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1. 发明授权

US07847921B2 Microlithographic exposure method as well as a projection exposure system for carrying out the method 有权
标题翻译：微光刻曝光方法以及用于实施该方法的投影曝光系统
公开(公告)号：US07847921B2
公开(公告)日：2010-12-07
申请号：US12177715
申请日：2008-07-22
申请人： Toralf Gruner , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
发明人： Toralf Gruner , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
IPC分类号： G03B27/72 , G03B27/54
CPC分类号： G03F7/70566 , G03F7/70108 , G03F7/70225 , G03F7/70308
摘要： In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.
摘要翻译：在用于曝光布置在投影物镜的像面的区域中的基板以及用于执行该方法的投影曝光系统中的曝光方法中，产生了指向基板并具有输出偏振态的输出辐射。通过借助于至少一个偏振操纵装置对输出偏振状态的可变调节，输出偏振状态可以形成为接近标称输出偏振状态。可以在基于偏振光学测量数据的控制回路中进行极化处理。

2. 发明申请

US20120153189A1 OPTICAL SYSTEM FOR GENERATING A LIGHT BEAM FOR TREATING A SUBSTRATE 审中-公开
标题翻译：用于产生用于处理基板的光束的光学系统
公开(公告)号：US20120153189A1
公开(公告)日：2012-06-21
申请号：US13352725
申请日：2012-01-18
申请人： Johannes Wangler , Michael Layh , Markus Zenzinger , Holger Muenz
发明人： Johannes Wangler , Michael Layh , Markus Zenzinger , Holger Muenz
IPC分类号： B01J19/12
CPC分类号： G02B27/0927 , B23K26/0608 , B23K26/0676 , B23K26/0732 , B23K26/0738
摘要： An optical system for generating a light beam for treating a substrate arranged in a substrate plane is disclosed. The optical system includes first and second optical arrangements.
摘要翻译：公开了一种用于产生用于处理布置在基板平面中的基板的光束的光学系统。光学系统包括第一和第二光学装置。

3. 发明申请

US20110069296A1 MICROLITHOGRAPHIC EXPOSURE METHOD AS WELL AS A PROJECTION EXPOSURE SYSTEM FOR CARRYING OUT THE METHOD 有权
标题翻译：作为实施方法的投影曝光系统的微观曝光方法
公开(公告)号：US20110069296A1
公开(公告)日：2011-03-24
申请号：US12946380
申请日：2010-11-15
申请人： Toralf GRUNER , Daniel KRAEHMER , Michael TOTZECK , Johannes WANGLER , Markus BROTSACK , Nils DIECKMANN , Aksel GOEHNERMEIER , Markus SCHWAB , Damian FIOLKA , Markus ZENZINGER
发明人： Toralf GRUNER , Daniel KRAEHMER , Michael TOTZECK , Johannes WANGLER , Markus BROTSACK , Nils DIECKMANN , Aksel GOEHNERMEIER , Markus SCHWAB , Damian FIOLKA , Markus ZENZINGER
IPC分类号： G03B27/72
CPC分类号： G03F7/70566 , G03F7/70108 , G03F7/70225 , G03F7/70308
摘要： In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.
摘要翻译：在用于曝光布置在投影物镜的像面的区域中的基板以及用于执行该方法的投影曝光系统中的曝光方法中，产生了指向基板并具有输出偏振态的输出辐射。通过借助于至少一个偏振操纵装置对输出偏振状态的可变调节，输出偏振状态可以形成为接近标称输出偏振状态。可以在基于偏振光学测量数据的控制回路中进行极化处理。

4. 发明申请

US20050146704A1 Microlithographic exposure method as well as a projection exposure system for carrying out the method 有权
标题翻译：微光刻曝光方法以及用于实施该方法的投影曝光系统
公开(公告)号：US20050146704A1
公开(公告)日：2005-07-07
申请号：US10949396
申请日：2004-09-27
申请人： Toralf Gruner , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
发明人： Toralf Gruner , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
IPC分类号： G03F7/20 , G03B27/72
CPC分类号： G03F7/70566 , G03F7/70108 , G03F7/70225 , G03F7/70308
摘要： In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.
摘要翻译：在用于曝光布置在投影物镜的像面的区域中的基板以及用于执行该方法的投影曝光系统中的曝光方法中，产生了指向基板并具有输出偏振态的输出辐射。通过借助于至少一个偏振操纵装置对输出偏振状态的可变调节，输出偏振状态可以形成为接近标称输出偏振状态。可以在基于偏振光学测量数据的控制回路中进行极化处理。

5. 发明授权

US08767181B2 Microlithographic exposure method as well as a projection exposure system for carrying out the method 有权
标题翻译：微光刻曝光方法以及用于实施该方法的投影曝光系统
公开(公告)号：US08767181B2
公开(公告)日：2014-07-01
申请号：US12946380
申请日：2010-11-15
申请人： Toralf Gruner , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
发明人： Toralf Gruner , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
IPC分类号： G03B27/72 , G03B27/54 , G03F7/20
CPC分类号： G03F7/70566 , G03F7/70108 , G03F7/70225 , G03F7/70308
摘要： In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.
摘要翻译：在用于曝光布置在投影物镜的像面的区域中的基板以及用于执行该方法的投影曝光系统中的曝光方法中，产生了指向基板并具有输出偏振态的输出辐射。通过借助于至少一个偏振操纵装置对输出偏振状态的可变调节，输出偏振状态可以形成为接近标称输出偏振状态。可以在基于偏振光学测量数据的控制回路中进行极化处理。

6. 发明申请

US20090040496A1 MICROLITHOGRAPHIC EXPOSURE METHOD AS WELL AS A PROJECTION EXPOSURE SYSTEM FOR CARRYING OUT THE METHOD 有权
标题翻译：作为实施方法的投影曝光系统的微观曝光方法
公开(公告)号：US20090040496A1
公开(公告)日：2009-02-12
申请号：US12177715
申请日：2008-07-22
申请人： Toralf GRUNER , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
发明人： Toralf GRUNER , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
IPC分类号： G03B27/72
CPC分类号： G03F7/70566 , G03F7/70108 , G03F7/70225 , G03F7/70308
摘要： In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.
摘要翻译：在用于曝光布置在投影物镜的像面的区域中的基板以及用于执行该方法的投影曝光系统中的曝光方法中，产生了指向基板并具有输出偏振态的输出辐射。通过借助于至少一个偏振操纵装置对输出偏振状态的可变调节，输出偏振状态可以形成为接近标称输出偏振状态。可以在基于偏振光学测量数据的控制回路中进行极化处理。

7. 发明授权

US07408616B2 Microlithographic exposure method as well as a projection exposure system for carrying out the method 有权
标题翻译：微光刻曝光方法以及用于实施该方法的投影曝光系统
公开(公告)号：US07408616B2
公开(公告)日：2008-08-05
申请号：US10949396
申请日：2004-09-27
申请人： Toralf Gruner , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
发明人： Toralf Gruner , Daniel Kraehmer , Michael Totzeck , Johannes Wangler , Markus Brotsack , Nils Dieckmann , Aksel Goehnermeier , Markus Schwab , Damian Fiolka , Markus Zenzinger
IPC分类号： G03B27/42
CPC分类号： G03F7/70566 , G03F7/70108 , G03F7/70225 , G03F7/70308
摘要： In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.
摘要翻译：在用于曝光布置在投影物镜的像面的区域中的基板以及用于执行该方法的投影曝光系统中的曝光方法中，产生了指向基板并具有输出偏振态的输出辐射。通过借助于至少一个偏振操纵装置对输出偏振状态的可变调节，输出偏振状态可以形成为接近标称输出偏振状态。可以在基于偏振光学测量数据的控制回路中进行极化处理。

8. 发明申请

US20070263199A1 Illumination System for a Microlithography Projection Exposure Installation 审中-公开
标题翻译：用于微光刻投影曝光安装的照明系统
公开(公告)号：US20070263199A1
公开(公告)日：2007-11-15
申请号：US10590700
申请日：2005-02-24
申请人： Damian Fiolka , Markus Zenzinger
发明人： Damian Fiolka , Markus Zenzinger
IPC分类号： G03B27/72 , G02B5/30
CPC分类号： G03F7/70566
摘要： An illumination system for a microlithography projection exposure installation for illuminating an illumination field (7) with the light of an assigned light source (10) has at least one polarization compensator (11) in a pupil plane (23) of the illumination system. The latter can be used for the at least partial compensation of a polarization change introduced by elements (5) that change polarization as a function of angle. For the purpose of location-dependent polarization change, the polarization compensator (11) has polarization changing means that can be designed as birefringent elements or elements having a birefringent structure. The transmission properties of the microlithography projection exposure installation can be enhanced by such a polarization compensation, particularly when use is made of a subsequent projection objective with a physical beam splitter.
摘要翻译：用于用指定的光源（10）的光照射照明场（7）的微光刻投影曝光装置的照明系统在照明系统的光瞳平面（23）中具有至少一个偏振补偿器（11）。后者可用于至少部分补偿通过改变作为角度的函数的偏振的元件（5）引入的偏振变化。为了位置偏振改变的目的，偏振补偿器（11）具有可被设计为具有双折射结构的双折射元件或元件的偏振改变装置。通过这种极化补偿可以增强微光刻投影曝光装置的透射特性，特别是当使用具有物理分束器的后续投影物镜时。

9. 发明申请

US20060204204A1 Method for improving the optical polarization properties of a microlithographic projection exposure apparatus 审中-公开
标题翻译：一种用于改善微光刻投影曝光装置的光学偏振特性的方法
公开(公告)号：US20060204204A1
公开(公告)日：2006-09-14
申请号：US11311513
申请日：2005-12-19
申请人： Markus Zenzinger , Damian Fiolka
发明人： Markus Zenzinger , Damian Fiolka
IPC分类号： G02B6/00
CPC分类号： G02B27/28 , G03F7/70258 , G03F7/70566
摘要： An apparatus and method for improving the optical polarisation properties of a microlithographic projection exposure apparatus is disclosed. The method including a first step of providing a mounted optical system of the projection exposure apparatus, which contains a plurality of optical elements; a second step identifying those optical elements that perturb the optical polarisation properties in the mounted optical system to an extent that exceeds a limit value predetermined for the respective optical element; and, a third step implementing measures to improve the optical polarisation properties, which relate to the optical elements identified in the second step.
摘要翻译：公开了一种用于改善微光刻投影曝光装置的光学偏振特性的装置和方法。该方法包括提供包含多个光学元件的投影曝光装置的安装光学系统的第一步骤; 第二步骤，将在所安装的光学系统中扰动光学偏振特性的那些光学元件识别为超过对于各个光学元件预定的极限值的程度; 以及实现与第二步骤中识别的光学元件相关的改善光学偏振特性的措施的第三步骤。

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