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    • 2. 发明授权
    • Scalable wafer inspection
    • 可扩展晶圆检查
    • US06770862B1
    • 2004-08-03
    • US10628627
    • 2003-07-28
    • Dragos MaciucaNatale M. Ceglio
    • Dragos MaciucaNatale M. Ceglio
    • H01L2700
    • G01N21/956G01N21/9501
    • An imaging system for detecting defects on a substrate. Sensor module ports are disposed on an imaging platform. Sensor modules are removably connected to the sensor module ports, and are adapted to sense swaths on the surface of the substrate. Each of the sensor modules includes a time domain integration sensor, optics, an analog controller, and a digital controller. The time domain integration sensor optically senses the swath. The optics focus light from the swath on the time domain integration sensor. The analog controller receives signals from the time domain integration sensor and provides data signals. The digital controller receives the data signals, integrates the data signals into an image of the swath, and provides the image as digital signals to the sensor module port. A master controller receives the digital signals, composites them into a single image of a desired portion of the surface of the substrate, and detects defects within the image. A stage moves the substrate under the sensor modules under the control of the master controller, until the desired portion of the surface of the substrate has been imaged.
    • 一种用于检测衬底上的缺陷的成像系统。 传感器模块端口设置在成像平台上。 传感器模块可拆卸地连接到传感器模块端口,并且适于感测衬底表面上的条纹。 每个传感器模块包括时域积分传感器,光学器件,模拟控制器和数字控制器。 时域积分传感器光学感测条纹。 光学器件将来自条纹的光线聚焦在时域集成传感器上。 模拟控制器从时域积分传感器接收信号并提供数据信号。 数字控制器接收数据信号,将数据信号整合成幅的图像,并将图像作为数字信号提供给传感器模块端口。 主控制器接收数字信号,将它们复合到衬底表面的所需部分的单个图像中,并且检测图像内的缺陷。 在主控制器的控制下,台架将传感器模块下方的基板移动,直到基片表面的所需部分成像。
    • 7. 发明授权
    • Source-collector module with GIC mirror and LPP EUV light source
    • 源集电极模块采用GIC镜和LPP EUV光源
    • US09057962B2
    • 2015-06-16
    • US13691804
    • 2012-12-02
    • Natale M. CeglioGiovanni NocerinoFabio Zocchi
    • Natale M. CeglioGiovanni NocerinoFabio Zocchi
    • G03F7/20G21K1/06
    • G03F7/70033G03F7/2004G21K1/067G21K2201/064
    • A source-collector module for an extreme ultraviolet (EUV) lithography system, the module including a laser-produced plasma (LPP) that generates EUV radiation and a grazing-incidence collector (GIC) mirror arranged relative thereto and having an input end and an output end. The LPP is formed using an LPP target system wherein a pulsed laser beam travels on-axis through the GIC and is incident upon solid, moveable LPP target. The GIC mirror is arranged relative to the LPP to receive the EUV radiation therefrom at its input end and focus the received EUV radiation at an intermediate focus adjacent the output end. An example GIC mirror design is presented that includes a polynomial surface-figure correction to compensate for GIC shell thickness effects, thereby improve far-field imaging performance.
    • 一种用于极紫外(EUV)光刻系统的源极收集器模块,该模块包括产生EUV辐射的激光产生等离子体(LPP)和相对于其放置的放射入射收集器(GIC)反射镜,并且具有输入端和 输出端。 LPP使用LPP目标系统形成,其中脉冲激光束在轴上行进通过GIC并入射到固体,可移动的LPP靶上。 GIC反射镜相对于LPP布置,以在其输入端接收EUV辐射,并将接收的EUV辐射聚焦在邻近输出端的中间焦点。 提出了一个示例GIC镜面设计,其中包括一个多项式曲面图校正,以补偿GIC外壳厚度效应,从而提高远场成像性能。
    • 9. 发明授权
    • EUV collector system with enhanced EUV radiation collection
    • 具有增强的EUV辐射收集的EUV收集器系统
    • US08587768B2
    • 2013-11-19
    • US13065008
    • 2011-03-11
    • Natale M. CeglioGopal Vasudevan
    • Natale M. CeglioGopal Vasudevan
    • G02B5/10G03B27/42G03B27/54G03B27/72
    • G03F7/70008G02B5/0891G02B5/10G02B5/208G02B27/0927G02B27/0983G03F7/70033G03F7/70166G03F7/70175
    • A collector system for extreme ultraviolet (EUV) radiation includes a collector mirror and a radiation-collection enhancement device (RCED) arranged adjacent an aperture member of an illuminator. The collector mirror directs EUV radiation from an EUV radiation source towards the aperture member. The RCED redirects a portion of the EUV radiation that would not otherwise pass through the aperture of the aperture member or that would not have an optimum angular distribution, to pass through the aperture and to have an improved angular distribution better suited to input specifications of an illuminator. This provides the illuminator with greater amount of useable EUV radiation than would otherwise be available from the collector mirror alone, thereby enhancing the performing of an EUV lithography system that uses such a collector system with a RCED.
    • 用于极紫外(EUV)辐射的收集器系统包括与照明器的孔径构件相邻布置的收集器反射镜和辐射收集增强装置(RCED)。 收集器镜将EUV辐射源的EUV辐射引导到孔径构件。 RCED将EUV辐射的一部分重新定向,否则这些辐射将不会通过孔径构件的孔径或不具有最佳角度分布,以通过孔径并且具有更好地适于输入规格的角度分布 照明器 这为照明器提供了比单独从收集器镜可能获得的更大量的可用的EUV辐射,从而增强了使用具有RCED的这种收集器系统的EUV光刻系统的执行。