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    • 1. 发明申请
    • PROJECTION TYPE IMAGE DISPLAY APPARATUS
    • 投影类型图像显示设备
    • US20100020395A1
    • 2010-01-28
    • US12506883
    • 2009-07-21
    • Norihiro WATANABEAtsushi MichimoriKazuo KadowakiTakumi Kijima
    • Norihiro WATANABEAtsushi MichimoriKazuo KadowakiTakumi Kijima
    • G03B21/60G02B27/48
    • G03B21/60G02B3/08G02B5/02G02B27/48Y10T156/10
    • A projection type image display apparatus includes an optical engine that emits a light according to image signal, a Fresnel lens on which the light emitted by the optical engine is incident and emitting the light as a parallel light, and a diffusion member that diffuses the parallel light emitted by the Fresnel lens. The projection type image display apparatus further includes a driving unit that moves the Fresnel lens or the diffusion member in a plane parallel to an emitting surface of the Fresnel lens or the diffusion member, a frame the supports the Fresnel lens, the diffusion member and the driving unit, a resilient supporting body that supports a weight of the Fresnel lens or the diffusion member with respect to the frame, and a holding unit that holds the Fresnel lens or the diffusion member so as to be movable in the plane parallel to the emitting surface of the Fresnel lens or the diffusion member.
    • 投射型图像显示装置包括:根据图像信号发射光的光学引擎,由光学引擎发射的光入射到其上并将光作为平行光发射的菲涅耳透镜;以及扩散部件, 菲涅尔透镜发出的光。 投影型图像显示装置还包括驱动单元,该驱动单元使菲涅尔透镜或扩散构件在平行于菲涅尔透镜或扩散构件的发射表面的平面内移动,框架支撑菲涅尔透镜,扩散构件和 驱动单元,支撑相对于框架的菲涅耳透镜或扩散构件的重量的弹性支撑体,以及保持单元,其保持菲涅耳透镜或扩散构件,以便能够平行于发射区域的平面中移动 菲涅尔透镜或漫射构件的表面。
    • 3. 发明申请
    • REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY
    • 反射掩蔽空白用于EUV LITHOGRAPHY
    • US20080182183A1
    • 2008-07-31
    • US12028250
    • 2008-02-08
    • Kazuyuki HayashiKazuo KadowakiTakashi Sugiyama
    • Kazuyuki HayashiKazuo KadowakiTakashi Sugiyama
    • G03F1/00G03F7/26
    • G03F1/24G03F1/46G03F1/58
    • To provide a reflective mask blank for EUV lithography having an absorber layer which has a low reflectance in a wavelength region of EUV light or light for inspection of a pattern and which is easy to control to have a desired layer composition and thickness.A reflective mask blank for EUV lithography, which comprises a substrate, and a reflective layer to reflect EUV light and an absorber layer to absorb EUV light, formed in this order on the substrate, wherein the absorber layer contains tantalum (Ta) and hafnium (Hf), and in the absorber layer, the content of Hf is from 20 to 60 at. % and the content of Ta is from 40 to 80 at. %, and wherein the absorber layer has a content of N being 0 to at most 35 at. %.
    • 为了提供EUV光刻用的反射掩模板,其具有在EUV光或光的波长区域具有低反射率的吸收层,用于检查图案,并且易于控制以具有期望的层组成和厚度。 用于EUV光刻的反射掩模板,其包括基板,以及反射层,用于反射EUV光和吸收层,以吸收在基板上依次形成的EUV光,其中吸收层包含钽(Ta)和铪( Hf),并且在吸收层中,Hf的含量为20〜60at。 %,Ta的含量为40〜80。 %,并且其中所述吸收层的N含量为0至至多35at。 %。
    • 5. 发明申请
    • COOLING DEVICE
    • 冷却装置
    • US20110225983A1
    • 2011-09-22
    • US13013115
    • 2011-01-25
    • Takashi KojimaTaisuke MurataKazuo Kadowaki
    • Takashi KojimaTaisuke MurataKazuo Kadowaki
    • F25B21/02
    • H01L23/38H01L23/427H01L2924/0002H01S5/02469H01L2924/00
    • An object of the present invention is to provide a cooling device that is easy to attach and that ensures intimate contact at a contact surface between a heat absorbing surface of a Peltier element and an object to be cooled and a contact surface between a heat radiating surface of the Peltier element and a cooling part. A cooling device according to the present invention includes a Peltier element having a heat absorbing surface and a heat radiating surface that are opposite each other; a heat absorbing plate having a first Peltier element attaching surface and located with the first Peltier element attaching surface facing the heat absorbing surface of the Peltier element; a heat radiating plate having a second Peltier element attaching surface and located with the second Peltier element attaching surface facing the heat radiating surface of the Peltier element; heat conducting members having viscosity or elasticity and provided between the heat absorbing surface and the first Peltier element attaching surface and between the heat radiating surface and the second Peltier element attaching surface; and a spacer provided between the heat absorbing plate and the heat radiating plate in parallel with the Peltier element and defining an opposing distance between the first and second Peltier element attaching surfaces.
    • 本发明的一个目的是提供一种容易附着并确保珀尔帖元件的吸热表面与待冷却物体之间的接触表面和与散热表面之间的接触表面的紧密接触的冷却装置 的珀耳帖元件和冷却部件。 根据本发明的冷却装置包括具有彼此相对的吸热表面和散热表面的珀耳帖元件; 吸热板,其具有第一珀耳帖元件安装表面,并且位于所述第一珀耳帖元件附接表面面对所述珀耳帖元件的吸热表面; 散热板,具有第二珀尔帖元件安装表面,并且位于与珀耳帖元件的散热表面相对的第二珀耳帖元件附接表面; 具有粘性或弹性的导热构件,设置在吸热面与第一珀耳帖元件安装面之间,散热面与第二珀耳帖元件安装面之间; 以及间隔件,其设置在所述吸热板和所述散热板之间,与所述珀耳帖元件平行并且限定所述第一和第二珀耳帖元件附接表面之间的相对距离。
    • 7. 发明授权
    • Reflective mask blank for EUV lithography
    • EUV光刻用反光罩
    • US07906259B2
    • 2011-03-15
    • US12205967
    • 2008-09-08
    • Kazuyuki HayashiKazuo KadowakiTakashi SugiyamaMasaki Mikami
    • Kazuyuki HayashiKazuo KadowakiTakashi SugiyamaMasaki Mikami
    • G03F1/00
    • G03F1/24B82Y10/00B82Y40/00G03F1/22
    • To provide a reflective mask blank for EUV lithography having an absorber layer, which presents a low reflectance to a light in the wavelength ranges of EUV light and pattern inspection light, and which is easily controlled to have desired film composition and film thickness. A reflective mask blank for EUV lithography, comprising a substrate, and a reflective layer for reflecting EUV light and an absorber layer for absorbing EUV light formed in this order on the substrate, wherein the absorber layer contains tantalum (Ta), boron (B), silicon (Si) and nitrogen (N), and in the absorber layer, the B content is at least 1 at % and less than 5 at %, the Si content is from 1 to 25 at %, and the compositional ratio of Ta to N (Ta:N) is from 8:1 to 1:1.
    • 为了提供具有吸收层的EUV光刻用的反射掩模板,其对EUV光和图案检查光的波长范围内的光呈现低反射率,并且易于控制以具有所需的膜组成和膜厚度。 一种用于EUV光刻的反射掩模板,包括基板和用于反射EUV光的反射层和用于吸收在基板上依次形成的EUV光的吸收层,其中吸收层包含钽(Ta),硼(B) ,硅(Si)和氮(N),并且在吸收层中,B含量为至少1原子%且小于5原子%,Si含量为1至25原子%,Ta的组成比 至N(Ta:N)为8:1至1:1。
    • 8. 发明授权
    • High reflectance mirror
    • 高反射镜
    • US07189460B2
    • 2007-03-13
    • US10875270
    • 2004-06-25
    • Naoko ShinTakuji OyamaKazuo Kadowaki
    • Naoko ShinTakuji OyamaKazuo Kadowaki
    • B32B9/00
    • G02B5/0858C23C14/024C23C14/086Y10T428/31678
    • A high reflectance mirror having a high reflectance in a visible-light region, being excellent in durability such as a moisture resistance, a saltwater resistance, etc. and having small dependence on incident angle (i.e., the fluctuation of the reflectance depending on an incident angle of light is little) is provided.The high reflectance mirror comprises a substrate and a silver film, a low refractive index film and a high refractive index film laminated on the substrate in this order wherein an adhesion improving film is formed on the silver film surface on the opposite side of the substrate, the extinction coefficient of the low refractive index film is at most 0.01, the extinction coefficient of the high refractive index film is at most 0.01, the adhesion improving film is an oxide film and the extinction coefficient of the adhesion improving film is at most 0.1.
    • 在可见光区域具有高反射率的高反射率反射镜,耐湿性,耐盐水性等耐久性优异并且对入射角的依赖性小(即,取决于事件的反射率的波动) 光的角度很小)。 高反射镜包括基板和基板上层叠有低折射率膜和高折射率膜的基板,在该基板的相反侧的银膜表面上形成有粘附改善膜, 低折射率膜的消光系数为0.01以下,高折射率膜的消光系数为0.01以下,粘合改善膜为氧化膜,粘合改善膜的消光系数为0.1以下。