专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明公开

EP0815583A1 A STRESS CELL FOR A SCANNING PROBE MICROSCOPE 失效
标题翻译： POWER METER框探针显微镜GRID
公开(公告)号：EP0815583A1
公开(公告)日：1998-01-07
申请号：EP96908577.0
申请日：1996-02-29
申请人： Molecular Imaging Corporation , Jing, Tianwei
发明人： JING, Tianwei
IPC分类号： G01N37 , G01N3 , G01Q30 , H01J37
CPC分类号： G01Q30/20 , G01N3/20 , G01N2203/0286 , H01J2237/2062 , Y10S977/86
摘要： A novel stress cell for applying stress in-situ to a sample in a scanning probe microscope. It has a loading clamp (4) mounted on a sample stage (1) which is magnetically mounted to a scanning tunneling microscope or atomic force microscope. A wedge (2) is placed on top of the sample stage (1). A clamp (4) holds a sample (7) with its two arms (3) pulling the sample (7) against the wedge (2). It is fastened by a micrometer (5) which is driven by a motor (10). A force-sensor (17) is placed between the clamp (4) and the stage (1) to measure the force applied. This cell provides a superior stability and straightforward operation procedure for studying stress related problems in materials.

2. 发明申请

WO1996028837A1 HYBRID CONTROL SYSTEM FOR SCANNING PROBE MICROSCOPES 审中-公开
标题翻译：用于扫描探针显微镜的混合控制系统
公开(公告)号：WO1996028837A1
公开(公告)日：1996-09-19
申请号：PCT/US1996002764
申请日：1996-02-29
申请人： MOLECULAR IMAGING CORPORATION , LINDSAY, Stuart, M. , JING, Tianwei
发明人： MOLECULAR IMAGING CORPORATION
IPC分类号： H01J37/00
CPC分类号： G01Q10/065 , Y10S977/851
摘要： A scanning probe microscope controller includes a digital signal processor (DSP) (72) and an analog feedback loop. The height correction signal (102) to be applied to a transducer (104) controlling the distance between the scanning probe (62) and a sample surface (64) is then generated by an analog feedback circuit where at least one parameter is under computer control. At the end of each scanline, a variance can be calculated for the data and the inverse of the quantity is used to adjust the gain with which digitization of the data is carried out. Linearization of the data to correct for non-linearities in the scanning may be carried out by the DSP. Adjustment of the feedback loop gain is also carried out in order to reduce excess oscillation.
摘要翻译：扫描探针显微镜控制器包括数字信号处理器（DSP）（72）和模拟反馈回路。然后，通过模拟反馈电路产生要施加到控制扫描探针（62）和样品表面（64）之间的距离的换能器（104）的高度校正信号（102），其中至少一个参数处于计算机控制下。在每个扫描线的末尾，可以计算数据的方差，并且数量的倒数用于调整执行数据数字化的增益。数据的线性化，以校正扫描中的非线性可以由DSP执行。还进行反馈回路增益的调整，以减少过多的振荡。

3. 发明申请

WO1996027895A1 ELECTROCHEMICAL IDENTIFICATION OF MOLECULES IN A SCANNING PROBE MICROSCOPE 审中-公开
标题翻译：扫描探针显微镜中分子的电化学鉴定
公开(公告)号：WO1996027895A1
公开(公告)日：1996-09-12
申请号：PCT/US1996002738
申请日：1996-02-29
申请人： MOLECULAR IMAGING CORPORATION , LINDSAY, Stuart, M. , JING, Tianwei
发明人： MOLECULAR IMAGING CORPORATION
IPC分类号： H01J37/252
CPC分类号： G01Q60/04 , G01Q20/02 , G01Q30/14 , G01Q60/38 , G01Q60/60 , Y10S977/852 , Y10S977/859 , Y10S977/86 , Y10S977/861 , Y10S977/873
摘要： A method and apparatus for high resolution mapping of the chemical composition of a thin film utilizes scanning probe microscopy. A sample (26) is prepared as a thin film disposed on a conductive backing electrode (30). A sensitive electrometer (34) is connected to the backing electrode (30) to detect a current passing through it. A force sensing cantilever (22) is scanned relative to the sample surface (26) a plurality of times. A voltage (32) is applied to a probe tip (23). A tunneling current at each of a number of different voltages for each location in the sample surface (26) is obtained. The oxidation and reduction reactions take place only at well defined voltages from the current measured at a certain location and a certain applied voltage at that location to deduce what the chemical located at that location is.
摘要翻译：用于薄膜化学成分的高分辨率测绘的方法和装置利用扫描探针显微镜。制备样品（26）作为设置在导电背衬电极（30）上的薄膜。敏感静电计（34）连接到背衬电极（30）以检测通过它的电流。力检测悬臂（22）相对于样品表面（26）多次扫描。电压（32）被施加到探针尖端（23）。获得在样品表面（26）中的每个位置的多个不同电压中的每一个处的隧穿电流。氧化和还原反应仅在来自在某个位置处测量的电流的明确定义的电压和该位置处的某个施加电压进行，以推断位于该位置的化学物质是什么。

4. 发明申请

WO1996027894A1 A STRESS CELL FOR A SCANNING PROBE MICROSCOPE 审中-公开
标题翻译：用于扫描探针显微镜的应力单元
公开(公告)号：WO1996027894A1
公开(公告)日：1996-09-12
申请号：PCT/US1996002755
申请日：1996-02-29
申请人： MOLECULAR IMAGING CORPORATION , JING, Tianwei
发明人： MOLECULAR IMAGING CORPORATION
IPC分类号： H01J37/20
CPC分类号： G01Q30/20 , G01N3/20 , G01N2203/0286 , H01J2237/2062 , Y10S977/86
摘要： A novel stress cell for applying stress in-situ to a sample in a scanning probe microscope. It has a loading clamp (4) mounted on a sample stage (1) which is magnetically mounted to a scanning tunneling microscope or atomic force microscope. A wedge (2) is placed on top of the sample stage (1). A clamp (4) holds a sample (7) with its two arms (3) pulling the sample (7) against the wedge (2). It is fastened by a micrometer (5) which is driven by a motor (10). A force-sensor (17) is placed between the clamp (4) and the stage (1) to measure the force applied. This cell provides a superior stability and straightforward operation procedure for studying stress related problems in materials.
摘要翻译：一种用于在扫描探针显微镜中将样本原位应力的新型应力池。它具有安装在样品台（1）上的装载夹（4），该载物夹被磁性地安装到扫描隧道显微镜或原子力显微镜。将楔形物（2）放置在样品台（1）的顶部。夹具（4）保持样品（7），其两个臂（3）将样品（7）拉靠在楔块（2）上。它由用电动机（10）驱动的千分尺（5）固定。力传感器（17）被放置在夹具（4）和平台（1）之间以测量施加的力。该电池提供了优异的稳定性和直观的操作程序，用于研究材料中的应力相关问题。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式