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1. 发明申请

US20140288882A1 Processing Abnormality Detection Method and Processing Device 审中-公开
标题翻译：处理异常检测方法及处理装置
公开(公告)号：US20140288882A1
公开(公告)日：2014-09-25
申请号：US14126198
申请日：2012-06-25
申请人： Nobuaki Nakasu , Hideaki Onozuka
发明人： Nobuaki Nakasu , Hideaki Onozuka
IPC分类号： G01M13/00
CPC分类号： G01M13/00 , G05B19/4065 , G05B2219/37242 , G05B2219/37355 , G05B2219/50203
摘要： A cutting state quantity caused by processing, in which a cutting tool is rotated, is measured, cutting force components containing a fundamental and harmonics are extracted from a measured signal, a threshold for abnormality determination is calculated on the basis of harmonic ratios that are ratios between the fundamental and harmonics of the cutting force components, a cutting force is calculated from the extracted cutting force components, and an abnormality is determined on the basis of the calculated cutting force and the calculated threshold.
摘要翻译：测量由切割工具旋转的加工引起的切割状态量，从测量信号中提取包含基波和谐波的切割力分量，基于作为比率的谐波比计算异常判定的阈值在切削力分量的基波和谐波之间，根据所提取的切削力分量计算出切削力，根据计算出的切削力和计算出的阈值来确定异常。

2. 发明授权

US08035058B2 Apparatus for repairing circuit pattern and method for manufacturing display apparatus using the same 有权
标题翻译：用于修复电路图案的装置和使用该装置的显示装置的制造方法
公开(公告)号：US08035058B2
公开(公告)日：2011-10-11
申请号：US11143981
申请日：2005-06-03
申请人： Nobuaki Nakasu , Kaoru Yamada , Yuichiro Tanaka , Takeshi Arai , Hideyuki Honoki , Kazushi Yoshimura , Tetsuya Kawamura , Masanori Okawa
发明人： Nobuaki Nakasu , Kaoru Yamada , Yuichiro Tanaka , Takeshi Arai , Hideyuki Honoki , Kazushi Yoshimura , Tetsuya Kawamura , Masanori Okawa
IPC分类号： B23K26/36
CPC分类号： B23K26/34 , B23K26/32 , B23K2101/34 , B23K2101/36 , B23K2103/08 , B23K2103/50 , G02F1/1309 , H01L27/124 , H01L27/1259
摘要： A region surrounded by two gate wiring and two drain wiring includes pixels and when there is a defect of short-circuit in adjacent pixel electrodes, the short-circuited portion is removed by irradiating a laser via a mask having a transmission pattern, which corresponds to a pattern of the gate wiring, drain wiring and pixel electrodes in the short-circuited portion. The above short-circuited portion is identified and removed in comparison to a normal pattern, by use of information from an inspection apparatus, and the pattern defect formed on the substrate is automatically repaired. By applying the above method to a manufacturing process of display apparatus, in particular, to a resist pattern forming process, a display apparatus having a highly qualified display property may be achieved.
摘要翻译：由两个栅极布线和两个漏极布线包围的区域包括像素，并且当相邻像素电极中存在短路的缺陷时，通过经由具有透射图案的掩模照射激光来去除短路部分，该掩模对应于在短路部分中的栅极布线，漏极布线和像素电极的图案。通过使用来自检查装置的信息，与正常图案相比，识别和去除上述短路部分，并自动修复在基板上形成的图案缺陷。通过将上述方法应用于显示装置的制造工艺，特别是涉及抗蚀剂图案形成处理，可以实现具有高度合格的显示特性的显示装置。

3. 发明申请

US20100062182A1 Method for Repairing Display Device and Apparatus for Same 有权
标题翻译：用于修理显示装置和装置的方法
公开(公告)号：US20100062182A1
公开(公告)日：2010-03-11
申请号：US12507826
申请日：2009-07-23
申请人： Takeshi ARAI , Nobuaki NAKASU , Tadao EDAMURA , Noriyuki OROKU
发明人： Takeshi ARAI , Nobuaki NAKASU , Tadao EDAMURA , Noriyuki OROKU
IPC分类号： C23C16/44 , C23C16/00 , C23C16/52
CPC分类号： G02F1/1309
摘要： An object of the present invention is to provide a method for repairing a display device according to which a wide variety of regions can be repaired in various ways using various materials, as well as an apparatus for the same. The present invention provides a repairing apparatus for repairing a pattern defect on a surface of a substrate in a display device where an electronic circuit pattern having the above described pattern defect is formed, characterized by having a plasma irradiation means for repairing the above described pattern defect through local irradiation of a region including the above described pattern defect with plasma.
摘要翻译：本发明的目的是提供一种维修显示装置的方法，根据该方法可以使用各种材料以各种方式修复各种各样的区域，以及用于其的装置。本发明提供一种在具有上述图案缺陷的电子电路图案形成的显示装置中修复基板表面上的图形缺陷的修理装置，其特征在于具有用于修复上述图案缺陷的等离子体照射装置通过用等离子体局部照射包括上述图案缺陷的区域。

4. 发明申请

US20080313893A1 METHOD AND APPARATUS FOR MANUFACTURING ELECTRONIC CIRCUIT BOARD 有权
标题翻译：制造电子电路板的方法和装置
公开(公告)号：US20080313893A1
公开(公告)日：2008-12-25
申请号：US12136148
申请日：2008-06-10
申请人： Nobuaki Nakasu
发明人： Nobuaki Nakasu
IPC分类号： H05K3/00 , H05K3/36
CPC分类号： H01L27/12 , G02F1/136259 , G02F2001/136254 , H01L27/124 , H05K3/225 , Y10T29/49124 , Y10T29/49126 , Y10T29/49128 , Y10T29/49155 , Y10T29/49156 , Y10T29/515 , Y10T29/53004
摘要： A method for manufacturing an electronic circuit board which contains an electronic circuit on a main surface of a glass substrate according to the invention sequentially performs a step of electrically inspecting the main surface of the glass substrate on which the electronic circuit is formed, a step of specifying positions and defect types of defects on the main surface of the glass substrate, a step of calculating reference point coordinates on the main surface of the glass substrate and correcting the coordinates, a step of extracting respective defects from an image around the defects and specifying a defect to be corrected in the extracted defects by referring to a defect existing range registered in advance for each defect type, and a step of cutting the specified defect. By this method, a foreign material adhering to the glass substrate is not erroneously judged as short-circuit defect causing short-circuit on the electronic circuit, and only defect actually requiring correction can be removed.
摘要翻译：根据本发明的在玻璃基板的主表面上包含电子电路的电子电路板的制造方法依次进行电气检查形成有电子电路的玻璃基板的主面的工序，指定玻璃基板的主表面上的缺陷的位置和缺陷类型，计算玻璃基板的主表面上的参考点坐标并校正坐标的步骤，从缺陷周围的图像中提取各个缺陷并指定通过参照针对每种缺陷类型预先登记的缺陷存在范围来提取缺陷中的缺陷，以及切割指定缺陷的步骤。通过这种方法，附着在玻璃基板上的异物不会被错误地判定为在电子电路上导致短路的短路缺陷，并且仅能够消除实际需要校正的缺陷。

5. 发明授权

US09419490B2 Method for connecting wire material and twisted wire, and stator of electric motor or generator 有权
标题翻译：线材和绞线的连接方法，电动机或发电机的定子
公开(公告)号：US09419490B2
公开(公告)日：2016-08-16
申请号：US13992667
申请日：2011-11-11
申请人： Daiki Kajita , Nobuaki Nakasu , Hiroshi Hamano , Yoshimi Mori , Takeshi Matsuo
发明人： Daiki Kajita , Nobuaki Nakasu , Hiroshi Hamano , Yoshimi Mori , Takeshi Matsuo
IPC分类号： B23K20/00 , B23K20/10 , H02K3/50 , H01R43/02 , H02K15/00 , B23K31/02
CPC分类号： H02K3/50 , B23K20/10 , B23K31/02 , B23K2101/32 , B23K2101/38 , B23K2103/12 , H01R43/0207 , H02K15/0062 , H02K15/0075
摘要： The present invention is directed to connection technology for providing a sufficient connection strength in bonding a wire material and a twisted wire each having a large diameter when directly bonding the wire material, which is used for a stator of an electric motor and a generator, and the twisted wire serving as a lead wire by ultrasonic bonding. A twisted wire having a plurality of core wires is hardened by ultrasonic vibration using a pressurized vibration tool when the twisted wire is connected to a wire material. After that, the twisted wire is reversed such that the hardened surface thereof faces the wire material and then comes into contact with the wire material. In this state, ultrasonic waves are applied to the hardened surface from the opposite side using the vibration tool, thereby connecting the hardened surface of the twisted wire and the wire material.
摘要翻译：本发明涉及用于在直接接合用于电动机和发电机的定子的线材的线材和各自具有大直径的绞合线时提供足够的连接强度的连接技术，以及双绞线通过超声波接合作为引线。当绞线与线材连接时，使用加压振动工具通过超声振动来硬化具有多根芯线的绞线。之后，扭绞线反转，使得其硬化表面面向线材，然后与线材接触。在这种状态下，使用振动工具从相对侧向硬化面施加超声波，由此连接绞合线的硬化面和线材。

6. 发明申请

US20140123740A1 Working Abnormality Detecting Device and Working Abnormality Detecting Method for Machine Tool 审中-公开
标题翻译：机床工作异常检测装置及工作异常检测方法
公开(公告)号：US20140123740A1
公开(公告)日：2014-05-08
申请号：US14124142
申请日：2012-05-07
申请人： Takehisa Yoshikawa , Hideaki Onozuka , Nobuaki Nakasu
发明人： Takehisa Yoshikawa , Hideaki Onozuka , Nobuaki Nakasu
IPC分类号： G01N19/08
CPC分类号： G01N19/08 , B23Q17/0961 , G05B19/406 , G05B2219/50197
摘要： Provided are a device and a method which determine a threshold value for detecting abnormality in a working path in which the cutting condition changes momentarily to thereby enable abnormality determination. Cutting force that becomes an abnormality determination value and threshold value information are previously calculated by cutting simulation, and a threshold value with which a comparison is to be made is determined from the position coordinates of a working machine which have been acquired during cutting and the measurement result of cutting force to thereby enable abnormality determination.
摘要翻译：提供一种确定用于检测切割条件瞬间变化的工作路径中的异常的阈值的装置和方法，从而能够进行异常判定。通过切割模拟预先计算成为异常判定值和阈值信息的切削力，根据在切削和测量中获取的作业机械的位置坐标来确定要进行比较的阈值从而能够进行异常判定。

7. 发明申请

US20100302360A1 DEFECT CORRECTING METHOD AND DEFECT CORRECTING DEVICE FOR AN ELECTRONIC CIRCUIT PATTERN 有权
标题翻译：电子电路图的缺陷修正方法和缺陷修正装置
公开(公告)号：US20100302360A1
公开(公告)日：2010-12-02
申请号：US12784936
申请日：2010-05-21
申请人： Takeshi Arai , Nobuaki Nakasu
发明人： Takeshi Arai , Nobuaki Nakasu
IPC分类号： H04N7/18 , H01L21/66
CPC分类号： H01L22/20 , G01N21/9501 , G01N21/956 , G01N2021/9513 , G01R31/309 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： Provided is a defect correcting device for an electronic circuit pattern, which is capable of making a defect seed obvious, and normalizing a pixel or forming a pixel into a semi-black spot. A defect correcting device for an electronic circuit pattern includes: an imaging unit for irradiating a defective portion of the electronic circuit pattern with irradiation light having a wavelength of a visible light region and a wavelength of an infrared light region, and receiving reflected light having the wavelength of the visible light region and the wavelength of the infrared light region from the electronic circuit pattern; a signal processing unit for extracting the defective portion from a picked-up image, and determining a correcting method; a laser irradiating unit for irradiating the defective portion with laser light; and a correction determining unit for determining success or failure of defect correction before and after laser irradiation.
摘要翻译：提供一种电子电路图案的缺陷校正装置，其能够使缺陷种子变得明显，并且将像素归一化或形成像素到半黑点。一种用于电子电路图案的缺陷校正装置，包括：成像单元，用于用具有可见光区域的波长和红外光区域的波长的照射光照射电子电路图案的缺陷部分，并且接收具有可见光区域的波长和来自电子电路图案的红外光区域的波长; 信号处理单元，用于从拾取图像中提取缺陷部分，并确定校正方法; 激光照射单元，用于用激光照射该缺陷部分; 以及校正确定单元，用于确定在激光照射之前和之后的缺陷校正的成败。

8. 发明授权

US09063356B2 Method for repairing display device and apparatus for same 有权
标题翻译：维修显示装置及其装置的方法
公开(公告)号：US09063356B2
公开(公告)日：2015-06-23
申请号：US12507826
申请日：2009-07-23
申请人： Takeshi Arai , Nobuaki Nakasu , Tadao Edamura , Noriyuki Oroku
发明人： Takeshi Arai , Nobuaki Nakasu , Tadao Edamura , Noriyuki Oroku
IPC分类号： C23C16/44 , C23C16/00 , C23C16/52 , G02F1/13
CPC分类号： G02F1/1309
摘要： An object of the present invention is to provide a method for repairing a display device according to which a wide variety of regions can be repaired in various ways using various materials, as well as an apparatus for the same. The present invention provides a repairing apparatus for repairing a pattern defect on a surface of a substrate in a display device where an electronic circuit pattern having the above described pattern defect is formed, characterized by having a plasma irradiation means for repairing the above described pattern defect through local irradiation of a region including the above described pattern defect with plasma.
摘要翻译：本发明的目的是提供一种维修显示装置的方法，根据该方法可以使用各种材料以各种方式修复各种各样的区域，以及用于其的装置。本发明提供一种在具有上述图案缺陷的电子电路图案形成的显示装置中修复基板表面上的图形缺陷的修理装置，其特征在于具有用于修复上述图案缺陷的等离子体照射装置通过用等离子体局部照射包括上述图案缺陷的区域。

9. 发明申请

US20090196978A1 METHOD FOR REPAIRING PATTERN DEFECT ON ELECTRONIC CIRCUIT AND APPARATUS THEREFOR 有权
标题翻译：用于修复电子电路图形缺陷的方法及其设备
公开(公告)号：US20090196978A1
公开(公告)日：2009-08-06
申请号：US12359405
申请日：2009-01-26
申请人： Nobuaki NAKASU , Tadao Edamura , Hirofumi Sunaoshi , Takemi Igeta , Kazuhiro Fukuchi
发明人： Nobuaki NAKASU , Tadao Edamura , Hirofumi Sunaoshi , Takemi Igeta , Kazuhiro Fukuchi
IPC分类号： C23C16/52 , B05C11/00
CPC分类号： H05K3/225 , G02F1/136259 , G02F2203/69 , H01L27/124 , H05K1/0269 , H05K3/0008 , H05K2203/0126 , H05K2203/013
摘要： The pattern defect repairing apparatus comprises an application head, a waste ejection board, a waste ejection vessel, a waste ejection board moving stage, a head lifting stage, and an application unit base. The application head comprises an ink-jet head and a head holder. An ink jet head has an ejection nozzle, and is attached to the head holder and able to be moved up and down by the head lifting stage. The waste ejection vessel is provided to the waste ejection board and able to be moved between a waste ejection position and a retreated position by the waste ejection board moving stage. Repairing material is ejected for waste onto the waste ejection board set in the vicinity of the nozzle immediately before application to repair the defect. The tip end of the nozzle is prevented from being dried.
摘要翻译：图案缺陷修复装置包括应用头，废弃排出板，废弃排出容器，废弃排出板移动台，头部提升台以及应用单元基座。应用头包括喷墨头和头架。喷墨头具有喷射嘴，并且附接到头部保持器并且能够通过头部提升台上下移动。废弃物排出容器设置在废弃物排出板上，能够通过废弃排出板移动台在废弃物排出位置和退避位置之间移动。修理材料在应用前立即将废料排出到设置在喷嘴附近的废弃物排出板上，以修复缺陷。防止喷嘴的前端被干燥。

10. 发明申请

US20060065645A1 Apparatus for repairing circuit pattern and method for manufacturing display apparatus using the same 有权
标题翻译：用于修复电路图案的装置和使用该装置的显示装置的制造方法
公开(公告)号：US20060065645A1
公开(公告)日：2006-03-30
申请号：US11143981
申请日：2005-06-03
申请人： Nobuaki Nakasu , Kaoru Yamada , Yuichiro Tanaka , Takeshi Arai , Hideyuki Honoki , Kazushi Yoshimura , Tetsuya Kawamura , Masanori Okawa
发明人： Nobuaki Nakasu , Kaoru Yamada , Yuichiro Tanaka , Takeshi Arai , Hideyuki Honoki , Kazushi Yoshimura , Tetsuya Kawamura , Masanori Okawa
IPC分类号： B23K26/36 , B23K26/03 , B23K26/06
CPC分类号： B23K26/34 , B23K26/32 , B23K2101/34 , B23K2101/36 , B23K2103/08 , B23K2103/50 , G02F1/1309 , H01L27/124 , H01L27/1259
摘要： A region surrounded by two gate wiring and two drain wiring includes pixels and when there is a defect of short-circuit in adjacent pixel electrodes, the short-circuited portion is removed by irradiating a laser via a mask having a transmission pattern, which corresponds to a pattern of the gate wiring, drain wiring and pixel electrodes in the short-circuited portion. The above short-circuited portion is identified and removed in comparison to a normal pattern, by use of information from an inspection apparatus, and the pattern defect formed on the substrate is automatically repaired. By applying the above method to a manufacturing process of display apparatus, in particular, to a resist pattern forming process, a display apparatus having a highly qualified display property may be achieved.
摘要翻译：由两个栅极布线和两个漏极布线包围的区域包括像素，并且当相邻像素电极中存在短路的缺陷时，通过经由具有透射图案的掩模照射激光来去除短路部分，该掩模对应于在短路部分中的栅极布线，漏极布线和像素电极的图案。通过使用来自检查装置的信息，与正常图案相比，识别和去除上述短路部分，并自动修复在基板上形成的图案缺陷。通过将上述方法应用于显示装置的制造工艺，特别是涉及抗蚀剂图案形成处理，可以实现具有高度合格的显示特性的显示装置。

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