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1. 发明授权

US07538333B1 Contactless charge measurement of product wafers and control of corona generation and deposition 失效
标题翻译：产品晶圆的非接触式电荷测量和电晕发生和沉积的控制
公开(公告)号：US07538333B1
公开(公告)日：2009-05-26
申请号：US11460517
申请日：2006-07-27
申请人： Amin Samsavar , John M. Schmidt , Rainer Schierle , Gregory S. Horner , Thomas G. Miller , Zhiwei Xu , Xiaofeng Hu , Jianou Shi , Sergio Edelstein
发明人： Amin Samsavar , John M. Schmidt , Rainer Schierle , Gregory S. Horner , Thomas G. Miller , Zhiwei Xu , Xiaofeng Hu , Jianou Shi , Sergio Edelstein
IPC分类号： H01J37/30 , H01J37/317 , G01R31/26
CPC分类号： G01R31/303 , G01R31/2831 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Systems and methods for determining a property of a specimen are provided. The specimen may be a product wafer. The method may include biasing a focused spot on the specimen. The method may also include measuring a parameter of a measurement spot on the specimen. The measurement spot may overlap the focused spot. In addition, the method may include determining the property of the specimen from the measured parameter. Systems and methods for varying the performance of a corona source are also provided. The method may include altering a property of the environment within the corona source. The property may include, but is not limited to, temperature, pressure, humidity, and/or partial pressure of a gas within the corona source.
摘要翻译：提供了用于确定样品性质的系统和方法。样品可以是产品晶片。该方法可以包括将聚焦斑点偏置在样本上。该方法还可以包括测量样品上的测量点的参数。测量点可能与聚焦点重叠。此外，该方法可以包括根据测量的参数确定样品的性质。还提供了用于改变电晕源的性能的系统和方法。该方法可以包括改变电晕源内的环境的属性。该性质可以包括但不限于电晕源内的气体的温度，压力，湿度和/或分压。

2. 发明授权

US5845983A Vehicle light mounting system 失效
标题翻译：车载灯系统
公开(公告)号：US5845983A
公开(公告)日：1998-12-08
申请号：US889214
申请日：1997-07-08
申请人： John M. Schmidt
发明人： John M. Schmidt
IPC分类号： B60Q1/04 , B60Q1/02
CPC分类号： B60Q1/0483
摘要： A light mounting system for a motor vehicle. The system includes a tubular light mounting member, and a vehicle light mount bracket that extends from the mounting member and that receives a vehicle light mounted thereto. A bumper mount bracket extends from the light mount member and facilitates mounting of the member to a vehicle bumper mount. The mounting member extends generally upwardly and inwardly from the vehicle bumper mount to minimize exposure of the mounting member to bumper contact forces, and to allow the vehicle lights to be mounted in close proximity to the vehicle driving surface to provide maximum illumination of the driving surface.
摘要翻译：一种汽车轻型安装系统。该系统包括管状灯安装构件和从安装构件延伸并接收安装在其上的车辆灯的车辆灯安装支架。保险杠安装支架从光安装构件延伸，并且便于将构件安装到车辆缓冲器安装座。安装构件从车辆保险杠安装座大致向上和向内延伸，以最小化安装构件对保险杠接触力的暴露，并允许车辆灯安装在车辆驱动表面附近以提供驱动表面的最大照明。

3. 发明授权

US08299416B2 High speed quantum efficiency measurement apparatus utilizing solid state lightsource 有权
标题翻译：利用固态光源的高速量子效率测量装置
公开(公告)号：US08299416B2
公开(公告)日：2012-10-30
申请号：US12660688
申请日：2010-03-01
申请人： Mark A. Arbore , David L Klein , Leonid A. Vasilyev , John M. Schmidt , James E. Hudson , Gregory S. Horner
发明人： Mark A. Arbore , David L Klein , Leonid A. Vasilyev , John M. Schmidt , James E. Hudson , Gregory S. Horner
IPC分类号： G01N21/64 , G01J1/58
CPC分类号： G01N21/55 , G01N21/59 , G01N2021/556 , G01N2201/0627 , G01N2201/0691 , H02S50/10
摘要： The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50 nm bandwidth, where a portion of the conditioned light source is monitored. Delivery optics are provided to direct the conditioned light to the DUT, a controller drives the conditioned light source in a time dependent operation, and at least one reflectance measurement assembly receives a portion of the conditioned light reflected from the DUT. A time-resolved measurement device includes a current measurement device and/or a voltage measurement device disposed to resolve a current and/or voltage generated in the DUT by each conditioned light source, where a sufficiently programmed computer determines and outputs a QE value for each DUT according to an incident intensity of at least one wavelength of from the conditioned light source and the time-resolved measurement.
摘要翻译：本发明提供了一种高速量子效率（QE）测量装置，其包括至少一个被测器件（DUT），至少一个具有小于50nm带宽的调节光源，其中调节光源的一部分是监控。提供输送光学器件以将经调节的光引导到DUT，控制器以时间相关的操作来驱动调节光源，并且至少一个反射测量组件接收从DUT反射的经调节的光的一部分。时间分辨的测量装置包括电流测量装置和/或电压测量装置，其被设置为通过每个调节光源来分辨在DUT中产生的电流和/或电压，其中充分编程的计算机确定并输出每个 DUT根据来自调节光源的至少一个波长的入射强度和时间分辨测量。

4. 发明授权

US08278937B2 High speed detection of shunt defects in photovoltaic and optoelectronic devices 有权
标题翻译：光电和光电器件分流缺陷的高速检测
公开(公告)号：US08278937B2
公开(公告)日：2012-10-02
申请号：US12658489
申请日：2010-02-08
申请人： Leonid A. Vasilyev , John M. Schmidt , James E. Hudson , Gregory S. Horner
发明人： Leonid A. Vasilyev , John M. Schmidt , James E. Hudson , Gregory S. Horner
IPC分类号： G01R31/02
CPC分类号： G01R31/2656 , G01N21/66 , H02S50/10
摘要： The current invention provides a shunt defect detection device that includes a device under test (DUT) that is fixedly held by a thermally isolating mount, a power source disposed to provide a directional bias condition to the DUT, a probe disposed to provide a localized power to the DUT from the power source, an emission detector disposed to measure a temporal emission from the DUT when in the directional bias condition, where the measured temporal emission is output as temporal data from the emission detector to a suitably programmed computer that uses the temporal data to determine a heating rate of the DUT and is disposed to estimate an overheat risk level of the DUT, where an output from the computer designates the DUT a pass status, an uncertain status, a fail status or a process to bin status according to the overheat risk level.
摘要翻译：本发明提供了一种并联缺陷检测装置，其包括由热隔离安装座固定地保持的被测器件（DUT），被设置为向DUT提供定向偏置状态的电源，设置成提供局部电源的探针从发射检测器输出到来自电源的DUT，发射检测器被设置成在定向偏置条件下测量来自DUT的时间发射，其中测量的时间发射作为时间数据从发射检测器输出到使用时间的适当编程的计算机数据以确定DUT的加热速率，并且被设置为估计DUT的过热风险水平，其中来自计算机的输出指定DUT通过状态，不确定状态，故障状态或根据过热风险等级。

5. 发明授权

US07719294B1 Systems configured to perform a non-contact method for determining a property of a specimen 有权
标题翻译：被配置为执行用于确定样本的属性的非接触方法的系统
公开(公告)号：US07719294B1
公开(公告)日：2010-05-18
申请号：US11460505
申请日：2006-07-27
申请人： Amin Samsavar , John M. Schmidt , Rainer Schierle , Gregory S. Horner , Thomas G. Miller , Zhiwei Xu , Xiaofeng Hu , Jianou Shi , Sergio Edelstein
发明人： Amin Samsavar , John M. Schmidt , Rainer Schierle , Gregory S. Horner , Thomas G. Miller , Zhiwei Xu , Xiaofeng Hu , Jianou Shi , Sergio Edelstein
IPC分类号： G01R31/26
CPC分类号： G01R31/303 , G01R31/2831 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Systems configured to perform a non-contact method for determining a property of a specimen are provided. One system configured to perform a non-contact method for determining a property of a specimen includes a focused biasing device configured to provide a stimulus to a focused spot on the specimen. The system also includes a sensor configured to measure a parameter of a measurement spot on the specimen. The measurement spot overlaps the focused spot. The system further includes a processor configured to determine the property of the specimen from the parameter.
摘要翻译：提供被配置为执行用于确定样本的属性的非接触方法的系统。被配置为执行用于确定样本的属性的非接触方法的一个系统包括被配置为向所述样本上的聚焦点提供刺激的聚焦偏置装置。该系统还包括被配置为测量样品上的测量点的参数的传感器。测量点与聚焦点重叠。该系统还包括处理器，该处理器被配置为根据该参数确定样本的属性。

6. 外观设计

USD421075S Recumbent total body exerciser 失效
公开(公告)号：USD421075S
公开(公告)日：2000-02-22
申请号：US94254
申请日：1998-09-29
申请人： Mark D. Hildebrandt , John M. Schmidt , Richard K. Gresens
设计人： Mark D. Hildebrandt , John M. Schmidt , Richard K. Gresens

7. 外观设计

USD309090S Handle for pocket blade 失效
公开(公告)号：USD309090S
公开(公告)日：1990-07-10
申请号：US70502
申请日：1987-07-06
申请人： John M. Schmidt , Richard J. Osemlak
设计人： John M. Schmidt , Richard J. Osemlak

8. 发明授权

US4862867A Arrow retainer for archery 失效
标题翻译：射箭的箭头保持架
公开(公告)号：US4862867A
公开(公告)日：1989-09-05
申请号：US11204
申请日：1987-02-02
申请人： John M. Schmidt
发明人： John M. Schmidt
IPC分类号： F41B5/22
CPC分类号： F41B5/143
摘要： An arrow retainer to be attached to an archery bow which retains the arrow in a position adjacent the arrow rest. In accordance with this invention, the arrow retainer is preferably made from elastomeric materials and forms an upwardly opening channel. The arrow retainer provides a restricted distance gap enabling an arrow to be loaded within an area adjacent the bow arrow rest. The confined area defined by the arrow retainer maintains the arrow in close proximity with the arrow rest, thereby minimizing the time necessary to draw and release the arrow. In accordance with an alternate embodiment of this invention, the arrow retainer is integrated into the arrow rest component.
摘要翻译：一个箭头保持架被安装在弓箭上，箭头将箭头保持在靠近箭头的位置。根据本发明，箭头保持器优选地由弹性体材料制成并且形成向上开口的通道。箭头保持器提供有限的距离间隙，使箭头能够在与弓箭头靠背相邻的区域内被加载。由箭头保持器限定的限制区域保持箭头靠近箭头，从而最小化绘制和释放箭头所需的时间。根据本发明的替代实施例，箭头保持器被集成到箭头固定部件中。

9. 发明授权

US07248062B1 Contactless charge measurement of product wafers and control of corona generation and deposition 有权
标题翻译：产品晶圆的非接触式电荷测量和电晕发生和沉积的控制
公开(公告)号：US07248062B1
公开(公告)日：2007-07-24
申请号：US10701112
申请日：2003-11-04
申请人： Amin Samsavar , John M. Schmidt , Rainer Schierle , Gregory S. Horner , Thomas G. Miller , Zhiwei Xu , Xiaofeng Hu , Jianou Shi , Sergio Edelstein
发明人： Amin Samsavar , John M. Schmidt , Rainer Schierle , Gregory S. Horner , Thomas G. Miller , Zhiwei Xu , Xiaofeng Hu , Jianou Shi , Sergio Edelstein
IPC分类号： G01R31/26
CPC分类号： G01R31/303 , G01R31/2831 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Systems and methods for determining a property of a specimen are provided. The specimen may be a product wafer. The method may include biasing a focused spot on the specimen. The method may also include measuring a parameter of a measurement spot on the specimen. The measurement spot may overlap the focused spot. In addition, the method may include determining the property of the specimen from the measured parameter. Systems and methods for varying the performance of a corona source are also provided. The method may include altering a property of the environment within the corona source. The property may include, but is not limited to, temperature, pressure, humidity, and/or partial pressure of a gas within the corona source.
摘要翻译：提供了用于确定样品性质的系统和方法。样品可以是产品晶片。该方法可以包括将聚焦斑点偏置在样本上。该方法还可以包括测量样品上的测量点的参数。测量点可能与聚焦点重叠。此外，该方法可以包括根据测量的参数确定样品的性质。还提供了用于改变电晕源的性能的系统和方法。该方法可以包括改变电晕源内的环境的属性。该性质可以包括但不限于电晕源内的气体的温度，压力，湿度和/或分压。

10. 发明申请

US20100219327A1 High speed quantum efficiency measurement apparatus utilizing solid state lightsource 有权
标题翻译：利用固态光源的高速量子效率测量装置
公开(公告)号：US20100219327A1
公开(公告)日：2010-09-02
申请号：US12660688
申请日：2010-03-01
申请人： Mark A. Arbore , David L. Klein , Leonid A. Vasilyev , John M. Schmidt , James E. Hudson , Gregory S. Horner
发明人： Mark A. Arbore , David L. Klein , Leonid A. Vasilyev , John M. Schmidt , James E. Hudson , Gregory S. Horner
IPC分类号： G01J1/44 , G01N21/55
CPC分类号： G01N21/55 , G01N21/59 , G01N2021/556 , G01N2201/0627 , G01N2201/0691 , H02S50/10
摘要： The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50 nm bandwidth, where a portion of the conditioned light source is monitored. Delivery optics are provided to direct the conditioned light to the DUT, a controller drives the conditioned light source in a time dependent operation, and at least one reflectance measurement assembly receives a portion of the conditioned light reflected from the DUT. A time-resolved measurement device includes a current measurement device and/or a voltage measurement device disposed to resolve a current and/or voltage generated in the DUT by each conditioned light source, where a sufficiently programmed computer determines and outputs a QE value for each DUT according to an incident intensity of at least one wavelength of from the conditioned light source and the time-resolved measurement.
摘要翻译：本发明提供了一种高速量子效率（QE）测量装置，其包括至少一个被测器件（DUT），至少一个具有小于50nm带宽的调节光源，其中调节光源的一部分是监控。提供输送光学器件以将经调节的光引导到DUT，控制器以时间相关的操作来驱动调节光源，并且至少一个反射测量组件接收从DUT反射的经调节的光的一部分。时间分辨的测量装置包括电流测量装置和/或电压测量装置，其被设置为通过每个调节光源来分辨在DUT中产生的电流和/或电压，其中充分编程的计算机确定并输出每个 DUT根据来自调节光源的至少一个波长的入射强度和时间分辨测量。

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