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    • 6. 发明授权
    • Method of estimating a leakage current in a semiconductor device
    • 估计半导体器件中漏电流的方法
    • US08156460B2
    • 2012-04-10
    • US12547729
    • 2009-08-26
    • Kyung-Tae DoJung-Yun ChoiBong-Hyun LeeYoung-Hwan KimHyo-Sig WonWook Kim
    • Kyung-Tae DoJung-Yun ChoiBong-Hyun LeeYoung-Hwan KimHyo-Sig WonWook Kim
    • G06F17/50
    • G06F17/5036
    • In a method of estimating a leakage current in a semiconductor device, a chip including a plurality of cells is divided into segments by a grid model. Spatial correlation is determined as spatial correlation between process parameters concerned with the leakage currents in each of the cells. A virtual cell leakage characteristic function of a cell is generated by arithmetically operating actual leakage characteristic functions. A segment leakage characteristic function of a segment is generated by arithmetically operating the virtual cell leakage characteristic functions of all cells in the segment. Then, a full chip leakage characteristic function of the chip is generated by statistically operating the segment leakage characteristic functions of all segments in the chip. Accordingly, computational loads of Wilkinson's method for generating the full chip leakage characteristic function can remarkably be reduced.
    • 在估计半导体器件中的漏电流的方法中,包括多个单元的芯片通过栅格模型被划分为段。 空间相关性被确定为与每个单元中的泄漏电流有关的工艺参数之间的空间相关性。 通过算术运算实际泄漏特性函数产生单元的虚拟单元泄漏特性函数。 通过对片段中所有单元的虚拟单元泄漏特性函数进行算术运算,产生段的段泄漏特性函数。 然后,通过统计操作芯片中所有段的段泄漏特性函数来产生芯片的全芯片泄漏特性功能。 因此,Wilkinson用于产生全芯片泄漏特性功能的方法的计算负载可以显着降低。
    • 9. 发明申请
    • Method of Estimating a Leakage Current in a Semiconductor Device
    • 估算半导体器件中泄漏电流的方法
    • US20100058258A1
    • 2010-03-04
    • US12547729
    • 2009-08-26
    • Kyung Tae DoJung-Yun ChoiBong-Hyun LeeYoung-Hwan KimHyo-Sig WonWook Kim
    • Kyung Tae DoJung-Yun ChoiBong-Hyun LeeYoung-Hwan KimHyo-Sig WonWook Kim
    • G06F17/50
    • G06F17/5036
    • In a method of estimating a leakage current in semiconductor device, a chip including a plurality of cells is divided into segments by a grid model. Spatial correlation is determined as spatial correlation between process parameters concerned with the leakage currents in each of the cells. A virtual cell leakage characteristic function of the cell is generated by arithmetically operating actual leakage characteristic functions. A segment leakage characteristic function is generated by arithmetically operating the virtual cell leakage characteristic functions of each cell in the segment. Then, a full chip leakage characteristic function is generated by statistically operating the segment leakage characteristic functions of each segment in the chip. Accordingly, the computational loads of Wilkinson's method for generating the full chip leakage characteristic function may be remarkably reduced.
    • 在估计半导体器件中的漏电流的方法中,包括多个单元的芯片通过栅格模型被划分为段。 空间相关性被确定为与每个单元中的泄漏电流有关的工艺参数之间的空间相关性。 通过算术运算实际漏电特性函数产生单元的虚拟单元泄漏特性函数。 通过对片段中每个单元的虚拟单元泄漏特性函数进行算术运算来产生段泄漏特性函数。 然后,通过统计操作芯片中每个段的段泄漏特性函数来产生全片泄漏特性函数。 因此,威尔金森的用于产生全芯片泄漏特性函数的方法的计算量可以显着降低。