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    • 2. 发明授权
    • Microscope system for controlling optical elements in interlock with a
variation in observation conditions
    • 用于控制光学元件的显微镜系统与观察条件的变化互锁
    • US5703714A
    • 1997-12-30
    • US592448
    • 1996-01-26
    • Jitsunari Kojima
    • Jitsunari Kojima
    • G02B21/00G02B21/06G02B21/36
    • G02B21/06
    • A microscope apparatus includes a light source for generating illumination light, an illumination optical system for illuminating an object to be observed with the illumination light, and an observation optical system for conducting an observation image of the illuminated object to an observation site. An objective change unit is arranged in the observation optical system for holding a plurality of objectives and for selectively inserting one of the objectives onto an optical path of the observation optical system. An optical system controller, which independently controls an optical element arranged in the illumination optical system and independently controls an optical element arranged in the observation optical system, includes a frame controller for controlling the objective change unit to insert one of the plurality of objectives selected onto the optical path of the observation optical system. A recognition unit recognizes one of a plurality of predetermined observation methods designated by the observer. A memory has a table for registering setting conditions of the optical elements which correspond to the respective observation methods, and fit/unfit information indicating whether or not each of the plurality of objectives is fit for the respective observation methods. A fit determination module operates in accordance with the fit/unfit information registered in the table of the memory for: (i) when the observer designates the observation method, determining whether or not the designated observation method is fit for the selected objective, and (ii) when the observer selects the objective, determining whether or not the selected objective is fit for the designated observation method.
    • 显微镜装置包括用于产生照明光的光源,用照明光照射被观察物体的照明光学系统和用于将被照明物体的观察图像导向观察部位的观察光学系统。 在观察光学系统中设置物镜改变单元,用于保持多个物镜并且将目标中的一个选择性地插入到观察光学系统的光路上。 独立地控制布置在照明光学系统中的光学元件并独立地控制布置在观察光学系统中的光学元件的光学系统控制器包括:帧控制器,用于控制物镜改变单元将所选择的多个目标中的一个物体插入到 观察光学系统的光路。 识别单元识别由观察者指定的多个预定观察方法中的一个。 存储器具有用于登记与各观察方法对应的光学元件的设定条件的表,以及指示多个目标中的每一个是否适合于各个观察方法的拟合/不适合信息。 拟合确定模块根据登记在存储器表中的拟合/不合格信息进行操作,用于:(i)当观察者指定观察方法时,确定指定的观察方法是否适合所选择的目标,以及( ii)当观察者选择目标时,确定所选择的目标是否适合指定的观察方法。
    • 3. 发明申请
    • IMAGING DEVICE FOR MICROSCOPE
    • 微型成像装置
    • US20090185034A1
    • 2009-07-23
    • US12354032
    • 2009-01-15
    • Hironori KISHIDAJitsunari Kojima
    • Hironori KISHIDAJitsunari Kojima
    • H04N7/18
    • G02B21/365H04N5/23296H04N5/235
    • An image pickup unit obtains a specimen image by picking up the observation image of a specimen produced by a microscope. An installation state information obtainment unit obtains installation state information indicating the installation state of an optical member inserted into the observation light path of the microscope. An exposure condition setup unit sets an exposure condition to be used when the image pickup unit picks up the observation image to obtain a specimen image in a second magnification ratio, on the basis of installation state information used when the image pickup unit obtained a specimen image in a first magnification ratio by picking up the observation image, and on the basis of installation state information to be used when the image pickup unit obtains a specimen image in the second magnification ratio, which is a different magnification ratio from the first magnification ratio, by picking up the specimen image.
    • 图像拾取单元通过拾取由显微镜产生的样本的观察图像来获得样本图像。 安装状态信息获取单元获取表示插入到显微镜的观察光路中的光学构件的安装状态的安装状态信息。 曝光条件设定部根据摄像部拍摄观察图像,根据获取了标本图像的图像拍摄部所使用的安装状态信息,设定第二放大率的样本图像时所使用的曝光条件 通过拾取观察图像以第一放大倍率,并且基于当图像拍摄单元获得与第一放大率不同的倍率的第二倍率的样本图像时要使用的安装状态信息, 通过拾取标本图像。
    • 9. 发明申请
    • MICROSCOPE OBSERVATION SYSTEM
    • 微观观察系统
    • US20090296203A1
    • 2009-12-03
    • US12275419
    • 2008-11-21
    • Jitsunari KOJIMA
    • Jitsunari KOJIMA
    • G02B21/36G02B21/00
    • G02B21/365
    • This is a microscope observation system comprising a microscope, a camera unit, a light-amount adjustment unit for controlling adjustment parts included the microscope in order to suppress the amount of reflected light of a specimen image formed on the camera unit, a camera adjustment unit for controlling an adjustment part group of the camera unit in order to adjust image signals photo-electrically converted by the camera unit to a desired state, a light measurement unit for measuring the brightness of the specimen, a display unit for displaying a captured image, a control unit for controlling continuous display speed indicating the continuous display interval of an image continuously displayed on the display unit and at least one of an observation position shifting unit for changing the observation position or observation magnification of the specimen or an observation state detection unit for detecting the observation position or the observation magnification.
    • 这是一种显微镜观察系统,包括显微镜,相机单元,用于控制包括显微镜的调节部件的光量调节单元,以便抑制在相机单元上形成的标本图像的反射光的量,相机调节单元 用于控制相机单元的调节部分组,以便将由照相机单元光电转换的图像信号调整到期望状态,用于测量样本的亮度的光测量单元,用于显示拍摄图像的显示单元, 控制单元,用于控制指示连续显示在显示单元上的图像的连续显示间隔的连续显示速度,以及用于改变样本的观察位置或观察倍率的观察位置移动单元中的至少一个,或用于 检测观察位置或观察倍率。