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1. 发明授权

US07488936B2 TFT array inspecting apparatus 失效
标题翻译： TFT阵列检查装置
公开(公告)号：US07488936B2
公开(公告)日：2009-02-10
申请号：US11188719
申请日：2005-07-26
申请人： Ho Seok Choi , Vasily Lenyashine , Hyeong Min Ahn , Jeong Su Ha , Sergey Antonov , Mi Jeong Song
发明人： Ho Seok Choi , Vasily Lenyashine , Hyeong Min Ahn , Jeong Su Ha , Sergey Antonov , Mi Jeong Song
IPC分类号： G21K7/00
CPC分类号： H01J37/20 , H01J37/28 , H01J2237/20207 , H01J2237/2817
摘要： A TFT array inspecting apparatus inspects a TFT array disposed at either an inclined position and a level position. The TFT array inspecting apparatus includes a vacuum chamber, a stage disposed in the vacuum chamber so that a TFT array to be inspected is disposed on the stage, an electron gun disposed opposite to the stage in the vacuum chamber to generate an electron beam onto the TFT array, an electron detecting unit to detect secondary electrons emitted from the TFT array by the electron gun, and at least one elevating unit to move the TFT array move between a level position and an inclined position having a designated angle with the level position.
摘要翻译： TFT阵列检查装置检查设置在倾斜位置和水平位置的TFT阵列。 TFT阵列检查装置包括真空室，设置在真空室中的台，使得待检查的TFT阵列设置在台架上，电子枪与真空室中的台相对设置，以产生电子束 TFT阵列，用于检测由电子枪从TFT阵列发射的二次电子的电子检测单元，以及用于移动TFT阵列的至少一个升降单元在与位置之间具有指定角度的水平位置和倾斜位置之间移动。

2. 发明申请

US20060186335A1 Inspection apparatus for thin film transistor substrate 失效
标题翻译：薄膜晶体管基板检测装置
公开(公告)号：US20060186335A1
公开(公告)日：2006-08-24
申请号：US11328177
申请日：2006-01-10
申请人： Ho-seok Choi , Sergey Antonov , Hyeong-min Ahn , Jeong-su Ha , Lemiachine Vassili , Mi-jeong Song
发明人： Ho-seok Choi , Sergey Antonov , Hyeong-min Ahn , Jeong-su Ha , Lemiachine Vassili , Mi-jeong Song
IPC分类号： G01N23/00 , G21K7/00
CPC分类号： G01N23/00 , G01R31/307 , G09G3/006 , Y10S345/904
摘要： An inspection apparatus for a TFT substrate formed with a plurality of pixels, includes a reference substrate being opposite to and spaced from the TFT substrate and formed with a plurality of reference patterns corresponding to the pixels, a power supply to supply power to both a predetermined number of the pixels and the corresponding reference pattern to form an electric field in a space between the TFT substrate and the reference substrate, an electron beam emitter to emit an electron beam to travel from a first side to a second side of the space, an electron beam detector to detect the electron beam emitted from the electron beam emitter and passed through the space, and a controller to determine whether the TFT substrate includes a defective pixel based on a location of the electron beam detected by the electron beam detector. Thus, the inspection apparatus can correctly and quickly inspect the TFT substrate for defects in a low vacuum state regardless a size of the TFT substrate.
摘要翻译：一种用于形成有多个像素的TFT基板的检查装置，包括与TFT基板相对并且与TFT基板隔开的基准基板，并且形成有与像素对应的多个基准图案，供给两个预定的像素数和相应的参考图案，以在TFT基板和参考基板之间的空间中形成电场，发射电子束从空间的第一侧移动到第二侧的电子束发射器，电子束检测器，用于检测从电子束发射器发射并通过空间的电子束，以及控制器，用于基于由电子束检测器检测到的电子束的位置来确定TFT基板是否包括缺陷像素。因此，与TFT基板的尺寸无关地，检查装置可以正确且快速地检查TFT基板中的低真空状态的缺陷。

3. 发明申请

US20160097726A1 PANEL INSPECTING APPARATUS AND METHOD 有权
标题翻译：面板检查装置和方法
公开(公告)号：US20160097726A1
公开(公告)日：2016-04-07
申请号：US14712205
申请日：2015-05-14
申请人： Myoung-ki AHN , Jin-woo AHN , Tae-yong JO , Hyeong-min AHN , Tae-hyoung LEE
发明人： Myoung-ki AHN , Jin-woo AHN , Tae-yong JO , Hyeong-min AHN , Tae-hyoung LEE
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N21/95 , G01N2021/9513
摘要： A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.
摘要翻译：面板检查装置和方法可以以相对较小的检查成本和时间精确地检查面板的弯曲部分的图像质量，并且面板检查装置可以具有相对简单的结构。面板检查装置包括其上设置有面板的支撑件，对应于面板的弯曲区域的镜子，被配置为从面板接收图像的镜头和由镜子反射并且对图像进行聚焦的图像，以及图像传感器被配置为捕获通过镜头传送的图像。

4. 发明授权

US07110104B2 Panel inspection apparatus 有权
标题翻译：面板检查仪
公开(公告)号：US07110104B2
公开(公告)日：2006-09-19
申请号：US10791798
申请日：2004-03-04
申请人： Ho-seok Choi , Yong-shik Douglas Kim , Hyoung-jo Jeon , Hyeong-min Ahn
发明人： Ho-seok Choi , Yong-shik Douglas Kim , Hyoung-jo Jeon , Hyeong-min Ahn
IPC分类号： G01N21/88 , G06K9/00
CPC分类号： G01N21/8806 , G01N2021/9513 , G02F1/1309
摘要： A panel inspection apparatus inspecting a display panel, including: a panel supporting table supporting the panel; a plurality of cameras installed being spaced from the panel supporting table and photographing the panel supported by the panel supporting table; and a rotatable camera support rotatably supporting at least one of the plurality of cameras. As a result, the number of cameras required is reduced, costing less, and easy installation.
摘要翻译：面板检查装置检查显示面板，包括：支撑面板的面板支撑台; 多个照相机安装成与面板支撑台间隔开并拍摄由面板支撑台支撑的面板; 以及可旋转的相机支撑件，其可旋转地支撑所述多个照相机中的至少一个。因此，所需的相机数量减少，成本较低，安装容易。

5. 发明授权

US06690818B2 Apparatus and method for inspecting screen of displaying device 失效
标题翻译：显示装置屏幕检测装置及方法
公开(公告)号：US06690818B2
公开(公告)日：2004-02-10
申请号：US09765409
申请日：2001-01-22
申请人： Hyeong-min Ahn
发明人： Hyeong-min Ahn
IPC分类号： G06K900
CPC分类号： G06T7/001 , G06T2207/30121 , H04N17/04
摘要： An apparatus and a method for inspecting an image, synchronizing a pattern frame synchronizing signal and an image frame synchronizing signal to initiate grabbing an inspection pattern, where the pattern frame synchronizing signal and the image frame synchronizing signal have different frequencies. With this configuration, where the frequencies of the pattern frame synchronizing signal and the image frame synchronizing signal are not identical, since grabbing an image of the inspection pattern is initiated by synchronizing the image frame synchronizing signal with the pattern frame synchronizing signal, the noise inserted into the image of the inspection pattern becomes regular, thereby resulting in enhancing the reliability of the image inspection.
摘要翻译：用于检查图像的装置和方法，使图案帧同步信号和图像帧同步信号同步，以开始抓取检查图案，其中图案帧同步信号和图像帧同步信号具有不同的频率。利用这种配置，其中图案帧同步信号和图像帧同步信号的频率不相同，因为通过使图像帧同步信号与图形帧同步信号同步来捕获检查图案的图像，因此插入的噪声检查图案的图像变得规则，从而提高图像检查的可靠性。

6. 发明授权

US09759665B2 Panel inspecting apparatus and method 有权
公开(公告)号：US09759665B2
公开(公告)日：2017-09-12
申请号：US14712205
申请日：2015-05-14
申请人： Myoung-ki Ahn , Jin-woo Ahn , Tae-yong Jo , Hyeong-min Ahn , Tae-hyoung Lee
发明人： Myoung-ki Ahn , Jin-woo Ahn , Tae-yong Jo , Hyeong-min Ahn , Tae-hyoung Lee
IPC分类号： G01N21/00 , G01N21/88 , G01N21/95
CPC分类号： G01N21/8806 , G01N21/95 , G01N2021/9513
摘要： A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.

7. 发明授权

US07193795B2 Optical system with image producing surface control unit 失效
标题翻译：具有图像产生表面控制单元的光学系统
公开(公告)号：US07193795B2
公开(公告)日：2007-03-20
申请号：US10790791
申请日：2004-03-03
申请人： Hyeong-Min Ahn , Dong-Hee Lee , Chang-Hyo Kim , Hyoung-Jo Jeon
发明人： Hyeong-Min Ahn , Dong-Hee Lee , Chang-Hyo Kim , Hyoung-Jo Jeon
IPC分类号： G02B7/02
CPC分类号： G01N21/95 , G01N2021/9513
摘要： An optical system to attain a clear image of an object when the object is photographed in a state where an optical axis of a lens is inclined relative to the object, includes a lens which refracts light radiating from the object, an image producing surface on which the image of the object is produced according to the light refracted by the lens, and an image producing surface control unit which controls the image producing surface to move with respect to the lens. The image producing surface control unit includes an angle control unit to control an angle between an optical axis of the lens and the image producing surface.
摘要翻译：当在透镜的光轴相对于物体倾斜的状态下拍摄物体时获得物体的清晰图像的光学系统包括折射从物体辐射的光的透镜，其上在该图像产生表面上根据由透镜折射的光产生物体的图像，以及控制图像产生面相对于透镜移动的图像产生面控制部。图像产生表面控制单元包括角度控制单元，用于控制透镜的光轴与图像产生表面之间的角度。

8. 发明申请

US20050094280A1 Optical system with image producing surface control unit 失效
标题翻译：具有图像产生表面控制单元的光学系统
公开(公告)号：US20050094280A1
公开(公告)日：2005-05-05
申请号：US10790791
申请日：2004-03-03
申请人： Hyeong-Min Ahn , Dong-Hee Lee , Chang-Hyo Kim , Hyoung-Jo Jeon
发明人： Hyeong-Min Ahn , Dong-Hee Lee , Chang-Hyo Kim , Hyoung-Jo Jeon
IPC分类号： G03B3/04 , G01M11/00 , G01N21/95 , G02B9/34 , G02B27/10 , G03B13/32
CPC分类号： G01N21/95 , G01N2021/9513
摘要： An optical system to attain a clear image of an object when the object is photographed in a state where an optical axis of a lens is inclined relative to the object, includes a lens which refracts light radiating from the object, an image producing surface on which the image of the object is produced according to the light refracted by the lens, and an image producing surface control unit which controls the image producing surface to move with respect to the lens. The image producing surface control unit includes an angle control unit to control an angle between an optical axis of the lens and the image producing surface.
摘要翻译：当在透镜的光轴相对于物体倾斜的状态下拍摄物体时获得物体的清晰图像的光学系统包括折射从物体辐射的光的透镜，其上在该图像产生表面上根据由透镜折射的光产生物体的图像，以及控制图像产生面相对于透镜移动的图像产生面控制部。图像产生表面控制单元包括角度控制单元，用于控制透镜的光轴与图像产生表面之间的角度。

9. 发明申请

US20050018897A1 Panel inspection apparatus 有权
标题翻译：面板检查仪
公开(公告)号：US20050018897A1
公开(公告)日：2005-01-27
申请号：US10791798
申请日：2004-03-04
申请人： Ho-seok Choi , Yong-shik Kim , Hyoung-jo Jeon , Hyeong-min Ahn
发明人： Ho-seok Choi , Yong-shik Kim , Hyoung-jo Jeon , Hyeong-min Ahn
IPC分类号： G01N21/84 , G01N21/88 , G02F1/13 , G02F1/1333 , G06K9/00 , G01N21/00 , G03B1/66 , G03B17/36
CPC分类号： G01N21/8806 , G01N2021/9513 , G02F1/1309
摘要： A panel inspection apparatus inspecting a display panel, including: a panel supporting table supporting the panel; a plurality of cameras installed being spaced from the panel supporting table and photographing the panel supported by the panel supporting table; and a rotatable camera support rotatably supporting at least one of the plurality of cameras. As a result, the number of cameras required is reduced, costing less, and easy installation.
摘要翻译：面板检查装置检查显示面板，包括：支撑面板的面板支撑台; 多个照相机安装成与面板支撑台间隔开并拍摄由面板支撑台支撑的面板; 以及可旋转的相机支撑件，其可旋转地支撑所述多个照相机中的至少一个。因此，所需的相机数量减少，成本较低，安装容易。

10. 发明授权

US07362123B2 Inspection apparatus for thin film transistor substrate 失效
标题翻译：薄膜晶体管基板检测装置
公开(公告)号：US07362123B2
公开(公告)日：2008-04-22
申请号：US11328177
申请日：2006-01-10
申请人： Ho-seok Choi , Sergey Antonov , Hyeong-min Ahn , Jeong-su Ha , Lemjachine Vassili , Mi-jeong Song
发明人： Ho-seok Choi , Sergey Antonov , Hyeong-min Ahn , Jeong-su Ha , Lemjachine Vassili , Mi-jeong Song
IPC分类号： G01R31/26 , G01R31/302
CPC分类号： G01N23/00 , G01R31/307 , G09G3/006 , Y10S345/904
摘要： An inspection apparatus for a TFT substrate formed with a plurality of pixels, includes a reference substrate being opposite to and spaced from the TFT substrate and formed with a plurality of reference patterns corresponding to the pixels, a power supply to supply power to both a predetermined number of the pixels and the corresponding reference pattern to form an electric field in a space between the TFT substrate and the reference substrate, an electron beam emitter to emit an electron beam to travel from a first side to a second side of the space, an electron beam detector to detect the electron beam emitted from the electron beam emitter and passed through the space, and a controller to determine whether the TFT substrate includes a defective pixel based on a location of the electron beam detected by the electron beam detector. Thus, the inspection apparatus can correctly and quickly inspect the TFT substrate for defects in a low vacuum state regardless a size of the TFT substrate.
摘要翻译：一种用于形成有多个像素的TFT基板的检查装置，包括与TFT基板相对并且与TFT基板隔开的基准基板，并且形成有与像素对应的多个基准图案，供给两个预定的像素数和相应的参考图案，以在TFT基板和参考基板之间的空间中形成电场，发射电子束从空间的第一侧移动到第二侧的电子束发射器，电子束检测器，用于检测从电子束发射器发射并通过空间的电子束，以及控制器，用于基于由电子束检测器检测到的电子束的位置来确定TFT基板是否包括缺陷像素。因此，与TFT基板的尺寸无关地，检查装置可以正确且快速地检查TFT基板中的低真空状态的缺陷。

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