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    • 3. 发明申请
    • METHOD FOR PREPARING CERIUM CARBONATE POWDER
    • 制备碳酸钙粉末的方法
    • US20100148113A1
    • 2010-06-17
    • US12531452
    • 2008-03-14
    • Myoung-Hwan OhSeung-Beom ChoJun-Seok NhoJong-Pil KimJang-Yul Kim
    • Myoung-Hwan OhSeung-Beom ChoJun-Seok NhoJong-Pil KimJang-Yul Kim
    • C01F17/00C09K13/00
    • C01F17/005C01P2002/72
    • In a method for preparing cerium carbonate powder by mixing a cerium precursor solution with a urea solution and carrying out a precipitation reaction, wherein the cerium carbonate powder has a hexagonal crystal structure, by using at least one type of organic solvent as a solvent for either or both the cerium precursor solution and the urea solution, and adjusting temperature of the precipitation reaction within a range of 120° C. to 300° C. Also, the method can yield cerium carbonate powder, cerium oxide powder from the cerium carbonate powder, and CMP slurry including the cerium oxide powder as an abrasive. In the method, urea as a precipitant can improve the uniformity of a reaction, and thus it is possible to easily and inexpensively obtain cerium carbonate powder with a hexagonal crystal structure without the danger by high-temperature high-pressure and the need for an expensive system in hydrothermal synthesis.
    • 在通过将铈前体溶液与尿素溶液混合并进行沉淀反应制备碳酸铈粉末的方法中,其中所述碳酸铈粉末具有六方晶系结构,通过使用至少一种有机溶剂作为溶剂用于任一种 或铈前体溶液和尿素溶液两者,并将沉淀反应的温度调节在120℃至300℃的范围内。此外,该方法可以从碳酸铈粉末中得到碳酸铈粉末,氧化铈粉末, 和包括氧化铈粉末作为研磨剂的CMP浆料。 在该方法中,作为沉淀剂的尿素可以提高反应的均匀性,因此可以容易且廉价地获得六方晶系结构的碳酸铈粉末,而不会受到高温高压的危险,并且需要昂贵的 水热合成系统。
    • 10. 发明授权
    • CMP slurry and method for polishing semiconductor wafer using the same
    • CMP浆料和使用其的抛光半导体晶片的方法
    • US07736530B2
    • 2010-06-15
    • US11657051
    • 2007-01-24
    • Seung Beom ChoJong Pil KimJun Seok NhoMyoung Hwan OhJang Yul Kim
    • Seung Beom ChoJong Pil KimJun Seok NhoMyoung Hwan OhJang Yul Kim
    • C09K13/04
    • C09G1/02H01L21/3212
    • Disclosed is a CMP slurry in which a compound having a weight-average molecular weight of 30-500 and containing a hydroxyl group (OH), a carboxyl group (COOH), or both, is added to a CMP slurry comprising abrasive particles and water and having a first viscosity, so that the CMP slurry is controlled to have a second viscosity 5-30% lower than the first viscosity. Also disclosed is a method for polishing a semiconductor wafer using the CMP slurry. According to the disclosed invention, the agglomerated particle size of abrasive particles in the CMP slurry can be reduced, while the viscosity of the CMP slurry can be reduced and the global planarity of wafers upon polishing can be improved. Thus, the CMP slurry can be advantageously used in processes for manufacturing semiconductor devices requiring fine patterns and can improve the reliability and production of semiconductor devices through the use thereof in semiconductor processes.
    • 公开了一种CMP浆料,其中将包含重均分子量为30-500并含有羟基(OH),羧基(COOH)或二者)的化合物加入到包含磨料颗粒和水的CMP浆料中 并且具有第一粘度,使得CMP浆料被控制为具有比第一粘度低5-30%的第二粘度。 还公开了使用CMP浆料来研磨半导体晶片的方法。 根据所公开的发明,可以减少CMP浆料中的磨料颗粒的聚集粒度,同时可以减少CMP浆料的粘度,并且可以提高抛光时晶片的全局平面性。 因此,CMP浆料可以有利地用于制造需要精细图案的半导体器件的工艺中,并且可以通过其在半导体工艺中的使用来提高半导体器件的可靠性和生产。