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1. 发明申请

US20060176410A1 IC card 审中-公开
标题翻译： IC卡
公开(公告)号：US20060176410A1
公开(公告)日：2006-08-10
申请号：US11366737
申请日：2006-03-03
申请人： Masaki Nose , Junji Tomita , Tomohisa Shingai , Fumio Yamagishi , Kenzo Nishide , Shigeru Hashimoto , Yoshiyasu Sugimura , Yoshikazu Yabe , Futoshi Kisuno , Takahiro Hirano
发明人： Masaki Nose , Junji Tomita , Tomohisa Shingai , Fumio Yamagishi , Kenzo Nishide , Shigeru Hashimoto , Yoshiyasu Sugimura , Yoshikazu Yabe , Futoshi Kisuno , Takahiro Hirano
IPC分类号： G02F1/13 , G02F1/1347
CPC分类号： G06K19/07749 , G02F1/13473 , G02F1/13718 , G02F2001/13478 , G06K19/077 , G06K19/07703 , G06K19/07769 , G09G3/18 , G09G2310/0254 , G09G2310/06
摘要： In an IC card, cholesteric liquid crystal layers reflecting red light and a cholesteric liquid crystal layer reflecting blue light, in a planar state, are laminated, and a voltage is respectively applied to the laminated cholesteric liquid crystal layers, to change the orientation of the cholesteric liquid crystals between the planar state and a focal conic state, so as to transmit or reflect light, thereby displaying predetermined information.
摘要翻译：在IC卡中，叠层反射红光的胆甾醇型液晶层和反射蓝色光的胆甾型液晶层，分别向层叠的胆甾醇型液晶层施加电压，以改变在平面状态和焦点锥形状态之间的胆甾型液晶，以便透射或反射光，从而显示预定信息。

2. 发明申请

US20060198629A1 DISPLAY ELEMENT, METHOD OF DRIVING DISPLAY ELEMENT AND PORTABLE DISPLAY DEVICE 审中-公开
标题翻译：显示元件，驱动显示元件和便携式显示器件的方法
公开(公告)号：US20060198629A1
公开(公告)日：2006-09-07
申请号：US11276499
申请日：2006-03-02
申请人： Junji Tomita , Masaki Nose , Tomohisa Shingai , Fumio Yamagishi , Shigeru Hashimoto , Yoshiyasu Sugimura , Yoshikazu Yabe , Futoshi Kisuno , Takahiro Hirano , Kenzo Nishide , Shunji Baba
发明人： Junji Tomita , Masaki Nose , Tomohisa Shingai , Fumio Yamagishi , Shigeru Hashimoto , Yoshiyasu Sugimura , Yoshikazu Yabe , Futoshi Kisuno , Takahiro Hirano , Kenzo Nishide , Shunji Baba
IPC分类号： G03B19/00
CPC分类号： G02F1/13394 , G02F1/1339 , G02F1/1341 , G02F1/134327 , G02F1/13718 , G06K19/0723 , G06K19/077 , G06K19/07703 , G06K19/07749 , G09G3/3614 , G09G3/3629 , G09G2300/0486 , G09G2310/06 , H01Q1/2225 , H01Q1/248
摘要： It is an object of the present invention to improve mechanical durability of a portable display device using cholesteric liquid crystal with a memory function such as a non-contact IC card. A display element comprising two substrates 1 which oppose each other and a display portion (liquid crystal) 2 which is sandwiched by the substrates 1, comprises a wall structure 3 bearing a substrate on portions other than the display portion 2, in which the wall is perpendicular to the substrate 1 and a surface perpendicular to the wall is adhered to the substrate 1. Further, in the above display element, an area of the surface which is adhered to the substrate 1 is larger than an area of a surface of the display portion 2 which faces the substrate 1.
摘要翻译：本发明的目的是提高使用具有诸如非接触式IC卡等记忆功能的胆甾型液晶的便携式显示装置的机械耐久性。包括彼此相对的两个基板1和由基板1夹持的显示部分（液晶）2的显示元件包括：壁结构3，其在除显示部分2之外的部分上承载基板，其中壁是垂直于基板1的垂直于壁的表面粘附到基板1.此外，在上述显示元件中，附着到基板1的表面的面积大于显示器的表面的面积面向基板1的部分2。

3. 发明授权

US06522159B1 Short-circuit failure analyzing method and apparatus 失效
标题翻译：短路故障分析方法及装置
公开(公告)号：US06522159B1
公开(公告)日：2003-02-18
申请号：US09644216
申请日：2000-08-23
申请人： Kenzo Nishide
发明人： Kenzo Nishide
IPC分类号： G01R3128
CPC分类号： G01R31/3008
摘要： A setting of a logical state in an integrated circuit is changed, a plurality of measurement patterns which are used in a quiescent power source current test of the integrated circuit are formed, an internal state value 0/1 of each net at the time when the measurement patterns are supplied by a simulation of the integrated circuit is derived, and further, a pass or fail test result is obtained every measurement pattern by the quiescent power source current test in which a plurality of measurement patterns were supplied to the integrated circuit determined to be a defective device. A state value variable in which the internal state values of all measurement patterns have been stored every net and a test result variable in which the pass or fail test result has been stored every measurement pattern are formed on the basis of those measurement patterns, internal state values, and test results. A combination of the state value variable of each net and the test result variable are compared between the nets, thereby discriminating a short-circuit failure position in the integrated circuit.
摘要翻译：在集成电路中的逻辑状态的设置被改变时，形成在集成电路的静态电源电流测试中使用的多个测量模式，在每个网络的内部状态值0/1 通过导出集成电路的仿真来提供测量图案，并且通过静态电源电流测试获得每个测量图案的通过或失败测试结果，其中多个测量图案被提供给被确定为成为有缺陷的设备。根据这些测量模式，内部状态形成状态值变量，其中已经存储了每个网络的所有测量图案的内部状态值以及每个测量模式存储了通过或失败测试结果的测试结果变量值和测试结果。在网络之间比较每个网络的状态值变量和测试结果变量的组合，从而区分集成电路中的短路故障位置。

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