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1. 发明授权

US08418100B2 Robust scan synthesis for protecting soft errors 有权
标题翻译：用于保护软错误的强大的扫描合成
公开(公告)号：US08418100B2
公开(公告)日：2013-04-09
申请号：US13416529
申请日：2012-03-09
申请人： Laung-Terng Wang , Nur A. Touba , Shianling Wu , Ravi Apte
发明人： Laung-Terng Wang , Nur A. Touba , Shianling Wu , Ravi Apte
IPC分类号： G06F17/50
CPC分类号： G01R31/318544 , G01R31/31816 , G06F17/505 , G06F2217/14
摘要： A method for performing robust scan synthesis for soft-error protection on a design for generating a robust scan design in a system is modeled selectively at a register-transfer level (RTL) or a gate level; the design includes at least a sequential element or a scan cell for mapping to a robust scan cell of a select robust scan cell type. The method comprises performing a scan replacement and a scan stitching on the design database based on a given control information file for synthesizing the robust scan cell on the design database; and generating the synthesized robust scan design at a pre-determined RTL or a pre-determined gate level.
摘要翻译：用于在用于在系统中生成鲁棒扫描设计的设计上进行软错误保护的鲁棒扫描合成的方法在寄存器传送级（RTL）或门级选择性地建模; 该设计至少包括用于映射到选择鲁棒扫描单元类型的鲁棒扫描单元的顺序元件或扫描单元。该方法包括基于用于在设计数据库上合成鲁棒扫描单元的给定控制信息文件在设计数据库上执行扫描替换和扫描缝合; 并以预定的RTL或预定的门级产生合成的鲁棒扫描设计。

2. 发明授权

US08335954B2 Method and apparatus for low-pin-count scan compression 失效
标题翻译：低引脚数扫描压缩的方法和装置
公开(公告)号：US08335954B2
公开(公告)日：2012-12-18
申请号：US13529686
申请日：2012-06-21
申请人： Nur A. Touba , Laung-Terng Wang , Shianling Wu
发明人： Nur A. Touba , Laung-Terng Wang , Shianling Wu
IPC分类号： G01R31/28
CPC分类号： G01R31/318547
摘要： A low-pin-count scan compression method and apparatus for reducing test data volume and test application time in a scan-based integrated circuit. The scan-based integrated circuit contains one or more scan chains, each scan chain comprising one or more scan cells coupled in series. The method and apparatus includes a programmable pipelined decompressor comprising one or more shift registers, a combinational logic network, and an optional scan connector. The programmable pipelined decompressor decompresses a compressed scan pattern on its compressed scan inputs and drives the generated decompressed scan pattern at the output of the programmable pipelined decompressor to the scan data inputs of the scan-based integrated circuit. Any input constraints imposed by said_combinational logic network are incorporated into an automatic test pattern generation (ATPG) program for generating the compressed scan pattern for one or more selected faults in one-step.
摘要翻译：一种用于减少测试数据量并在基于扫描的集成电路中测试应用时间的低引脚数扫描压缩方法和装置。基于扫描的集成电路包含一个或多个扫描链，每个扫描链包括串联耦合的一个或多个扫描单元。该方法和装置包括可编程流水线解压缩器，其包括一个或多个移位寄存器，组合逻辑网络和可选的扫描连接器。可编程流水线解压缩器在其压缩扫描输入端解压缩压缩扫描模式，并将可编程流水线解压缩器的输出端上产生的解压缩扫描模式驱动到基于扫描的集成电路的扫描数据输入。由所述_combinational逻辑网络施加的任何输入约束被并入自动测试模式生成（ATPG）程序中，用于一步地生成针对一个或多个所选故障的压缩扫描模式。

3. 发明授权

US08230282B2 Method and apparatus for low-pin-count scan compression 有权
标题翻译：低引脚数扫描压缩的方法和装置
公开(公告)号：US08230282B2
公开(公告)日：2012-07-24
申请号：US13172046
申请日：2011-06-29
申请人： Nur A. Touba , Laung-Terng Wang , Zhigang Jiang , Shianling Wu , Jianping Yan
发明人： Nur A. Touba , Laung-Terng Wang , Zhigang Jiang , Shianling Wu , Jianping Yan
IPC分类号： G01R31/28
CPC分类号： G01R31/318547
摘要： A low-pin-count scan compression method and apparatus for reducing test data volume and test application time in a scan-based integrated circuit. The scan-based integrated circuit contains one or more scan chains, each scan chain comprising one or more scan cells coupled in series. The method and apparatus includes a programmable pipelined decompressor comprising one or more shift registers, a combinational logic network, and an optional scan connector. The programmable pipelined decompressor decompresses a compressed scan pattern on its compressed scan inputs and drives the generated decompressed scan pattern at the output of the programmable pipelined decompressor to the scan data inputs of the scan-based integrated circuit. Any input constraints imposed by said combinational logic network are incorporated into an automatic test pattern generation (ATPG) program for generating the compressed scan pattern for one or more selected faults in one-step.
摘要翻译：一种用于减少测试数据量并在基于扫描的集成电路中测试应用时间的低引脚数扫描压缩方法和装置。基于扫描的集成电路包含一个或多个扫描链，每个扫描链包括串联耦合的一个或多个扫描单元。该方法和装置包括可编程流水线解压缩器，其包括一个或多个移位寄存器，组合逻辑网络和可选的扫描连接器。可编程流水线解压缩器在其压缩扫描输入端解压缩压缩扫描模式，并将可编程流水线解压缩器的输出端上产生的解压缩扫描模式驱动到基于扫描的集成电路的扫描数据输入。由所述组合逻辑网络施加的任何输入约束被并入自动测试模式生成（ATPG）程序中，用于一步地生成针对一个或多个选定故障的压缩扫描模式。

4. 发明申请

US20120110402A1 METHOD AND APPARATUS FOR TESTING 3D INTEGRATED CIRCUITS 失效
标题翻译：用于测试3D集成电路的方法和装置
公开(公告)号：US20120110402A1
公开(公告)日：2012-05-03
申请号：US13222130
申请日：2011-08-31
申请人： Laung-Terng Wang , Nur Touba , Michael S. Hsiao , Shianling Wu , Zhigang Jiang
发明人： Laung-Terng Wang , Nur Touba , Michael S. Hsiao , Shianling Wu , Zhigang Jiang
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/318558 , G01R31/318572
摘要： A method and apparatus for testing a scan-based 3D integrated circuit (3DIC) using time-division demultiplexing/multiplexing allowing for high-data-rate scan patterns applied at input/output pads converting into low-data-rate scan patterns applied to each embeddded module in the 3DIC. A set of 3D design guidelines is proposed to reduce the number of test times and the number of through-silicon vias (TSVs) required for both pre-bond testing and post-bond testing. The technique allows reuse of scan patterns developed for pre-bond testing of each die (layer) for post-bond testing of the whole 3DIC. It further reduces test application time without concerns for I/O pad count limit and risks for fault coverage loss.
摘要翻译：一种使用时分解复用/复用来测试基于扫描的3D集成电路（3DIC）的方法和装置，其允许在输入/输出焊盘处施加的高数据速率扫描图案转换为应用于每个的低数据速率扫描模式嵌入模块在3DIC。提出了一套3D设计指南，以减少测试次数和预键测试和后绑定测试所需的硅通孔数（TSV）。该技术允许重新开发用于每个管芯（层）的前绑定测试的扫描模式，用于整个3DIC的后绑定测试。它进一步减少测试应用时间，而不用担心I / O焊盘计数限制和故障覆盖损失的风险。

5. 发明授权

US08091002B2 Multiple-capture DFT system to reduce peak capture power during self-test or scan test 失效
标题翻译：多捕捉DFT系统，可在自检或扫描测试期间降低峰值捕获能力
公开(公告)号：US08091002B2
公开(公告)日：2012-01-03
申请号：US12797302
申请日：2010-06-09
申请人： Laung-Terng Wang , Shianling Wu , Zhigang Jiang , Jinsong Liu , Hao-Jan Chao , Lizhen Yu , Feifei Zhao , Fangfang Li , Jianping Yan
发明人： Laung-Terng Wang , Shianling Wu , Zhigang Jiang , Jinsong Liu , Hao-Jan Chao , Lizhen Yu , Feifei Zhao , Fangfang Li , Jianping Yan
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/31704 , G01R31/318552 , G01R31/318594
摘要： A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.
摘要翻译：一种用于提供有序捕获时钟的方法，用于检测或定位N个时钟域内的故障，以及在扫描测试或自检模式下跨过集成电路或电路组件中的任何两个时钟域的故障，其中N> 1，每个时钟域具有一个捕获时钟和多个扫描单元，每个捕获时钟包括多个捕获时钟脉冲; 所述方法包括：（a）在移入操作期间，在所述集成电路或电路组件中的所述N个时钟域内产生和移入N个测试刺激; （b）将所述捕获时钟的有序序列应用于所述N个时钟域内的所有所述扫描单元，所述捕获时钟的有序序列包括至少多个捕获时钟脉冲，所述捕获时钟脉冲以两个或更多个选定的捕获时钟以顺序排列，使得在捕获操作期间，所有时钟域不会同时触发; 和（c）分析所有所述扫描单元的输出响应以定位其中的任何故障。

6. 发明申请

US20100138709A1 METHOD AND APPARATUS FOR DELAY FAULT COVERAGE ENHANCEMENT 审中-公开
标题翻译：延迟故障覆盖增强的方法和装置
公开(公告)号：US20100138709A1
公开(公告)日：2010-06-03
申请号：US12554437
申请日：2009-09-04
申请人： Laung-Terng WANG , Michael S. Hsiao , Hao-Jan Chao , Zhigang Jiang , Shianling Wu , Jianping Yan
发明人： Laung-Terng WANG , Michael S. Hsiao , Hao-Jan Chao , Zhigang Jiang , Shianling Wu , Jianping Yan
IPC分类号： G01R31/3177 , G06F11/27
CPC分类号： G01R31/318552
摘要： A hybrid clocking scheme for simultaneously detecting a b-cycle path-delay fault in a b-cycle (false) path and a c-cycle path-delay fault in a c-cycle (false) path using at least n+1 at-speed clock pulses during a capture operation in a clock domain in a scan design or a scan-based BIST design, where 1
摘要翻译：一种用于同时检测b周期（假）路径中的b周期路径延迟故障和c周期（假）路径中的c周期路径延迟故障的混合时钟方案，其使用至少n + 1 at- 在扫描设计或基于扫描的BIST设计中的时钟域中的捕获操作期间，速度时钟脉冲，其中1 <= b <= c <= n。扫描设计或BIST设计包括多个扫描链，每个扫描链包括串联耦合的多个扫描单元。该设计包括一个或多个时钟域，每个时钟域以其预期的工作频率或速度运行。混合时钟方案包括至少一个速率移位时钟脉冲或一个在速捕获时钟脉冲，紧接着在捕获操作期间至少两个速度捕捉时钟脉冲，以同时检测b周期路径延迟故障，以及时钟域内的c循环路径延迟故障。

7. 发明授权

US07451371B2 Multiple-capture DFT system for scan-based integrated circuits 失效
标题翻译：用于基于扫描的集成电路的多捕捉DFT系统
公开(公告)号：US07451371B2
公开(公告)日：2008-11-11
申请号：US11151258
申请日：2005-06-14
申请人： Laung-Terng Wang , Xiaoqing Wen
发明人： Laung-Terng Wang , Xiaoqing Wen
IPC分类号： G01R31/28
CPC分类号： G01R31/318594 , G01R31/31704 , G01R31/318552 , G01R31/31858
摘要： A method and apparatus for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in a scan-based integrated circuit or circuit assembly in self-test or scan-test mode, where N>1 and each domain has a plurality of scan cells. The method and apparatus will apply an ordered sequence of capture clocks to all scan cells within N clock domains where one or more capture clocks must contain one or more shift clock pulses during the capture operation. A computer-aided design (CAD) method is further developed to realize the method and synthesize the apparatus. In order to further improve the circuit's fault coverage, a CAD method and apparatus are further developed to minimize the memory usage and generate scan patterns for full-scan and feed-forward partial-scan designs containing transparent storage cells, asynchronous set/reset signals, tri-state busses, and low-power gated clocks.
摘要翻译：一种用于提供有序捕获时钟以检测或定位N个时钟域内的故障的方法和装置，以及在自检或扫描测试模式中跨过基于扫描的集成电路或电路组件中的任何两个时钟域的故障，其中N≥1和每个域具有多个扫描单元。该方法和装置将对N个时钟域内的所有扫描单元应用有序序列的捕获时钟，其中一个或多个捕获时钟在捕获操作期间必须包含一个或多个移位时钟脉冲。进一步开发了计算机辅助设计（CAD）方法，实现了该方法并综合了该装置。为了进一步改善电路的故障覆盖范围，进一步开发了一种CAD方法和装置，以最小化存储器使用并产生包含透明存储单元，异步设置/复位信号的全扫描和前馈部分扫描设计的扫描模式，三态总线和低功率门控时钟。

8. 发明授权

US07434126B2 Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faults 有权
标题翻译：计算机辅助设计（CAD）多捕获DFT系统，用于检测或定位跨时钟域故障
公开(公告)号：US07434126B2
公开(公告)日：2008-10-07
申请号：US11806098
申请日：2007-05-30
申请人： Laung-Terng Wang , Po-Ching Hsu , Xiaoqing Wen
发明人： Laung-Terng Wang , Po-Ching Hsu , Xiaoqing Wen
IPC分类号： G01R31/28 , G06F17/50
CPC分类号： G06F17/5022 , G01R31/31704 , G01R31/318552 , G01R31/318594 , G06F17/5031 , G06F17/505
摘要： A method and apparatus for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in self-test or scan-test mode, where N>1 and each domain has a plurality of scan cells. The method and apparatus allows generating and loading N pseudorandom or predetermined stimuli to all the scan cells within the N clock domains in the integrated circuit or circuit assembly during the shift operation, applying an ordered sequence of capture clocks to all the scan cells within the N clock domains during the capture operation, compacting or comparing N output responses of all the scan cells for analysis during the compact/compare operation, and repeating the above process until a predetermined limiting criteria is reached. A computer-aided design (CAD) system is further developed to realize the method and synthesize the apparatus.
摘要翻译：一种用于提供有序捕获时钟以检测或定位N个时钟域内的故障的故障，以及跨越自检或扫描测试模式的集成电路或电路组件中的任何两个时钟域的故障，其中N≥1且每个域具有多个扫描单元。该方法和装置允许在移位操作期间将N个伪随机数或预定刺激生成并加载到集成电路或电路组件中的N个时钟域内的所有扫描单元，向N中的所有扫描单元应用捕获时钟的有序序列捕获操作期间的时钟域，压缩或比较所有扫描单元的N个输出响应，以便在紧凑/比较操作期间进行分析，并重复上述处理，直到达到预定的限制标准。进一步开发了计算机辅助设计（CAD）系统来实现该方法并综合了该装置。

9. 发明申请

US20070255988A1 Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faults 有权
标题翻译：计算机辅助设计（CAD）多捕获DFT系统，用于检测或定位跨时钟域故障
公开(公告)号：US20070255988A1
公开(公告)日：2007-11-01
申请号：US11806098
申请日：2007-05-30
申请人： Laung-Terng Wang , Po-Ching Hsu , Xiaoqing Wen
发明人： Laung-Terng Wang , Po-Ching Hsu , Xiaoqing Wen
IPC分类号： G01R31/28
CPC分类号： G06F17/5022 , G01R31/31704 , G01R31/318552 , G01R31/318594 , G06F17/5031 , G06F17/505
摘要： A method and apparatus for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in self-test or scan-test mode, where N>1 and each domain has a plurality of scan cells. The method and apparatus allows generating and loading N pseudorandom or predetermined stimuli to all the scan cells within the N clock domains in the integrated circuit or circuit assembly during the shift operation, applying an ordered sequence of capture clocks to all the scan cells within the N clock domains during the capture operation, compacting or comparing N output responses of all the scan cells for analysis during the compact/compare operation, and repeating the above process until a predetermined limiting criteria is reached. A computer-aided design (CAD) system is further developed to realize the method and synthesize the apparatus.
摘要翻译：一种用于提供有序捕获时钟以检测或定位N个时钟域内的故障的故障，以及跨越自检或扫描测试模式的集成电路或电路组件中的任何两个时钟域的故障，其中N≥1且每个域具有多个扫描单元。该方法和装置允许在移位操作期间将N个伪随机数或预定刺激生成并加载到集成电路或电路组件中的N个时钟域内的所有扫描单元，向N中的所有扫描单元应用捕获时钟的有序序列捕获操作期间的时钟域，压缩或比较所有扫描单元的N个输出响应，以便在紧凑/比较操作期间进行分析，并重复上述处理，直到达到预定的限制标准。进一步开发了计算机辅助设计（CAD）系统来实现该方法并综合了该装置。

10. 发明申请

US20050262409A1 Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits 有权
标题翻译：智能捕获ATPG（自动测试模式生成）和基于扫描的集成电路的故障模拟
公开(公告)号：US20050262409A1
公开(公告)日：2005-11-24
申请号：US10850460
申请日：2004-05-21
申请人： Laung-Terng Wang , Khader Abdel-Hafez , Xiaoqing Wen , Boryau Sheu , Shun-Miin Wang
发明人： Laung-Terng Wang , Khader Abdel-Hafez , Xiaoqing Wen , Boryau Sheu , Shun-Miin Wang
IPC分类号： G01R31/28 , G01R31/30 , G01R31/3183 , G01R31/3185 , G06F11/00
CPC分类号： G01R31/318594 , G01R31/3008 , G01R31/318342 , G01R31/318364 , G01R31/318563
摘要： A method for generating stimuli and test responses for testing faults in a scan-based integrated circuit in a selected scan-test mode or a selected self-test mode, the scan-based integrated circuit containing a plurality of scan chains, N clock domains, and C cross-clock domain blocks, each scan chain comprising multiple scan cells coupled in series, each clock domain having one capture clock, each cross-clock domain block comprising a combinational logic network. The method comprises compiling the scan-based integrated circuit into a sequential circuit model; specifying input constraints on the scan-based integrated circuit during a shift and capture operation; specifying a clock grouping to map the N clock domains into G clock domain groups, where N>G>1; transforming the sequential circuit model into an equivalent combinational circuit model according to the input constraints and the clock grouping; and generating the stimuli and test responses on the equivalent combinational circuit model according to the input constraints.
摘要翻译：一种用于产生用于以选定的扫描测试模式或选定的自测模式测试基于扫描的集成电路中的故障的刺激和测试响应的方法，所述基于扫描的集成电路包含多个扫描链，N个时钟域，和C个跨时钟域块，每个扫描链包括串联耦合的多个扫描单元，每个时钟域具有一个捕获时钟，每个交叉时钟域块包括组合逻辑网络。该方法包括将基于扫描的集成电路编译成顺序电路模型; 在移位和捕获操作期间指定基于扫描的集成电路的输入约束; 指定时钟分组以将N个时钟域映射到G个时钟域组，其中N> G> 1; 根据输入约束和时钟分组将顺序电路模型转换为等效组合电路模型; 并根据输入约束在等效组合电路模型上产生刺激和测试响应。

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