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    • 6. 发明申请
    • LASER PULSE PICKING EMPLOYING CONTROLLED AOM LOADING
    • 激光脉冲采集控制的AOM装载
    • WO2005006422A1
    • 2005-01-20
    • PCT/US2004/014013
    • 2004-05-05
    • ELECTRO SCIENTIFIC INDUSTRIES, INCSUN, YunlongNILSEN, Brady, E.HEMENWAY, David, M.SUN, Lei
    • SUN, YunlongNILSEN, Brady, E.HEMENWAY, David, M.SUN, Lei
    • H01L21/268
    • B23K26/06
    • A laser (126) and an AOM (10) are pulsed at substantially regular and substantially similar constant high repetition rates to provide working laser outputs (40) with variable noimpingement intervals (50) without sacrificing laser pulse-to-pulse energy stability. When a working laser output (40) is demanded, an RF pulse (38) is applied to the AOM (10) in coincidence with the laser output pulse (24) to transmit the laser pulse to a target. When no working laser output (40) is demanded, an RF pulse (38) is applied to the AOM (10) in noncoincidence with the laser output (24), so that the laser pulse is blocked. Thus, the average thermal loading on the AOM (10) remains substantially constant regardless of how randomly the working laser outputs (40) are demanded. The AOM (10) can also be employed to control the energy of the working laser output (40) by controlling the power of the RF pulse (38) applied. When the RF power is changed, the duration (44) of the RF pulse (38) is modified to maintain the constant average RF power.
    • 激光器(126)和AOM(10)以基本上规则和基本上类似的恒定高重复率脉冲,以提供具有可变打击间隔(50)的工作激光输出(40),而不牺牲激光脉冲对脉冲能量的稳定性。 当要求工作的激光输出(40)时,与激光输出脉冲(24)一致地向AOM(10)施加RF脉冲(38),以将激光脉冲传输到目标。 当不需要工作的激光输出(40)时,将RF脉冲(38)以与激光输出(24)不一致的方式施加到AOM(10),使得激光脉冲被阻挡。 因此,无论工作激光输出(40)如何随机地要求,AOM(10)上的平均热负载保持基本恒定。 AOM(10)也可用于通过控制施加的RF脉冲(38)的功率来控制工作激光输出(40)的能量。 当RF功率改变时,改变RF脉冲(38)的持续时间(44)以保持恒定的平均RF功率。
    • 7. 发明申请
    • SYSTEMS AND METHODS FOR DISTINGUISHING REFLECTIONS OF MULTIPLE LASER BEAMS FOR CALIBRATION FOR SEMICONDUCTOR STRUCTURE PROCESSING
    • 用于确定用于半导体结构处理校准的多个激光束反射的系统和方法
    • WO2008019252A1
    • 2008-02-14
    • PCT/US2007/074773
    • 2007-07-30
    • ELECTRO SCIENTIFIC INDUSTRIES, INC.LO, Ho WaiHEMENWAY, David MartinNILSEN, BradyBRULAND, Kelly J.
    • LO, Ho WaiHEMENWAY, David MartinNILSEN, BradyBRULAND, Kelly J.
    • H01L21/66H01L21/82
    • H01L23/5258G11C17/14G11C17/143H01L2924/0002H01L2924/00
    • A system (700A, 700B, 800) determines relative positions of a semiconductor substrate (240) and a plurality of laser beam spots on or within the semiconductor substrate (240) in a machine for selectively irradiating structures on or within the substrate using a plurality of laser beams. The system (700A, 700B, 800) comprises a laser source (220, 720), first and second laser beam propagation paths, first and second reflection sensors (798, 853), and a processor (680). The laser source (220, 720) produces at least the first and second laser beams, which propagate toward the substrate along the first and second propagation paths, respectively, which have respective first and second axes that intersects the substrate at respective first and second spots. The reflection sensors (798, 853) are positioned to detect reflection of the spots, as the spots moves relative to the substrate, thereby generating reflection signals. The processor (680) is configured to determine, based on the reflection signals, positions of the spots on or within the substrate (240).
    • 系统(700A,700B,800)确定半导体衬底(240)中的多个激光束斑点和半导体衬底(240)内的多个激光束斑点在机器中的相对位置,用于使用多个 的激光束。 系统(700A,700B,800)包括激光源(220,720),第一和第二激光束传播路径,第一和第二反射传感器(798,853)以及处理器(680)。 所述激光源(220,720)至少产生所述第一和第二激光束,所述第一和第二激光束分别沿着所述第一和第二传播路径传播到所述衬底,所述第一和第二激光束具有相应的第一和第二轴线,所述第一和第二轴线在相应的第一和第二点 。 当反射传感器(798,853)相对于基板移动时,反射传感器(798,853)被定位成检测光斑的反射,从而产生反射信号。 处理器(680)被配置为基于反射信号确定衬底(240)上或衬底(240)内的点的位置。