiro Iijima , Masayuki Hachiya , Rieko Hachiya , Koichi Asami
发明人： Noriyuki Aizawa , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takashi , Yusuke Miyazaki , Shingo Tanaka , Yuuichiro Iijima , Masayuki Hachiya , Rieko Hachiya , Koichi Asami
IPC分类号： G01N21/89 , B66C1/42
CPC分类号： G01N21/9501 , G01N21/94 , G01N2021/9513 , G01N2021/95676 , H01L22/12
摘要： A laser beam oscillated from a laser source is folded in its path by first and second plane mirrors and enters a beam expander. The surface of each plane mirror is deteriorated with illumination by the laser beam and the reflectance is reduced. To avoid a light quantity of the laser beam entering the beam expander from being reduced below a reference value, when the laser beam is illuminated over a certain time, a position on each of the first and second plane mirrors at which the laser beam is illuminated is changed by a structure for rotating and/or translating a reflecting surface of each plane mirror on a plane, which includes the plane mirror, while an optical axis is kept same. Thus, the useful life of each plane mirror can be prolonged without displacing the optical axis.
摘要翻译：从激光源振荡的激光束在其路径中被第一和第二平面镜折叠并进入光束扩展器。每个平面镜的表面由激光照射而劣化，反射率降低。为了避免进入光束扩展器的激光束的光量减小到低于参考值，当在一定时间内照射激光束时，激光束被照亮的第一和第二平面镜中的每一个上的位置通过用于在包括平面镜的平面上旋转和/或平移每个平面镜的反射表面的结构改变，同时光轴保持相同。因此，可以延长每个平面镜的使用寿命而不移动光轴。

8. 发明授权

US08036338B2 Method and device for simultaneous measurement of magnetostriction and magnetization 有权
标题翻译：用于同时测量磁致伸缩和磁化的方法和装置
公开(公告)号：US08036338B2
公开(公告)日：2011-10-11
申请号：US11887265
申请日：2005-11-24
申请人： Etsuo Arakawa , Noriyuki Aizawa , Koichi Maruyama
发明人： Etsuo Arakawa , Noriyuki Aizawa , Koichi Maruyama
IPC分类号： G01N23/20
CPC分类号： G01N23/20 , G01R33/16
摘要： Since measurement of magnetostriction is accompanied by measurement of magnetization, magnetostriction and magnetization are measured conventionally by separately prepared devices, with efforts for observing the same region of the sample. Measurement of the magnetostriction is difficult due to the difficulty of compensation and calibration. The value of magnetostriction coefficient in low temperature region cannot be correctly determined. A convenient method which can measure magnetostriction and magnetization simultaneously at the same region of the sample and at the same time is developed by combining the method of measurement of magnetostriction by X-ray diffraction and the method of measurement of magnetic X-ray diffraction. The observed X-ray diffraction intensity as a function of the magnetic field from the sample can be separated to symmetric component and asymmetric component, which contain signals proportional to the magnetostriction and magnetization, respectively.
摘要翻译：由于磁致伸缩的测量伴随着磁化的测量，磁致伸缩和磁化通常由单独制备的器件测量，同时努力观察样品的相同区域。由于难以补偿和校准，磁致伸缩的测量是困难的。低温区域的磁致伸缩系数值无法正确确定。通过将X射线衍射测量的磁致伸缩方法与磁X射线衍射的测量方法结合起来，可以在样品的同一区域同时测量磁致伸缩和磁化的方便方法。作为来自样品的磁场的函数的观察到的X射线衍射强度可以分离成对称分量和不对称分量，其分别包含与磁致伸缩和磁化成正比的信号。

9. 发明申请

US20100141936A1 OPTICAL DEFECT INSPECTION APPARATUS 有权
标题翻译：光学缺陷检测装置
公开(公告)号：US20100141936A1
公开(公告)日：2010-06-10
申请号：US12705031
申请日：2010-02-12
申请人： Noriyuki AIZAWA , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takahashi , Yusuke Miyazaki , Shingo Tanaka
发明人： Noriyuki AIZAWA , Hiroyuki Kawakami , Kazuhiro Zama , Kazuo Takahashi , Yusuke Miyazaki , Shingo Tanaka
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/94 , G01N2021/9513 , G01N2021/95676 , H01L22/12
摘要： A laser beam oscillated from a laser source is folded in its path by first and second plane mirrors and enters a beam expander. The surface of each plane mirror is deteriorated with illumination by the laser beam and the reflectance is reduced. To avoid a light quantity of the laser beam entering the beam expander from being reduced below a reference value, when the laser beam is illuminated over a certain time, a position on each of the first and second plane mirrors at which the laser beam is illuminated is changed by a structure for rotating and/or translating a reflecting surface of each plane mirror on a plane, which includes the plane mirror, while an optical axis is kept same. Thus, the useful life of each plane mirror can be prolonged without displacing the optical axis.
摘要翻译：从激光源振荡的激光束在其路径中被第一和第二平面镜折叠并进入光束扩展器。每个平面镜的表面由激光照射而劣化，反射率降低。为了避免进入光束扩展器的激光束的光量减小到低于参考值，当在一定时间内照射激光束时，激光束被照亮的第一和第二平面镜中的每一个上的位置通过用于在包括平面镜的平面上旋转和/或平移每个平面镜的反射表面的结构改变，同时光轴保持相同。因此，可以延长每个平面镜的使用寿命而不移动光轴。

10. 发明申请

US20100013469A1 Method and Device for Simultaneous Measurement of Magnetostriction and Magnetization 有权
标题翻译：用于同时测量磁致伸缩和磁化的方法和装置
公开(公告)号：US20100013469A1
公开(公告)日：2010-01-21
申请号：US11887265
申请日：2005-11-24
申请人： Etsuo Arakawa , Noriyuki Aizawa , Koichi Maruyama
发明人： Etsuo Arakawa , Noriyuki Aizawa , Koichi Maruyama
IPC分类号： G01R33/02
CPC分类号： G01N23/20 , G01R33/16
摘要： Since a measurement of a magnetostriction is accompanied by a measurement of a magnetization of a sample to be measured, the magnetostriction and the magnetization are measured by separately prepared devices, with efforts for observing the coextensive volumes of the sample. Measurements of the magnetostriction and the magnetization are difficult due to the difficulty of correction and calibration. The value of macroscopic external mode magnetostrictive coefficient cannot be correctly determined at low temperature regions. A convenient method which enables the measurement of the magnetostriction and the magnetization simultaneously at the coextensive volumes of the sample, is developed by combining the method of the measurement of the magnetostriction by an X-ray diffraction method an the method of the X-ray magnetic diffraction method. This method comprises the steps of measuring the relative diffraction intensity change (δ) at ascending magnetic field and the descending magnetic field respectively in the magnetic field at the coextensive volumes of the sample, obtaining asymmetry component δA and symmetry component δS of the magnetic field (H) from the measured relative intensity change (δ) in the magnetic field at said volumes of said sample, obtaining magnetostrictive coefficient (δ100) at said volumes of the sample based on said asymmetry component (δS), and obtains relative magnetization (M/Ms) at said volumes of said sample based on the value (R′a) obtained by recomposing said asymmetry component (δA) and symmetry component (δS). This method is advantageous for calibration of devices, when using the condition wherein the microscopic value of crystallographical magnetostrictive coefficient measured by X-rays corresponds to the macroscopic value of external magnetostrictive coefficient.
摘要翻译：由于磁致伸缩的测量伴随着要测量的样品的磁化的测量，所以通过分别制备的器件测量磁致伸缩和磁化，同时努力观察样品的共同扩展体积。由于校正和校准的困难，磁致伸缩和磁化的测量是困难的。宏观外部磁致伸缩系数的值在低温区域无法正确确定。通过将X射线衍射法的磁致伸缩测量方法与X射线磁场的方法结合起来，开发出能够在样品共同体积下同时测量磁致伸缩和磁化的方便方法衍射法。该方法包括以下步骤：在样品的共同体积的磁场中分别测量上升磁场和下降磁场的相对衍射强度变化（delta），获得不对称分量δA和磁场的对称分量δS（ H）从所述样品的所述体积处的磁场中的测量的相对强度变化（delta）获得，基于所述不对称分量（deltaS）在样品的所述体积处获得磁致伸缩系数（Δ100），并获得相对磁化强度（M / Ms）基于通过重构所述不对称分量（deltaA）和对称分量（deltaS）而获得的值（R'a）的所述体积的所述样本。当使用其中通过X射线测量的结晶磁致伸缩系数的微观值对应于外部磁致伸缩系数的宏观值的条件时，该方法对于器件的校准是有利的。

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